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Smart Energy Harvesting System for IoT & Cyber Physical Devices 用于物联网和网络物理设备的智能能量收集系统
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI: 10.1109/MWENT55238.2022.9802280
A. Yelizarov, I. Nazarov, E. Zakirova, A. Skuridin, D. Rano
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引用次数: 2
Screening of LEDs by the Results of Accelerated Tests Under the Action of Pulsed Current 脉冲电流作用下加速试验对led的筛选
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI: 10.1109/MWENT55238.2022.9802244
I. Frolov, V. Sergeev, O. Radaev
{"title":"Screening of LEDs by the Results of Accelerated Tests Under the Action of Pulsed Current","authors":"I. Frolov, V. Sergeev, O. Radaev","doi":"10.1109/MWENT55238.2022.9802244","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802244","url":null,"abstract":"The results of investigations of the decrease in the luminous flux of emission of blue InGaN LEDs during tests at a constant current with a density of 35 A/cm2, previously exposed to a test exposure of a pulsed current with a density of 100 A/cm2 for 1, 2, 5, 10 and 20 h, respectively, are presented. It is shown that the test exposure of a pulsed current of increased density, which does not lead to the destruction of the structure, makes it possible to identify and reject LEDs with an abnormally high rate of change in the luminous flux at the initial stage of current tests and, thereby, equalize the degradation rate of LEDs in the sample.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114891149","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Problems of Microassemblies Constructional Adaptation for SEE Heavy Ion Testing 用于SEE重离子测试的微组件结构适应问题
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI: 10.1109/MWENT55238.2022.9802283
D. Gritsaenko, A. Tararaksin, E. Glazunova, Artem Murygin, V. Napalkov, A. Boruzdina, A. Yanenko, G. Chukov
{"title":"The Problems of Microassemblies Constructional Adaptation for SEE Heavy Ion Testing","authors":"D. Gritsaenko, A. Tararaksin, E. Glazunova, Artem Murygin, V. Napalkov, A. Boruzdina, A. Yanenko, G. Chukov","doi":"10.1109/MWENT55238.2022.9802283","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802283","url":null,"abstract":"In this work we consider possible approaches to microassemblies constructional adaptation of various functional groups and various designs for heavy ion testing. Using power supplies as an example, we present an algorithm that minimizes the loss of samples during test preparation without losing test informativity. In many cases it is preferable to carry out the preparation in collaboration with the device developer.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133199085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Welcome to the 2022 Moscow Workshop on Electronic and Networking Technologies 欢迎参加2022年莫斯科电子和网络技术研讨会
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2020-03-01 DOI: 10.1109/mwent47943.2020.9067354
Stukach Oleg, I. Ilya
{"title":"Welcome to the 2022 Moscow Workshop on Electronic and Networking Technologies","authors":"Stukach Oleg, I. Ilya","doi":"10.1109/mwent47943.2020.9067354","DOIUrl":"https://doi.org/10.1109/mwent47943.2020.9067354","url":null,"abstract":"","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133846691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Copyright Page 版权页
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 1966-03-01 DOI: 10.1109/csii.2018.00003
{"title":"Copyright Page","authors":"","doi":"10.1109/csii.2018.00003","DOIUrl":"https://doi.org/10.1109/csii.2018.00003","url":null,"abstract":"","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"07 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1966-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129039689","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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