射频阻抗分析仪和LCR表读出噪声分析

77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI:10.1109/ARFTG77.2011.6034577

X. Liu, Hui Huang, Hui Xu

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引用次数: 0

摘要

用窄带宽噪声理论对射频阻抗分析仪和LCR计的读出噪声进行了观察和分析。指出了理论分析与实际测量结果的差异。最后讨论了阻抗测量格式对噪声的影响。

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Analyses of RF impedance analyzer and LCR meter readout noise

Readout noise of RF impedance analyzer and LCR meter are observed and analyzed with narrow bandwidth noise theory. The difference between theory analysis and actual measurement results is shown. The effect of impedance measurement format on noise is discussed at last.

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77th ARFTG Microwave Measurement Conference

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