{"title":"Analyses of RF impedance analyzer and LCR meter readout noise","authors":"X. Liu, Hui Huang, Hui Xu","doi":"10.1109/ARFTG77.2011.6034577","DOIUrl":null,"url":null,"abstract":"Readout noise of RF impedance analyzer and LCR meter are observed and analyzed with narrow bandwidth noise theory. The difference between theory analysis and actual measurement results is shown. The effect of impedance measurement format on noise is discussed at last.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"77th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG77.2011.6034577","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Readout noise of RF impedance analyzer and LCR meter are observed and analyzed with narrow bandwidth noise theory. The difference between theory analysis and actual measurement results is shown. The effect of impedance measurement format on noise is discussed at last.