扫描链故障诊断

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI:10.1109/DFTVS.1998.732169

Yuejian Wu

{"title":"扫描链故障诊断","authors":"Yuejian Wu","doi":"10.1109/DFTVS.1998.732169","DOIUrl":null,"url":null,"abstract":"This paper first analyzes faulty scan chain behaviors. In addition to stuck-at faults, we also consider timing faults due to hold time violations Test sequences to determine the fault types in a failing scan chain are presented. This is followed by a presentation of two scan design techniques that simplifies scan chain fault diagnosis for both stuck-at and timing faults.","PeriodicalId":245879,"journal":{"name":"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)","volume":"117 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"83","resultStr":"{\"title\":\"Diagnosis of scan chain failures\",\"authors\":\"Yuejian Wu\",\"doi\":\"10.1109/DFTVS.1998.732169\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper first analyzes faulty scan chain behaviors. In addition to stuck-at faults, we also consider timing faults due to hold time violations Test sequences to determine the fault types in a failing scan chain are presented. This is followed by a presentation of two scan design techniques that simplifies scan chain fault diagnosis for both stuck-at and timing faults.\",\"PeriodicalId\":245879,\"journal\":{\"name\":\"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)\",\"volume\":\"117 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-11-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"83\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1998.732169\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1998.732169","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 83

摘要

本文首先分析了故障扫描链行为。除了卡在故障之外，我们还考虑了由于保持时间违反引起的定时故障，并给出了用于确定故障扫描链中故障类型的测试序列。随后介绍了两种扫描设计技术，它们简化了扫描链故障诊断，既可以诊断卡滞故障，也可以诊断定时故障。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Diagnosis of scan chain failures

This paper first analyzes faulty scan chain behaviors. In addition to stuck-at faults, we also consider timing faults due to hold time violations Test sequences to determine the fault types in a failing scan chain are presented. This is followed by a presentation of two scan design techniques that simplifies scan chain fault diagnosis for both stuck-at and timing faults.

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Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)

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