适配器评估使用三适配器技术与“贯穿线”两层校准在一个端口的测量

Jeong-Hwan Kim, Jin-Seob Kang, J. Kwon, Dae-Chan Kim
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引用次数: 1

摘要

本文提出了一种基于三适配器技术的两层“Thru-Line”校准方法来评估适配器的s参数。它使用一个单端口VNA(矢量网络分析仪)来避免电缆移动与“OSL”(开-短负载)校准标准,这是广泛用于单端口测量,在第一次和第二次校准中使用。本文还推导了用该方法估计适配器s参数不确定性的公式。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Adapter evaluation using three-adapter technique with ‘Thru-Line’ two-tier calibration in one-port measurements
This paper presents a method using a two-tier calibration with ‘Thru-Line’ for evaluating the S-parameters of adapters based on three-adapter technique. It uses a one-port VNA (Vector Network Analyzer) to avoid cable movements with ‘OSL’ (Open-Short-Load) calibration standards, which are widely used for one-port measurements, being used at the first and second calibrations. Formulas are also derived for estimating the uncertainties of the S-parameters of adaptors using the proposed method.
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