{"title":"On design of fail-safe cellular arrays","authors":"N. Kamiura, Y. Hata, K. Yamato","doi":"10.1109/ATS.1996.555145","DOIUrl":null,"url":null,"abstract":"In this paper, we discuss the design of a fail-safe cellular array composed of switch cells. First, we show the design method using a binary decision diagram. Next, we assume stuck-at-faults of switch cells to be fault models and discuss the fail-safe property for our array. For all the single faults and part of the multiple faults, our array keeps the fail-safe property. Next, for our arrays realizing randomly generated functions, we derive the ratio of the number of double faults that never break the fail-safe property to the total number of double faults. Finally, in order to demonstrate the advantages of our array, we compare our array with other arrays.","PeriodicalId":215252,"journal":{"name":"Proceedings of the Fifth Asian Test Symposium (ATS'96)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Fifth Asian Test Symposium (ATS'96)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1996.555145","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
In this paper, we discuss the design of a fail-safe cellular array composed of switch cells. First, we show the design method using a binary decision diagram. Next, we assume stuck-at-faults of switch cells to be fault models and discuss the fail-safe property for our array. For all the single faults and part of the multiple faults, our array keeps the fail-safe property. Next, for our arrays realizing randomly generated functions, we derive the ratio of the number of double faults that never break the fail-safe property to the total number of double faults. Finally, in order to demonstrate the advantages of our array, we compare our array with other arrays.