D. Gritsaenko, A. Tararaksin, E. Glazunova, Artem Murygin, V. Napalkov, A. Boruzdina, A. Yanenko, G. Chukov
{"title":"The Problems of Microassemblies Constructional Adaptation for SEE Heavy Ion Testing","authors":"D. Gritsaenko, A. Tararaksin, E. Glazunova, Artem Murygin, V. Napalkov, A. Boruzdina, A. Yanenko, G. Chukov","doi":"10.1109/MWENT55238.2022.9802283","DOIUrl":null,"url":null,"abstract":"In this work we consider possible approaches to microassemblies constructional adaptation of various functional groups and various designs for heavy ion testing. Using power supplies as an example, we present an algorithm that minimizes the loss of samples during test preparation without losing test informativity. In many cases it is preferable to carry out the preparation in collaboration with the device developer.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWENT55238.2022.9802283","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this work we consider possible approaches to microassemblies constructional adaptation of various functional groups and various designs for heavy ion testing. Using power supplies as an example, we present an algorithm that minimizes the loss of samples during test preparation without losing test informativity. In many cases it is preferable to carry out the preparation in collaboration with the device developer.