Surface and Interface Analysis最新文献_第7页

Characterization of peroxide on coal surface: A combined △SCF and XPS study 煤表面过氧化物的特征：△SCF和XPS联合研究

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2024-01-01 DOI: 10.1002/sia.7281

Hao Liu, Zenghua Li

引用次数: 0

Surface Analysis Insight Note: Observations relating to photoemission peak shapes, oxidation state, and chemistry of titanium oxide films 表面分析洞察说明：与氧化钛薄膜的光发射峰形状、氧化态和化学性质有关的观察结果

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-12-29 DOI: 10.1002/sia.7283

Pascal Bargiela, Vincent Fernandez, William Ravisy, David Morgan, Mireille Richard-Plouet, Neal Fairley, Jonas Baltrusaitis

{"title":"Surface Analysis Insight Note: Observations relating to photoemission peak shapes, oxidation state, and chemistry of titanium oxide films","authors":"Pascal Bargiela, Vincent Fernandez, William Ravisy, David Morgan, Mireille Richard-Plouet, Neal Fairley, Jonas Baltrusaitis","doi":"10.1002/sia.7283","DOIUrl":"https://doi.org/10.1002/sia.7283","url":null,"abstract":"It is common practice to describe the coordination of metal atoms in a binding configuration with their nearest neighbors in terms of oxidation state, a measure by which the number of electrons redistributed between atoms forming chemical bonds. In XPS terms, change to an oxidation state is commonly inferred by correlating photoemission signal with binding energy. The assumption, when classifying photoemission signals into distinct spectral shapes, is that a distribution of intensities shifted to lower binding energy is evidence of a reduction in oxidation state. In this Insight note, we raise the prospect that changes in photoemission peak shape may occur without obvious changes, determined by XPS in stoichiometry for a material. It is well known that TiO2 measured by XPS yields reproducible Ti 2p photoemission peaks. However, on exposing TiO2 to ion beams, Ti 2p photoemission evolves to complex distributions in intensity, which are particularly difficult to analyze by traditional fitting of bell-shaped curves to these data. For these reasons, in this Insight note, a thin film of TiO2 deposited on a silicon substrate is chosen for analysis by XPS and linear algebraic techniques. Alterations in spectral shapes created from modified TiO2, which might be interpreted as the change in oxidation state, are assessed in terms of relative proportions of titanium to oxygen. It is found through detailed analysis of spectra that quantification by XPS, using procedures routinely used in practice, is not in accord with the typical interpretations of photoemission shapes. The data processing methods used and results presented in this work are of particular relevance to elucidating fundamental phenomena governing the surface evolution of materials-enabled energy processes where cyclic/non-steady usage changes the nature of bonding, especially in the presence of contaminants.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":1.7,"publicationDate":"2023-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139067080","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Boosting the hydrophobicity of eco-friendly polyaniline coating using TiO2 and ZnO nanoparticles 利用 TiO2 和 ZnO 纳米粒子提高环保型聚苯胺涂层的疏水性

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-12-27 DOI: 10.1002/sia.7280

Mona H. Gomaa, Ahmed Ibrahim, Kh. El-Sayed, Z. Abdel Hamid

{"title":"Boosting the hydrophobicity of eco-friendly polyaniline coating using TiO2 and ZnO nanoparticles","authors":"Mona H. Gomaa, Ahmed Ibrahim, Kh. El-Sayed, Z. Abdel Hamid","doi":"10.1002/sia.7280","DOIUrl":"https://doi.org/10.1002/sia.7280","url":null,"abstract":"This article clarifies the thin layer deposition of superhydrophobic coating using eco-friendly polymer (polyaniline [PANI]) incorporated with TiO2 and ZnO nanoparticles on indium tin oxide substrate. Using the cyclic voltammetry method, in situ polymerization of PANI incorporated with hybrid (TiO2–ZnO) was accomplished. The morphology and hydrophobicity of electro-deposited films were examined; the impact of deposition cycles was also investigated. The morphological structure was studied using field-emission scanning electron microscopy and high-resolution transmission electron microscopy. X-ray photoelectron spectroscopy and Fourier transform infrared spectroscopy analysis proved the incorporation of nanoparticles into the composite matrix. Additionally, the water contact angle of the PANI composite was found to be 150.4°, and the findings reflected that (TiO2–ZnO) nanoparticles were significantly implicated in enhancing this superhydrophobicity. The surface roughness of the PANI matrix was increased when TiO2 and ZnO are added, as was shown by atomic force microscope investigation.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":1.7,"publicationDate":"2023-12-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139055344","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Development of a compact laser-based heating stage for in situ spectroscopic characterizations 开发用于原位光谱表征的紧凑型激光加热台

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-12-27 DOI: 10.1002/sia.7278

Claudiu Colbea, Milivoj Plodinec, Marc Willinger, Jeroen A. van Bokhoven, Luca Artiglia

{"title":"Development of a compact laser-based heating stage for in situ spectroscopic characterizations","authors":"Claudiu Colbea, Milivoj Plodinec, Marc Willinger, Jeroen A. van Bokhoven, Luca Artiglia","doi":"10.1002/sia.7278","DOIUrl":"https://doi.org/10.1002/sia.7278","url":null,"abstract":"In this work, we present a recent advancement in high-temperature instrumentation in the form of a heating stage that enables studies to be performed in the temperature range of 20–1250°C under high-vacuum, millibar, and atmospheric pressure conditions (10−7–1000 mbar). The newly developed laser-based heating solution is described in detail. Its functionality is highlighted in this study in the form of a heating stage compatible with in situ ambient pressure X-ray photoelectron spectroscopy (APXPS). The proof-of-concept experiment presented in this work involves a polycrystalline nickel foil, a material of considerable interest in the scientific field due to its applications in catalysis, batteries, and electrochemistry. Owing to the intrinsic oxophilicity of nickel, the experiment targeted the high-temperature oxidation (600°C) and reduction (1050°C) that serves interest as both, a pretreatment and preparation method, and as a model reaction for the redox behavior of non-noble materials under reactive conditions. Complete and reversible surface state changes from metallic to oxide and back to metallic were achieved through stepwise variations of the gas phase composition and temperature. The heating stage showed high stability at high temperatures under reducing and oxidizing conditions, demonstrating the benefit of this design. The in situ characterization possibilities enabled by this stage will allow a better understanding of the inherent properties of materials that function at high temperatures, leading to their optimization in relevant application fields such as catalysis, materials, and surface science.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":1.7,"publicationDate":"2023-12-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139067077","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Revealing cation and metal gradients in and underneath passive films of the stainless steel 1.4652 in acidic and alkaline electrolytes with angular resolved dual energy X-ray photo-electron spectroscopy 利用角分辨双能 X 射线光电子能谱揭示酸性和碱性电解质中 1.4652 不锈钢被动膜内和被动膜下的阳离子和金属梯度

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-12-11 DOI: 10.1002/sia.7275

Claes-Olof A. Olsson, Roland Hauert, Anna Neus Igual-Muñoz, Stefano Mischler, Patrik Schmutz

{"title":"Revealing cation and metal gradients in and underneath passive films of the stainless steel 1.4652 in acidic and alkaline electrolytes with angular resolved dual energy X-ray photo-electron spectroscopy","authors":"Claes-Olof A. Olsson, Roland Hauert, Anna Neus Igual-Muñoz, Stefano Mischler, Patrik Schmutz","doi":"10.1002/sia.7275","DOIUrl":"https://doi.org/10.1002/sia.7275","url":null,"abstract":"Passive films on the superaustenitic stainless steel 1.4652 were studied using angular resolved hard X-ray photo-electron spectroscopy (HAXPES), which provides an increased information depth compared to conventional X-ray photo-electron spectroscopy (XPS). Elemental depth profiles in the oxide as well as gradients in the underlying metal were established using a dedicated algorithm. The utility was exemplified for three different conditions of film formation: (i) as polished and as polarized to the high passive end in (ii) 1 M H2SO4 and (iii) 1 M NaOH. The use of a superaustenitic material ascertained that metal signals from the main contributors to film formation: Fe, Cr, Ni, and Mo remained above the detection limit throughout the data set. With the dual-source technique (XPS, HAXPES), it was possible to investigate metal gradients underneath the passive film. For polarizations in an acidic environment, a metallic nickel enrichment of the order of 5 Å was found. For a corresponding polarization in an alkaline environment, the metal region closest to the oxide/metal interface was enriched in iron, followed by concentration gradients down to about 50 Å into the metal.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":1.7,"publicationDate":"2023-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138572652","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A new working reference material for cassiterite oxygen isotope microanalysis 锡石氧同位素显微分析的新工作参考材料

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-12-10 DOI: 10.1002/sia.7279

Sheng He, Yang Li, Li-Guang Wu, Rui-Ping Liu, Dong-Fa Guo, Zi-Ying Li, Xian-Hua Li

{"title":"A new working reference material for cassiterite oxygen isotope microanalysis","authors":"Sheng He, Yang Li, Li-Guang Wu, Rui-Ping Liu, Dong-Fa Guo, Zi-Ying Li, Xian-Hua Li","doi":"10.1002/sia.7279","DOIUrl":"https://doi.org/10.1002/sia.7279","url":null,"abstract":"Cassiterite is the principal ore mineral for tin, and its oxygen isotope is a promising proxy to trace the origin and evolution of ore-forming fluids, which requires precise and accurate oxygen isotopic analysis. Secondary ion mass spectrometry (SIMS) is a powerful tool for oxygen isotope analysis, especially when samples bear complicated textures, but matrix-matched reference materials are critical for accurate microanalysis. The only available matrix-matched reference material for cassiterite oxygen isotope analysis is Yongde-Cst, and more reference materials are required. Here, we report Piaotang-Cst as a potential working reference material for cassiterite oxygen isotope microanalysis. Our extensive SIMS microanalysis confirmed that Piaotang-Cst is relatively homogeneous, with an average two standard deviations (2SD) of 0.49‰ (n = 626). The δ18OVSMOW value of Piaotang-Cst is 5.33 ± 0.07‰ (2SD, n = 5) as determined by a conventional fluorination isotope ratio mass spectrometer. We also demonstrated that there is no measurable matrix effect caused by the variable contents of trace elements for cassiterite oxygen isotope microanalysis. We proposed that the Piaotang-Cst can be used as a working reference material for monitoring the external reproducibility and accuracy of SIMS analysis.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":1.7,"publicationDate":"2023-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138569397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy protocol for the analysis of organic multilayers 用于分析有机多层膜的飞行时间二次离子质谱和 X 射线光电子能谱协议

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-12-10 DOI: 10.1002/sia.7277

Claire Guyot, Jean-Paul Barnes, Olivier Renault, Tony Maindron

{"title":"Time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy protocol for the analysis of organic multilayers","authors":"Claire Guyot, Jean-Paul Barnes, Olivier Renault, Tony Maindron","doi":"10.1002/sia.7277","DOIUrl":"https://doi.org/10.1002/sia.7277","url":null,"abstract":"With the development in the early 2000s of new cluster ion sputtering sources, a reliable analysis of organic multilayers and interfaces has become possible. Nowadays, time-of-flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) depth profiling are routinely used to investigate organic stacks. However, analysis beams can cause bond scission or beam-induced degradations that accumulate in buried layers. We developed a correlative protocol that minimises damages related to analysis beams. It uses a shallow angle bevel crater fabricated inside the ToF-SIMS analysis chamber. With this preparation method, the in-depth information is displayed over the surface of the bevel crater. XPS profiles and high-resolution spectra paired with ToF-SIMS images enable an easy identification of the organic layers and complete understanding of their chemistry. The reduction of beam-induced degradation is achieved by minimising the acquisition times, therefore beam exposure on materials. Finally, an important advantage of this preparation method is that the analysis can be performed on exactly the same spot by multiple techniques. Several ToF-SIMS and XPS acquisitions can be carried out with various parameters (investigation of backscattered Arn+ cluster ion fragments, tandem MS imaging…) as well as analysis with other techniques that possess limitations in spatial resolution and/or inaptitude to probe buried layers such as Raman or AFM.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":1.7,"publicationDate":"2023-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138568695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Effect of substrate temperature and annealing on the growth of TiO2-x thin films deposited by using DC-magnetron sputtering technique 基底温度和退火对直流磁控溅射技术沉积的 TiO2-x 薄膜生长的影响

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-12-10 DOI: 10.1002/sia.7274

Swapan Jana, Anil Krishna Debnath, Veerender Putta, Jitendra Bahadur, Jugal Kishor, Anil Kumar Chauhan, Debarati Bhattacharya

{"title":"Effect of substrate temperature and annealing on the growth of TiO2-x thin films deposited by using DC-magnetron sputtering technique","authors":"Swapan Jana, Anil Krishna Debnath, Veerender Putta, Jitendra Bahadur, Jugal Kishor, Anil Kumar Chauhan, Debarati Bhattacharya","doi":"10.1002/sia.7274","DOIUrl":"https://doi.org/10.1002/sia.7274","url":null,"abstract":"In this study, the effect of annealing on the structural, surface morphology and chemical structure of titanium suboxide (TiO2-x) thin films has been investigated. TiO2-x films had been grown on Si substrates by DC-magnetron sputtering with different sputter powers (75 and 100 W) at room temperature (RT) and 200°C substrate temperature (ST). The films were subsequently annealed for 1 h at 300, 400 and 500°C in vacuum. The impact of ST, post-annealing and sputter power on crystallinity, surface morphology and chemical state of the films were studied. Grazing incidence X-ray diffraction (GIXRD) data revealed that the films were amorphous or exhibited a very low crystalline structure while deposited at RT and even after annealing. Moreover, the films showed crystallinity while deposited at ST and exhibited an anatase-rutile (A-R) mix phase from anatase (A) annealed at 300°C (75 W at ST). X-ray reflectivity (XRR) data showed that the mass density of the films increased with the annealing temperature. Images obtained using atomic force microscopy (AFM) and field emission scanning electron microscopy (FESEM) revealed that post-annealing increased the surface roughness of the films. X-ray photoelectron spectroscopy (XPS) analysis indicated the films were sub stoichiometric. It was also indicated that Ti was in the form of Ti4+ and Ti3+ states in all films, and the proportion of Ti4+ slightly increased after post-annealing at 500°C. The findings showed that post-annealing, ST and sputtering power can all affect the growth of TiO2-x films.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":1.7,"publicationDate":"2023-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138569330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Surface analysis insight note: Illustrating the effect of adventitious contamination on Pt photoemission peak intensities 表面分析洞察注:说明了不确定污染对Pt光电发射峰强度的影响

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-12-05 DOI: 10.1002/sia.7276

Neal Fairley, Pascal Bargiela, Jonas Baltrusaitis

引用次数: 0

HAXPES: Inelastic background for characterization of nanostructured materials HAXPES:表征纳米结构材料的非弹性背景

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2023-11-28 DOI: 10.1002/sia.7273

Sven Tougaard

引用次数: 0