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Measurement and evaluation of the WR-28 calorimeter WR-28量热计的测量和评价
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034569
Xiaohai Cui, Yong Li, Xiaoxun Gao, Mingzhen Dai, D. Zhu
{"title":"Measurement and evaluation of the WR-28 calorimeter","authors":"Xiaohai Cui, Yong Li, Xiaoxun Gao, Mingzhen Dai, D. Zhu","doi":"10.1109/ARFTG77.2011.6034569","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034569","url":null,"abstract":"We have designed and measured WR28 calorimeter which will be used as national primary power standard frequency range is 26.5–40GHz. The detail of design and measurement results was published in 2010CPEM and 74th ARFTG[1][2]. At present, the effective efficiency of WR-28 calorimeter was calculated and some uncertainty evaluations were done.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132371993","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of complex residual error in vector network analyzer measurement system in the range of millimeter-wave and submillimeter-wave frequencies 矢量网络分析仪测量系统在毫米波和亚毫米波频率范围内的复杂残差评估
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034558
R. Kishikawa, M. Horibe, M. Shida
{"title":"Evaluation of complex residual error in vector network analyzer measurement system in the range of millimeter-wave and submillimeter-wave frequencies","authors":"R. Kishikawa, M. Horibe, M. Shida","doi":"10.1109/ARFTG77.2011.6034558","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034558","url":null,"abstract":"This paper describes a technique for the evaluation of complex residual errors in coaxial and waveguide vector network analyzer (VNA) measurements in the range of microwave, millimeter and submillimeter wave frequencies. The technique is based on reference values of scattering parameters for transmission line standards consisting of coaxial air dielectric lines and waveguide standard sections. Reference values traceable to SI-base units were calibrated for the standard transmission lines by the National Metrology Institute of Japan (NMIJ). Complex residual analyses are shown for VNA measurements with a PC-7 coaxial line system and with WR-15, WR-10 and WR-3 waveguide systems up to 330 GHz.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121906254","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
An automatic measurement setup for outer diameter of inner conductor in coaxial air lines 同轴导线内导体外径自动测量装置
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034570
Huang Hui, Liu Xinmeng, Lv Xin
{"title":"An automatic measurement setup for outer diameter of inner conductor in coaxial air lines","authors":"Huang Hui, Liu Xinmeng, Lv Xin","doi":"10.1109/ARFTG77.2011.6034570","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034570","url":null,"abstract":"An automatic measurement setup for measuring outer diameter of the inner conductor (ODIC) of coaxial air lines is introduced. The setup is used to measure ODIC of air lines with precision connectors, including N, 7mm, 3.5mm, 2.92mm, 2.4mm, 1.85mm, 1.0mm. Multiple needle gauges are used to achieve measurement uncertainties better than 0.3μm. As an example, the measurement results of 2.92 mm and 1.85mm connector air lines are shown.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125986081","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Adapter evaluation using three-adapter technique with ‘Thru-Line’ two-tier calibration in one-port measurements 适配器评估使用三适配器技术与“贯穿线”两层校准在一个端口的测量
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034568
Jeong-Hwan Kim, Jin-Seob Kang, J. Kwon, Dae-Chan Kim
{"title":"Adapter evaluation using three-adapter technique with ‘Thru-Line’ two-tier calibration in one-port measurements","authors":"Jeong-Hwan Kim, Jin-Seob Kang, J. Kwon, Dae-Chan Kim","doi":"10.1109/ARFTG77.2011.6034568","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034568","url":null,"abstract":"This paper presents a method using a two-tier calibration with ‘Thru-Line’ for evaluating the S-parameters of adapters based on three-adapter technique. It uses a one-port VNA (Vector Network Analyzer) to avoid cable movements with ‘OSL’ (Open-Short-Load) calibration standards, which are widely used for one-port measurements, being used at the first and second calibrations. Formulas are also derived for estimating the uncertainties of the S-parameters of adaptors using the proposed method.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"3 8","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113932671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
High speed non-linear device characterization and uniformity investigations at X-band frequencies exploiting behavioral models 高速非线性器件特性和均匀性研究在x波段频率利用行为模型
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034552
R. Saini, J. Bell, T. Canning, S. Woodington, D. Fitzpatrick, J. Lees, J. Benedikt, P. Tasker
{"title":"High speed non-linear device characterization and uniformity investigations at X-band frequencies exploiting behavioral models","authors":"R. Saini, J. Bell, T. Canning, S. Woodington, D. Fitzpatrick, J. Lees, J. Benedikt, P. Tasker","doi":"10.1109/ARFTG77.2011.6034552","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034552","url":null,"abstract":"This paper outlines a non-linear measurement approach suitable for wafer mapping and technology screening applications. It is shown how rapid characterization and uniformity investigations of non-linear devices is possible through the development of an intelligence driven, open-loop active harmonic load pull measurement system, where localized behavioral models are exploited to dramatically improve measurement system speed and to improve utilization efficiency. The load pull measurement results obtained were then used to extract 5th order behavioral models for robust CAD integration. Device variations can now be included within the CAD tool. Technique demonstration involved the measurements of 10×75 μm GaAs pHEMT devices, operating at 9 GHz, biased in Class-AB on four different wafers. An example CAD investigation comparing the variation of the measured and modeled current and voltage waveforms is discussed.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"2007 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127304942","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Hybrid active tuning load pull 混合主动调谐负载拉
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034576
G. Simpson
{"title":"Hybrid active tuning load pull","authors":"G. Simpson","doi":"10.1109/ARFTG77.2011.6034576","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034576","url":null,"abstract":"Load pull with active tuning has been reported for many years, but not widely implemented, even though it does offer some advantages. Load pull with passive tuning, however, is widely used. Combining active tuning with passive tuning creates a hybrid tuning system that offers some of the advantages of both approaches. This paper discusses a hybrid tuning system created by adding active tuning to an existing passive load pull system. Practical issues, including calibration, high power measurements and connection options, are also discussed.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125495961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Real-time non-linear de-embedding 实时非线性去嵌入
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034573
F. Vanaverbeke, W. De Raedt, D. Schreurs, M. Bossche
{"title":"Real-time non-linear de-embedding","authors":"F. Vanaverbeke, W. De Raedt, D. Schreurs, M. Bossche","doi":"10.1109/ARFTG77.2011.6034573","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034573","url":null,"abstract":"High-efficiency operating modes (class B, F, D, E, etc.) of RF power-transistors can only be well understood and evaluated when the voltage and current time-domain waveforms at the level of the intrinsic current-generator of the transistor are known. Large-signal network analyzers (LSNA's) allow the measurement of time-domain waveforms at the extrinsic level. This work describes for the first time real-time measurement software that controls a harmonic load-pull test-bench, thereby allowing the simultaneous evaluation of time-domain waveforms at both the extrinsic and the intrinsic level of a power-transistor. A de-embedding algorithm calculates the intrinsic waveforms from the extrinsic ones, thereby taking into account the effect of the non-linear capacitances within the transistor.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125696619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
High-speed device characterization using an active load-pull system and waveform engineering postulator 使用主动负载-牵引系统和波形工程假设器的高速器件特性
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-01 DOI: 10.1109/ARFTG77.2011.6034553
V. Carrubba, A. L. Clarke, S. Woodington, W. McGenn, Muhammad Akmal, A. Almuhaisen, J. Lees, S. Cripps, P. Tasker, J. Benedikt
{"title":"High-speed device characterization using an active load-pull system and waveform engineering postulator","authors":"V. Carrubba, A. L. Clarke, S. Woodington, W. McGenn, Muhammad Akmal, A. Almuhaisen, J. Lees, S. Cripps, P. Tasker, J. Benedikt","doi":"10.1109/ARFTG77.2011.6034553","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034553","url":null,"abstract":"This paper presents a methodology that provides rapid estimation of the parameters necessary for the high-speed characterization of transistor devices used in modern microwave power amplifiers. The key in achieving this significant measurement speed improvement is the use of a systematic waveform postulation methodology in combination with an active harmonic load-pull measurement system. The methodology is based on a rapid and systematic procedure that initially requires only a few DC measurement parameters to approximate the device's transfer characteristic and boundary conditions. Using these parameters, it is then possible to accurately estimate or ‘postulate’ the idealized output current and voltage waveforms, in this case for a three harmonic Class-F mode. These waveforms are rich in information and provide harmonic load impedances as well as other key postulated parameters that can then be used to ‘guide’ the harmonic active load-pull measurement system resulting in a very time-efficient characterization process.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124996163","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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