Proceedings of the Fifth Asian Test Symposium (ATS'96)最新文献_第5页

Hybrid pin control using boundary-scan and its applications 边界扫描混合管脚控制及其应用

Proceedings of the Fifth Asian Test Symposium (ATS'96) Pub Date : 1996-11-20 DOI: 10.1109/ATS.1996.555135

W. Ke

引用次数: 5

Yield improvement by test error cancellation 通过消除测试误差来提高成品率

Proceedings of the Fifth Asian Test Symposium (ATS'96) Pub Date : 1996-11-20 DOI: 10.1109/ATS.1996.555168

Jwu E. Chen

引用次数: 2

E-groups: a new technique for fast backward propagation in system-level test generation e群:在系统级测试生成中快速反向传播的新技术

Proceedings of the Fifth Asian Test Symposium (ATS'96) Pub Date : 1996-11-20 DOI: 10.1109/ATS.1996.555133

M. Nicolaidis, R. Parekhji, M. Boudjit

引用次数: 1

Lessons learned from practical applications of BIST/B-S technology BIST/B-S技术实际应用的经验教训

Proceedings of the Fifth Asian Test Symposium (ATS'96) Pub Date : 1996-11-20 DOI: 10.1109/ATS.1996.555167

N. Jarwala, P. W. Rutkowski, Shianling Wu, C. W. Yau

引用次数: 0

A practical implementation of dynamic testing of an AD converter AD转换器动态测试的实际实现

Proceedings of the Fifth Asian Test Symposium (ATS'96) Pub Date : 1996-11-20 DOI: 10.1109/ATS.1996.555165

Y. Ting, L. Chao, W. Chao

{"title":"A practical implementation of dynamic testing of an AD converter","authors":"Y. Ting, L. Chao, W. Chao","doi":"10.1109/ATS.1996.555165","DOIUrl":"https://doi.org/10.1109/ATS.1996.555165","url":null,"abstract":"This paper presents a practical testing system which can measure the dynamic parameters such as effective bits (EB), signal to noise ratio (SNR), differential and integral nonlinearity (DNL and INL) of an AD converter. For practical implementation we propose a mixed frequency estimation algorithm with weighted least square method to estimate the EB. Furthermore we combine the spectral average method with frequency domain estimation to measure the SNR and use the histogram method to calculate the DNL and the INL. For practical purpose, we choose a logical analyzer as the high speed data acquisition device and a PC as the instrument controller. Two programmable signal generators with very low harmonic distortion are used for signal source of the ADC Testing. All the instruments are controlled by the PC through GPIB with a test software. Finally we apply the proposed test system and algorithm to measure the dynamic parameters of a real ADC (Datel ADC-HS12B). Results show that the proposed test system and methods are fast and accurate. Users can test the ADC automatically without worrying about the expensive testing instruments, interface problems and complex algorithms which may occur in other ADC testing systems.","PeriodicalId":215252,"journal":{"name":"Proceedings of the Fifth Asian Test Symposium (ATS'96)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114746055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

On design of fail-safe cellular arrays 故障安全蜂窝阵列的设计

Proceedings of the Fifth Asian Test Symposium (ATS'96) Pub Date : 1996-11-20 DOI: 10.1109/ATS.1996.555145

N. Kamiura, Y. Hata, K. Yamato

引用次数: 3