用于SEE重离子测试的微组件结构适应问题

2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI:10.1109/MWENT55238.2022.9802283

D. Gritsaenko, A. Tararaksin, E. Glazunova, Artem Murygin, V. Napalkov, A. Boruzdina, A. Yanenko, G. Chukov

{"title":"用于SEE重离子测试的微组件结构适应问题","authors":"D. Gritsaenko, A. Tararaksin, E. Glazunova, Artem Murygin, V. Napalkov, A. Boruzdina, A. Yanenko, G. Chukov","doi":"10.1109/MWENT55238.2022.9802283","DOIUrl":null,"url":null,"abstract":"In this work we consider possible approaches to microassemblies constructional adaptation of various functional groups and various designs for heavy ion testing. Using power supplies as an example, we present an algorithm that minimizes the loss of samples during test preparation without losing test informativity. In many cases it is preferable to carry out the preparation in collaboration with the device developer.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The Problems of Microassemblies Constructional Adaptation for SEE Heavy Ion Testing\",\"authors\":\"D. Gritsaenko, A. Tararaksin, E. Glazunova, Artem Murygin, V. Napalkov, A. Boruzdina, A. Yanenko, G. Chukov\",\"doi\":\"10.1109/MWENT55238.2022.9802283\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work we consider possible approaches to microassemblies constructional adaptation of various functional groups and various designs for heavy ion testing. Using power supplies as an example, we present an algorithm that minimizes the loss of samples during test preparation without losing test informativity. In many cases it is preferable to carry out the preparation in collaboration with the device developer.\",\"PeriodicalId\":218866,\"journal\":{\"name\":\"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWENT55238.2022.9802283\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWENT55238.2022.9802283","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

在这项工作中，我们考虑了各种官能团的微组装结构适应和重离子测试的各种设计的可能方法。以电源为例，我们提出了一种算法，在不丢失测试信息的情况下，最大限度地减少测试准备过程中的样本损失。在许多情况下，最好与设备开发人员合作进行制备。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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The Problems of Microassemblies Constructional Adaptation for SEE Heavy Ion Testing

In this work we consider possible approaches to microassemblies constructional adaptation of various functional groups and various designs for heavy ion testing. Using power supplies as an example, we present an algorithm that minimizes the loss of samples during test preparation without losing test informativity. In many cases it is preferable to carry out the preparation in collaboration with the device developer.

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2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)

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