Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)最新文献_第2页

Diagnosis of scan chain failures 扫描链故障诊断

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732169

Yuejian Wu

引用次数: 83

Comprehensive defect analysis and defect coverage of CMOS circuits 全面的CMOS电路缺陷分析和缺陷覆盖

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732154

D. Al-Khalili, S. Adham, C. Rozon, Moazzem Hossain, D. Racz

引用次数: 6

Functional verification coverage vs. physical stuck-at fault coverage 功能验证覆盖率与物理故障覆盖率

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732157

Xiao Sun, Carmie Hull

引用次数: 2

Increasing current testing resolution 提高电流测试分辨率

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732159

C. Thibeault

引用次数: 9

On-chip test embedding for multi-weighted random LFSRs 多加权随机lfsr的片上测试嵌入

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732160

D. Kagaris, S. Tragoudas, Amitava Majumdar

引用次数: 1

A system for evaluating on-line testability at the RT-level 一种在实时测试水平上评估在线可测试性的系统

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732177

S. Chiusano, Fulvio Corno, M. Reorda, Roberto Vietti

引用次数: 0

Management of critical areas and defectivity data for yield trend modeling 管理产量趋势模型的关键区域和缺陷数据

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732147

S. Barberan, F. Duvivier

引用次数: 8

A yield improvement program using process control and process optimisation for particle reduction using in situ particle monitoring on a Semitool Magnum 在Semitool Magnum上使用现场颗粒监测，利用过程控制和过程优化来减少颗粒，从而提高产量

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732146

L. Vogels, M. Dohmen, P. V. Duijvenboden, R. A. Latimer, J. Heffernan

引用次数: 0

FPGA design for decimeter scale integration (DMSI) 分米尺度集成(DMSI)的FPGA设计

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732152

G. Chapman

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引用次数: 1

Specification-driven test design for analog circuits 模拟电路的规范驱动测试设计

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI: 10.1109/DFTVS.1998.732183

P. Variyam, A. Chatterjee

引用次数: 21