Specification-driven test design for analog circuits

Abstract

In this paper we present a test generation approach for time and frequency domain testing of analog circuits. Tests are generated to detect faulty circuits which violate one or more circuit specifications without explicitly performing exhaustive specification based tests. We formulate the test stimulus generation problem as a search problem in which the primary goal is to reduce the probability of classifying a bad circuit as good and vice versa. Genetic algorithms are used to search for the optimum transient and steady state tests.