R. Torshin, D. Bobrovsky, A. Ulanova, G. Sorokoumov, M. Kalashnikova, D. Titovets
{"title":"Total Ionizing Dose Effects in High-Speed 16-bit Analog-to-Digital Converter","authors":"R. Torshin, D. Bobrovsky, A. Ulanova, G. Sorokoumov, M. Kalashnikova, D. Titovets","doi":"10.1109/MWENT55238.2022.9802427","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802427","url":null,"abstract":"The paper presents the research results of Total Ionizing Dose (TID) Effects in high-speed (80 MSPS) analog-to-digital converter (ADC). The article incorporates the description of the equipment for parametric control of the device under test and methodology for measuring ADC characteristics. The article also presents pre-irradiation graphs of integral non-linearity (INL), differential non-linearity (DNL), amplitude spectrum and its degradation during exposure. With regard to findings of the study was determined the most critical operation mode of the Device Under Test (DUT) during irradiation and the most TID sensitive parameter.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124435640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
V. Zhmud, Y. Fomin, D. Tereshkin, V. Semibalamut, O. Stukach, L. Dimitrov
{"title":"Broadband Signal Recorder with Reference to Space-Time Coordinates for Electrical Exploration Geophysical Works","authors":"V. Zhmud, Y. Fomin, D. Tereshkin, V. Semibalamut, O. Stukach, L. Dimitrov","doi":"10.1109/MWENT55238.2022.9802221","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802221","url":null,"abstract":"The paper solves the problem of creating a device for electrical measurements for the purpose of geological research. There are a large number of data acquisition and processing systems, analog-to-digital converters and other serial processing technical means for measuring and storing analog electrical data with their preliminary conversion into digital readings. This is done for the purpose of subsequent processing of these signals, which allows calculating some characteristics, which are then used to calculate and model the characteristics of soil, rocks, etc. These electrical measurements for geological and geophysical surveys require the reference of the readings to an absolute grid of spatial coordinates and to absolute time. Such a binding is carried out using special communication units with global satellite systems GPS and GLONASS. These units are independently capable of communicating with the indicated satellite systems to obtain spatial and temporal absolute coordinates. It is also important to synchronize the received readings to the specified absolute time scale. It is also necessary to provide wide bandwidth, high conversion accuracy, autonomy of work according to a predetermined program or work with operator control, as two possible modes, mechanical and hermetic protection of such units is also required from almost all types of harmful influences found in nature. This task in the complex is solved by creating a special device, which is described in this paper.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"235 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122349968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The Principle of Increasing Reliability in The Operation of Electronic Craft-Equipment of Cyber-Physical Systems","authors":"Y. Kofanov, N. Kuznetsov, S. Y. Sotnikova","doi":"10.1109/MWENT55238.2022.9802376","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802376","url":null,"abstract":"This work is devoted to ensuring the reliability of electronic cyber-physical systems for responsible purposes, produced in a small series or even in a single copy. They implement ways of individual and collective generation of new ideas, creative solutions of various equipment. Such electronic equipment is called craft-equipment. The failure is the result of one of the performance characteristics of the craft-equipment going beyond the established limits of the tolerance. This occurs because of the gradual drift of the characteristic value due to the influence of external factors and aging. The research conducted by the authors has shown that, since the cyber-physical system is multifunctional, not all of its functional characteristics are in demand at the same time. This means that due to natural drift, an unclaimed characteristic can be configured so that at the beginning of its non-working period, its random value may be outside the tolerance field. During this period, the probability of performing work functions, if you suddenly need to use it, will be low. As a result of natural drift, the field of characteristic variations enters the working field of the tolerance of craft-equipment, i.e., performs its functions with high reliability. The authors called this setting as the principle of increasing reliability. In their work, the authors describe in detail the implementation of the proposed principle in the process of operation of electronic craft-equipment as a part of a complex cyber-physical system.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114429367","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Aivar Urkunov, P. Korolev, I. Ivanov, S. Polesskiy, A. Sosnin, K. Sedov
{"title":"Research of Mathematical Models for Assessing the Pumping Flashtubes Failure Rate","authors":"Aivar Urkunov, P. Korolev, I. Ivanov, S. Polesskiy, A. Sosnin, K. Sedov","doi":"10.1109/MWENT55238.2022.9802300","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802300","url":null,"abstract":"The study reviews and analyzes three mathematical models of operational failure rates given in dependability handbooks for thin-film precision resistors used in radioelectronic devices. Besides, the mathematical models of mode factor and basic failure rate are analyzed. Based on experimental data of temperature coefficient of resistance, resistance shift and basic machine learning methods the refined mathematical model of mode coefficient is formed, taking into account the extended temperature range.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121989712","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Lobarev, D. Plotnikov, George Chukov, V. Potapov, A. Nikulin, A. Kurilov
{"title":"Testing System Development for Full-Scale Simulators of Nuclear Power Plant Unit","authors":"A. Lobarev, D. Plotnikov, George Chukov, V. Potapov, A. Nikulin, A. Kurilov","doi":"10.1109/MWENT55238.2022.9802215","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802215","url":null,"abstract":"The full-scale simulator (FSS) of nuclear power plant (NPP) unit is designed for operating personnel professional joint training of the power unit’s main control room using its real full-scale model. Testing of all FSS systems has an important place in the software part of the development of FSS. Currently, the development of software testing for FSS systems is required. The article provides an overview ozf modern testing systems. In addition, the article presents the algorithms for the operation of tests designed by using Pytest – the framework for writing software tests. The paper presents the following tests: overpower test and check for the presence of chugging; test of the correctness of the decay heat model in terms of amplitude in the event of scram and stable attenuation of decay heat after scram.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124318389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Near-Infrared Electroluminescence of Silicon Thyristor Structure and Its Possible Applications","authors":"R. Mozhaev, A. Pechenkin, M. Gorbunov","doi":"10.1109/MWENT55238.2022.9802395","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802395","url":null,"abstract":"The paper presents a review of technological approaches of near-IR electroluminescence obtained in silicon. It was proven that the radiance was not of thermal type. The electroluminescence of a thyristor structure induced by the impact of focused laser pulse is demonstrated. Examples of light-emitting structures manufactured using commonly available technologies are shown.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121730507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Andreev, G. Bondarenko, V. Andreev, Sergey A. Loskutov
{"title":"Programmable set to monitor charge state change of MIS devices under high-fields","authors":"D. Andreev, G. Bondarenko, V. Andreev, Sergey A. Loskutov","doi":"10.1109/MWENT55238.2022.9802396","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802396","url":null,"abstract":"In modern microelectronics high fields are an essential condition of devices based on metal-insulator-semiconductor (MIS) structures what is caused by downscaling of nodes of semiconductor manufacturing processes. Under these conditions, a possibility of charge degradation increases what can result in dielectric film breakdown and following integrated circuit (IC) failure. Therefore, a designing of configurable set to monitor charge state change of MIS devices under high fields is a relevant task. In order to implement this, we developed a programmable set which is based on a combined evaluation of the charge state of MIS devices being under electron injection. The set consists of a unit for injection monitoring and a unit to measure C-V curves.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"108 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131926222","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D.S. Kostyuchenko, D. Bobrovskiy, A. Pechenkin, V. Marfin, A. Tsirkov, A. Karakozov
{"title":"Non-Contact Temperature Setting System for VLSI with High Heat Dissipation","authors":"D.S. Kostyuchenko, D. Bobrovskiy, A. Pechenkin, V. Marfin, A. Tsirkov, A. Karakozov","doi":"10.1109/MWENT55238.2022.9802243","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802243","url":null,"abstract":"It was required to develop a non-contact cooling system for conducting radiation research of VLSI with high heat generation. During the development process, various available methods for cooling products were considered and tested: immersion cooling and a cold-box – these methods did not bring the desired result.As a result, a cooling system was assembled based on the process of blowing the VLSI crystal with high-pressure compressed air. The system was based on an air compressor. The compressor was supplemented with external sensors to control the temperature of the samples and a control system for the output air flow. The entire process of setting the sample temperature was automatically controlled from a personal computer. The software and hardware parts of the solution are presented in this article.This non-contact cooling system has shown itself well in the conditions of real VLSI radiation research at physical facilities. However, in the future it is planned to improve a number of parameters in order to develop this cooling system to increase its efficiency.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114850650","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Accelerating Join of Distributed Datasets by a Given Criterion","authors":"Yevgeniya Tyryshkina","doi":"10.1109/MWENT55238.2022.9802185","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802185","url":null,"abstract":"This article discusses the operation of joining distributed datasets by a given criterion in distributed systems. A critical analysis of literature data on the architecture of distributed data warehouses and typical methods for joining datasets was carried out, limiting stages that slow down the process were identified. A method for accelerating the operation of data joining according to a given criterion is proposed, on the basis of which an algorithm is developed and implemented in the Apache Spark data processing environment. Experimental studies confirming the efficiency of the developed method were performed. The results of the experiments show that the proposed method can significantly increase speed of the operation compared to existing solutions. From the presented experimental data, it can be seen that for 2 TB data, the algorithm made it possible to perform the merge operation ~ 37% faster than the standard algorithm offered by the Spark SQL library, for 7 TB data it was already ~ 47%.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116312117","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. O. Teplyakova, A. Egorov, V. D. Kalashnikov, A. Ulanova, V. Marfin, M. A. Rogovaia
{"title":"Influence of X-ray Source Spectrum on TID Degradation of CMOS Devices","authors":"A. O. Teplyakova, A. Egorov, V. D. Kalashnikov, A. Ulanova, V. Marfin, M. A. Rogovaia","doi":"10.1109/MWENT55238.2022.9802295","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802295","url":null,"abstract":"The paper presents an evaluation of degradation of parameters of CMOS devices under x-ray irradiation with different spectra. Using aluminum filters of different thicknesses and various operating modes of the X-ray facility the low-energy part of X-ray spectrum was attenuated. The obtained data indicates that the modification of the X-ray energy spectrum affects ionizing radiation response of CMOS ICs parameters. A quantitative assessment of the difference in the radiation behavior of IC’s parameters is given. A hypothesis that can explain the cause of difference in parameter degradation is put forward.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"141 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124743343","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}