Surface and Interface Analysis最新文献_第7页

Time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy protocol for the analysis of organic multilayers 用于分析有机多层膜的飞行时间二次离子质谱和 X 射线光电子能谱协议

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-12-10 DOI: 10.1002/sia.7277

Claire Guyot, Jean-Paul Barnes, Olivier Renault, Tony Maindron

{"title":"Time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy protocol for the analysis of organic multilayers","authors":"Claire Guyot, Jean-Paul Barnes, Olivier Renault, Tony Maindron","doi":"10.1002/sia.7277","DOIUrl":"https://doi.org/10.1002/sia.7277","url":null,"abstract":"With the development in the early 2000s of new cluster ion sputtering sources, a reliable analysis of organic multilayers and interfaces has become possible. Nowadays, time-of-flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) depth profiling are routinely used to investigate organic stacks. However, analysis beams can cause bond scission or beam-induced degradations that accumulate in buried layers. We developed a correlative protocol that minimises damages related to analysis beams. It uses a shallow angle bevel crater fabricated inside the ToF-SIMS analysis chamber. With this preparation method, the in-depth information is displayed over the surface of the bevel crater. XPS profiles and high-resolution spectra paired with ToF-SIMS images enable an easy identification of the organic layers and complete understanding of their chemistry. The reduction of beam-induced degradation is achieved by minimising the acquisition times, therefore beam exposure on materials. Finally, an important advantage of this preparation method is that the analysis can be performed on exactly the same spot by multiple techniques. Several ToF-SIMS and XPS acquisitions can be carried out with various parameters (investigation of backscattered Arn+ cluster ion fragments, tandem MS imaging…) as well as analysis with other techniques that possess limitations in spatial resolution and/or inaptitude to probe buried layers such as Raman or AFM.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"108 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2023-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138568695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Effect of substrate temperature and annealing on the growth of TiO2-x thin films deposited by using DC-magnetron sputtering technique 基底温度和退火对直流磁控溅射技术沉积的 TiO2-x 薄膜生长的影响

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-12-10 DOI: 10.1002/sia.7274

Swapan Jana, Anil Krishna Debnath, Veerender Putta, Jitendra Bahadur, Jugal Kishor, Anil Kumar Chauhan, Debarati Bhattacharya

{"title":"Effect of substrate temperature and annealing on the growth of TiO2-x thin films deposited by using DC-magnetron sputtering technique","authors":"Swapan Jana, Anil Krishna Debnath, Veerender Putta, Jitendra Bahadur, Jugal Kishor, Anil Kumar Chauhan, Debarati Bhattacharya","doi":"10.1002/sia.7274","DOIUrl":"https://doi.org/10.1002/sia.7274","url":null,"abstract":"In this study, the effect of annealing on the structural, surface morphology and chemical structure of titanium suboxide (TiO2-x) thin films has been investigated. TiO2-x films had been grown on Si substrates by DC-magnetron sputtering with different sputter powers (75 and 100 W) at room temperature (RT) and 200°C substrate temperature (ST). The films were subsequently annealed for 1 h at 300, 400 and 500°C in vacuum. The impact of ST, post-annealing and sputter power on crystallinity, surface morphology and chemical state of the films were studied. Grazing incidence X-ray diffraction (GIXRD) data revealed that the films were amorphous or exhibited a very low crystalline structure while deposited at RT and even after annealing. Moreover, the films showed crystallinity while deposited at ST and exhibited an anatase-rutile (A-R) mix phase from anatase (A) annealed at 300°C (75 W at ST). X-ray reflectivity (XRR) data showed that the mass density of the films increased with the annealing temperature. Images obtained using atomic force microscopy (AFM) and field emission scanning electron microscopy (FESEM) revealed that post-annealing increased the surface roughness of the films. X-ray photoelectron spectroscopy (XPS) analysis indicated the films were sub stoichiometric. It was also indicated that Ti was in the form of Ti4+ and Ti3+ states in all films, and the proportion of Ti4+ slightly increased after post-annealing at 500°C. The findings showed that post-annealing, ST and sputtering power can all affect the growth of TiO2-x films.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"19 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2023-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138569330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Surface analysis insight note: Illustrating the effect of adventitious contamination on Pt photoemission peak intensities 表面分析洞察注:说明了不确定污染对Pt光电发射峰强度的影响

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-12-05 DOI: 10.1002/sia.7276

Neal Fairley, Pascal Bargiela, Jonas Baltrusaitis

引用次数: 0

HAXPES: Inelastic background for characterization of nanostructured materials HAXPES:表征纳米结构材料的非弹性背景

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-11-28 DOI: 10.1002/sia.7273

Sven Tougaard

引用次数: 0

Selective removal of dolomite from rare earth element-bearing phosphorite by flotation and leaching and the adsorption mechanism of agents on mineral surfaces 浮选浸出法选择性去除含稀土磷矿中的白云石及药剂在矿物表面的吸附机理

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-11-21 DOI: 10.1002/sia.7271

Jun Xie

{"title":"Selective removal of dolomite from rare earth element-bearing phosphorite by flotation and leaching and the adsorption mechanism of agents on mineral surfaces","authors":"Jun Xie","doi":"10.1002/sia.7271","DOIUrl":"https://doi.org/10.1002/sia.7271","url":null,"abstract":"The rare earth elements (REEs)-bearing phosphorite was a potential REE resource, which contained all REEs except polonium, among them lanthanide, cerium, neodymium, and yttrium were especially enriched. REEs mainly occurred in fluorapatite (Fap) and had a high positive correlation with phosphorus content. By adopting a new green environmental fatty acid collector GJBW and through one roughing and one refining reverse flotation process, all REEs were pre-enriched. The flotation concentrate was further leached with citric acid (CA), and all REEs were further enriched. The results of X-ray diffractometer (XRD), Fourier transform infrared spectroscopy (FT-IR), and X-ray photoelectron spectroscopy (XPS) showed that dolomite (Dolo) was removed and Fap was enriched in phosphorite, the selective enrichment of phosphorus and REEs was realized. Density functional theory (DFT) calculation revealed the mechanism of deep purification of REEs and phosphorus in phosphorite by CA at the micro-scale. The results showed that the number and strength of bonding between CA and Dolo (104) surface were greater than that between CA and Fap (001) surface, and CA was more easily adsorbed on Dolo (104) surface. Under the same conditions, Dolo in phosphorite was more easily leached by CA, while Fap was further enriched. This process provided a theoretical basis for the comprehensive recovery of REEs and phosphorus from phosphorite.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"33 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2023-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138534740","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Surface analysis insight note: An example of a cluster analysis of spectra from an X-ray photoelectron spectroscopy image 表面分析洞察注:x射线光电子能谱图像的光谱聚类分析示例

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-11-14 DOI: 10.1002/sia.7270

Behnam Moeini, John M. Linford, Neal Gallagher, Matthew R. Linford

{"title":"Surface analysis insight note: An example of a cluster analysis of spectra from an X-ray photoelectron spectroscopy image","authors":"Behnam Moeini, John M. Linford, Neal Gallagher, Matthew R. Linford","doi":"10.1002/sia.7270","DOIUrl":"https://doi.org/10.1002/sia.7270","url":null,"abstract":"Identification of similar and dissimilar spectra is an important part of analyzing X-ray photoelectron spectroscopy (XPS) images. Cluster analysis (CA) is a commonly used exploratory data analysis (EDA) method that groups similar spectra in a data set. CA can be performed in either an agglomerative fashion, for example, using Ward's method, which involves successively linking together/clustering the most similar spectra in a data set, or in a divisive fashion, for example, using the K-means approach, which involves partitioning all the data into a specified number of clusters. In this note, we show the application of CA to an XPS image dataset. The use of Ward's method identified two major clusters in the image, where one of the clusters appeared as two subclusters. The K-means image based on two clusters agrees well with previous analyses of the same image. The average spectra corresponding to clusters helped confirm the assignments made by the CA algorithms, as did a multivariate curve resolution (MCR) analysis of the interior region identified in our cluster analysis. “Elbow” plots can help determine the number of clusters to keep in K-means clustering. The combination of the agglomerative and divisive forms of CA, where the first informs the second, can be effective in revealing the structures of XPS image datasets. The Procrustean bed is a metaphor for overfitting and underfitting in EDA.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"105 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2023-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138534748","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

The effect of electrophoretic deposition of carbon nanotubes on carbon fiber on interfacial properties of the thermoplastic polyimide composite 碳纳米管在碳纤维表面电泳沉积对热塑性聚酰亚胺复合材料界面性能的影响

4区化学

Surface and Interface Analysis Pub Date : 2023-11-11 DOI: 10.1002/sia.7272

Li Jian

引用次数: 0

Comparing three strategies for surface treatment of Mg coated by hexamethylene diamine tetra methylene phosphonic acid for corrosion protection 比较了六亚乙二胺四亚甲基膦酸包覆镁合金的三种防腐处理策略

4区化学

Surface and Interface Analysis Pub Date : 2023-11-10 DOI: 10.1002/sia.7269

Hanaa Soliman, Fatma Abdel Mouez, Hoda Hussien, Abdel Salam Makhlouf, Guojiang Wan

引用次数: 0

Deep core level hard X‐ray photoelectron spectroscopy for catalyst characterization 催化剂表征的深核级硬X射线光电子能谱

4区化学

Surface and Interface Analysis Pub Date : 2023-11-07 DOI: 10.1002/sia.7267

Filippo Longo, Marin Nikolic, Andreas Borgschulte

引用次数: 0

Synthesis and characterization of iron sulfide immobilized on Algerian halloysite clay (HKDD3) with enhanced removal of methylene blue from aqueous medium 阿尔及利亚高岭土黏土(HKDD3)固定化硫化铁的合成及对亚甲基蓝的去除效果研究

4区化学

Surface and Interface Analysis Pub Date : 2023-11-07 DOI: 10.1002/sia.7268

Asma Hayoune, Hocine Akkari, Marcello Marelli, Valeria Pappalardo, Jia Yang, Muhammad Zubair

{"title":"Synthesis and characterization of iron sulfide immobilized on Algerian halloysite clay (HKDD3) with enhanced removal of methylene blue from aqueous medium","authors":"Asma Hayoune, Hocine Akkari, Marcello Marelli, Valeria Pappalardo, Jia Yang, Muhammad Zubair","doi":"10.1002/sia.7268","DOIUrl":"https://doi.org/10.1002/sia.7268","url":null,"abstract":"The aim of this study is to functionalize an Algerian halloysite clay (kaolin Djebel Debbagh, HKDD3) with FeS nanoparticles by employing a hydrothermal approach and exploring its ability to remove methylene blue under visible light irradiation. The FeS‐HKDD3 photocatalyst was synthesized successfully and exhibited good crystallinity. Different techniques were used to characterize the produced photocatalyst, including XRD, STEM/EDS, TEM, BET, and UV–vis DRS in order to investigate its structure, morphology, and optical performance. The HKDD3 is a natural halloysite having a tubular shape with a length ranging from 500 nm to several micrometers and a diameter that is estimated from 50 to 100 nm. The iron sulfide nanoparticles are immobilized as cube aggregates on the surface of the halloysite. The visible range displayed a strong absorption of the obtained photocatalyst, with an estimated bandgap of 1.60 eV, according to UV–vis DRS findings. The results exhibited a higher efficiency toward synergic adsorption‐photocatalytic degradation effect for methylene blue dye removal.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"80 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135539971","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0