Jeong-Hwan Kim, Jin-Seob Kang, J. Kwon, Dae-Chan Kim
{"title":"Adapter evaluation using three-adapter technique with ‘Thru-Line’ two-tier calibration in one-port measurements","authors":"Jeong-Hwan Kim, Jin-Seob Kang, J. Kwon, Dae-Chan Kim","doi":"10.1109/ARFTG77.2011.6034568","DOIUrl":null,"url":null,"abstract":"This paper presents a method using a two-tier calibration with ‘Thru-Line’ for evaluating the S-parameters of adapters based on three-adapter technique. It uses a one-port VNA (Vector Network Analyzer) to avoid cable movements with ‘OSL’ (Open-Short-Load) calibration standards, which are widely used for one-port measurements, being used at the first and second calibrations. Formulas are also derived for estimating the uncertainties of the S-parameters of adaptors using the proposed method.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"3 8","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"77th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG77.2011.6034568","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper presents a method using a two-tier calibration with ‘Thru-Line’ for evaluating the S-parameters of adapters based on three-adapter technique. It uses a one-port VNA (Vector Network Analyzer) to avoid cable movements with ‘OSL’ (Open-Short-Load) calibration standards, which are widely used for one-port measurements, being used at the first and second calibrations. Formulas are also derived for estimating the uncertainties of the S-parameters of adaptors using the proposed method.