{"title":"故障安全蜂窝阵列的设计","authors":"N. Kamiura, Y. Hata, K. Yamato","doi":"10.1109/ATS.1996.555145","DOIUrl":null,"url":null,"abstract":"In this paper, we discuss the design of a fail-safe cellular array composed of switch cells. First, we show the design method using a binary decision diagram. Next, we assume stuck-at-faults of switch cells to be fault models and discuss the fail-safe property for our array. For all the single faults and part of the multiple faults, our array keeps the fail-safe property. Next, for our arrays realizing randomly generated functions, we derive the ratio of the number of double faults that never break the fail-safe property to the total number of double faults. Finally, in order to demonstrate the advantages of our array, we compare our array with other arrays.","PeriodicalId":215252,"journal":{"name":"Proceedings of the Fifth Asian Test Symposium (ATS'96)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"On design of fail-safe cellular arrays\",\"authors\":\"N. Kamiura, Y. Hata, K. Yamato\",\"doi\":\"10.1109/ATS.1996.555145\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we discuss the design of a fail-safe cellular array composed of switch cells. First, we show the design method using a binary decision diagram. Next, we assume stuck-at-faults of switch cells to be fault models and discuss the fail-safe property for our array. For all the single faults and part of the multiple faults, our array keeps the fail-safe property. Next, for our arrays realizing randomly generated functions, we derive the ratio of the number of double faults that never break the fail-safe property to the total number of double faults. Finally, in order to demonstrate the advantages of our array, we compare our array with other arrays.\",\"PeriodicalId\":215252,\"journal\":{\"name\":\"Proceedings of the Fifth Asian Test Symposium (ATS'96)\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-11-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Fifth Asian Test Symposium (ATS'96)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1996.555145\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Fifth Asian Test Symposium (ATS'96)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1996.555145","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this paper, we discuss the design of a fail-safe cellular array composed of switch cells. First, we show the design method using a binary decision diagram. Next, we assume stuck-at-faults of switch cells to be fault models and discuss the fail-safe property for our array. For all the single faults and part of the multiple faults, our array keeps the fail-safe property. Next, for our arrays realizing randomly generated functions, we derive the ratio of the number of double faults that never break the fail-safe property to the total number of double faults. Finally, in order to demonstrate the advantages of our array, we compare our array with other arrays.