R. Torshin, D. Bobrovsky, A. Ulanova, G. Sorokoumov, M. Kalashnikova, D. Titovets
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引用次数: 0
摘要
本文介绍了高速(80msps)模数转换器(ADC)中总电离剂量(TID)效应的研究结果。本文结合了被测器件参数控制设备的描述和测量ADC特性的方法。给出了辐照前的积分非线性(INL)、微分非线性(DNL)、幅值谱及其在辐照过程中的衰减图。根据研究结果确定了辐照过程中被测装置(Device Under Test, DUT)最关键的工作模式和最敏感的TID参数。
Total Ionizing Dose Effects in High-Speed 16-bit Analog-to-Digital Converter
The paper presents the research results of Total Ionizing Dose (TID) Effects in high-speed (80 MSPS) analog-to-digital converter (ADC). The article incorporates the description of the equipment for parametric control of the device under test and methodology for measuring ADC characteristics. The article also presents pre-irradiation graphs of integral non-linearity (INL), differential non-linearity (DNL), amplitude spectrum and its degradation during exposure. With regard to findings of the study was determined the most critical operation mode of the Device Under Test (DUT) during irradiation and the most TID sensitive parameter.
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