A. Ferrero, M. Garelli, B. Grossman, Susan Choon, V. Teppati
{"title":"多端口s参数测量中的不确定度","authors":"A. Ferrero, M. Garelli, B. Grossman, Susan Choon, V. Teppati","doi":"10.1109/ARFTG77.2011.6034578","DOIUrl":null,"url":null,"abstract":"Measurement uncertainty is an often overlook aspect of modern RF and signal integrity measurements. Currently, one- and two-port measurement systems have been studied quite in detail, but few investigations have focused on multiport network analyzers. This paper presents recent advances of multiport S-parameters uncertainty analysis applied to inter-laboratory comparisons and large scale test instruments, such multiport cable testers.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Uncertainty in multiport S-parameters measurements\",\"authors\":\"A. Ferrero, M. Garelli, B. Grossman, Susan Choon, V. Teppati\",\"doi\":\"10.1109/ARFTG77.2011.6034578\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Measurement uncertainty is an often overlook aspect of modern RF and signal integrity measurements. Currently, one- and two-port measurement systems have been studied quite in detail, but few investigations have focused on multiport network analyzers. This paper presents recent advances of multiport S-parameters uncertainty analysis applied to inter-laboratory comparisons and large scale test instruments, such multiport cable testers.\",\"PeriodicalId\":257372,\"journal\":{\"name\":\"77th ARFTG Microwave Measurement Conference\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-06-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"77th ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG77.2011.6034578\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"77th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG77.2011.6034578","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Uncertainty in multiport S-parameters measurements
Measurement uncertainty is an often overlook aspect of modern RF and signal integrity measurements. Currently, one- and two-port measurement systems have been studied quite in detail, but few investigations have focused on multiport network analyzers. This paper presents recent advances of multiport S-parameters uncertainty analysis applied to inter-laboratory comparisons and large scale test instruments, such multiport cable testers.