Aivar Urkunov, P. Korolev, I. Ivanov, S. Polesskiy, A. Sosnin, K. Sedov
{"title":"泵送闪光管故障率评估数学模型研究","authors":"Aivar Urkunov, P. Korolev, I. Ivanov, S. Polesskiy, A. Sosnin, K. Sedov","doi":"10.1109/MWENT55238.2022.9802300","DOIUrl":null,"url":null,"abstract":"The study reviews and analyzes three mathematical models of operational failure rates given in dependability handbooks for thin-film precision resistors used in radioelectronic devices. Besides, the mathematical models of mode factor and basic failure rate are analyzed. Based on experimental data of temperature coefficient of resistance, resistance shift and basic machine learning methods the refined mathematical model of mode coefficient is formed, taking into account the extended temperature range.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Research of Mathematical Models for Assessing the Pumping Flashtubes Failure Rate\",\"authors\":\"Aivar Urkunov, P. Korolev, I. Ivanov, S. Polesskiy, A. Sosnin, K. Sedov\",\"doi\":\"10.1109/MWENT55238.2022.9802300\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The study reviews and analyzes three mathematical models of operational failure rates given in dependability handbooks for thin-film precision resistors used in radioelectronic devices. Besides, the mathematical models of mode factor and basic failure rate are analyzed. Based on experimental data of temperature coefficient of resistance, resistance shift and basic machine learning methods the refined mathematical model of mode coefficient is formed, taking into account the extended temperature range.\",\"PeriodicalId\":218866,\"journal\":{\"name\":\"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWENT55238.2022.9802300\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWENT55238.2022.9802300","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Research of Mathematical Models for Assessing the Pumping Flashtubes Failure Rate
The study reviews and analyzes three mathematical models of operational failure rates given in dependability handbooks for thin-film precision resistors used in radioelectronic devices. Besides, the mathematical models of mode factor and basic failure rate are analyzed. Based on experimental data of temperature coefficient of resistance, resistance shift and basic machine learning methods the refined mathematical model of mode coefficient is formed, taking into account the extended temperature range.
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