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2009 20th International Zurich Symposium on Electromagnetic Compatibility最新文献

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Occurrence of GPS Phase Fluctuations in Northern and Southern Hemisphere 北半球和南半球GPS相位波动的发生
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783451
I. Shagimuratov, A. Krankowski, I. Efishov, I. Zakharenkova, N. Tepenitsyna
{"title":"Occurrence of GPS Phase Fluctuations in Northern and Southern Hemisphere","authors":"I. Shagimuratov, A. Krankowski, I. Efishov, I. Zakharenkova, N. Tepenitsyna","doi":"10.1109/EMCZUR.2009.4783451","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783451","url":null,"abstract":"In paper presented analysis of storm-time occurrence of GPS phase fluctuations in high latitude ionosphere for the southern and northern hemisphere.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"126 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131322106","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A Distributed-Constants Model of Three-Phase Induction Drives for Conducted Emission Studies 用于传导发射研究的三相感应驱动器的分布常数模型
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783418
F. Torre, S. Leva, A. Morando
{"title":"A Distributed-Constants Model of Three-Phase Induction Drives for Conducted Emission Studies","authors":"F. Torre, S. Leva, A. Morando","doi":"10.1109/EMCZUR.2009.4783418","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783418","url":null,"abstract":"In this paper a distributed-constants model to predict conducted emission in three-phase asynchronous drives is presented. The model permits to derive the spectra of conducted emissions in several position of the drive system. The numeric results obtained with the proposed approach is useful to design a drive that match the EMC Normative.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124649256","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of a Low EMI Micro-controller Package for Automobile Applications 汽车用低电磁干扰微控制器的研制
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783469
Y. Mabuchi, A. Nakamura, A. Ohmae, T. Uno, K. Ichikawa, H. Mizuno
{"title":"Development of a Low EMI Micro-controller Package for Automobile Applications","authors":"Y. Mabuchi, A. Nakamura, A. Ohmae, T. Uno, K. Ichikawa, H. Mizuno","doi":"10.1109/EMCZUR.2009.4783469","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783469","url":null,"abstract":"For ECUs the common-mode current is the main cause of EMI problems. In this paper, the mechanism of common-mode current generation and an effective way to reduce it is considered theoretically. From the consideration it is obtained that the common-mode current caused by the differential-mode current can be suppressed by means of adjusting the impedance of a PCB to be balancing adequately. And a package in which the impedance adjusting circuit and oscillator circuit is implement is developed for a micro-controller. The measurement shows that the developed package can reduce the common-mode current generation compared to the conventional QFP package. And the developed package can minimize the value of the common-mode current by means of adjusting the inductance of the power bus line in the package.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"243 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124704907","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Measurements of the Induced Power in a Shape Shifting Transmission Line According to Immunity Tests in Reverberation and Semi Anechoic Chamber 利用混响和半消声室抗扰度试验测量变形传输线的感应功率
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783483
M. Obholz, D. Peier
{"title":"Measurements of the Induced Power in a Shape Shifting Transmission Line According to Immunity Tests in Reverberation and Semi Anechoic Chamber","authors":"M. Obholz, D. Peier","doi":"10.1109/EMCZUR.2009.4783483","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783483","url":null,"abstract":"Measurements of the induced power in a shape shifting transmission line are performed in the semi anechoic and reverberation chamber. The test setups are according to immunity tests. The device under test is a bar antenna, seen as transmission line, which is investigated for 3 geometric constellations. The differences between the measurement results in both test environments are pointed out. Finally, a maximum hold, over all measurements in the semi anechoic chamber, is compared to one measurement in the reverberation chamber.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"213 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115059559","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Total radiated power measurements of WiFi devices using a compact reverberation chamber 使用紧凑混响室测量WiFi设备的总辐射功率
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783391
V. Monebhurrun, T. Letertre
{"title":"Total radiated power measurements of WiFi devices using a compact reverberation chamber","authors":"V. Monebhurrun, T. Letertre","doi":"10.1109/EMCZUR.2009.4783391","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783391","url":null,"abstract":"A compact reverberation chamber is herein considered for the TRP (Total Radiated Power) measurements of WiFi devices. An immediate difficulty when testing WiFi devices is the lack of a standard emulator which allows robust control of the emitted signal for power measurement purposes. The average power delivered by a WiFi device depends upon the data rate which itself can also vary during time. Multipath environments also influence the data rate and the signal delivered by the device. The procedure proposed herein is developed in order to ensure repeatable measurements. The mechanical stirring of the reverberation chamber is optimized to enable fast measurements.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129915594","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Modelling of Electromagnetic Immunity of Integrated Circuits by Artificial Neural Networks 集成电路电磁抗扰度的人工神经网络建模
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783468
V. Ceperic, A. Barić
{"title":"Modelling of Electromagnetic Immunity of Integrated Circuits by Artificial Neural Networks","authors":"V. Ceperic, A. Barić","doi":"10.1109/EMCZUR.2009.4783468","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783468","url":null,"abstract":"A simple and efficient method of modelling electromagnetic immunity (EMI) of integrated circuits (IC) with respect to conducted electromagnetic interference by using artificial neural networks (ANN) is presented. A pulse signal generator is controlled by an ANN to improve stability, robustness and accuracy of the model. A simple and effective way to obtain necessary data for learning the artificial neural network used in EMI modelling is presented. The methodology described in this paper ensures a simple, fast and accurate modelling. As a test case, the EMI model of conducted interference of a simple local interconnect network (LIN) interface circuit is presented.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132999513","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
A Combined Stencil-Adjustable Time-Domain/FETD Method for Electrically-Large EMC Structures 电大电磁兼容结构的模板-可调时域/FETD组合方法
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783398
N. Kantartzis, C. Antonopoulos, T. Tsiboukis
{"title":"A Combined Stencil-Adjustable Time-Domain/FETD Method for Electrically-Large EMC Structures","authors":"N. Kantartzis, C. Antonopoulos, T. Tsiboukis","doi":"10.1109/EMCZUR.2009.4783398","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783398","url":null,"abstract":"The consistent and cost-effective modeling of large-scale EMC structures, is presented in this paper via a novel parametric hybrid method. The proposed scheme blends a stencil-optimized time-domain algorithm in curvilinear coordinates and a modified finite-element time-domain approach to divide the problem into smaller flexible regions. Constructing a class of curvilinear 3-D operators, the framework assigns weights to each spatial increment and approximates spatial derivatives through interpolating polynomials. An important asset is that the two techniques are updated independently and interconnected by versatile boundary conditions. Numerical results from different realistic EMC setups verify our method and reveal its universal applicability.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"519 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134350494","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Comparing Cable Discharge Events to IEC 61000-4-2 or ISO 10605 Discharges 比较电缆放电事件与IEC 61000-4-2或ISO 10605放电
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783414
Bastian Arndt, F. Nieden, Rainer Pohmerer, J. Edenhofer, S. Frei
{"title":"Comparing Cable Discharge Events to IEC 61000-4-2 or ISO 10605 Discharges","authors":"Bastian Arndt, F. Nieden, Rainer Pohmerer, J. Edenhofer, S. Frei","doi":"10.1109/EMCZUR.2009.4783414","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783414","url":null,"abstract":"Cable Model (CM) discharge events can cause serious ESD damages. Especially during the automotive production process, when numerous cables are connected to electronic devices. Here exists a potential risk for electronic devices. Typical cable discharges occurring in the automotive production environment are investigated and characterized. Possible charging effects of the wiring harness were identified. Discharge shapes depending on automotive wiring harness configurations were classified. Modelling of the cable parameters was done and cable discharge events were simulated. The simulation results were verified with measurements. Possible impacts on affected electronic control units were identified and a comparison between ISO/IEC electrostatic discharges and cable discharges was drawn.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"127 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133425530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Susceptibility of PMOS Transistors under High RF Excitations at Source Pin 源引脚高射频激励下PMOS晶体管的磁化率
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783475
Ognjen Jović, U. Stuermer, W. Wilkening, C. Maier, A. Barić
{"title":"Susceptibility of PMOS Transistors under High RF Excitations at Source Pin","authors":"Ognjen Jović, U. Stuermer, W. Wilkening, C. Maier, A. Barić","doi":"10.1109/EMCZUR.2009.4783475","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783475","url":null,"abstract":"This work analyses the operation point shift of PMOS transistors at high electromagnetic interference levels. These devices are typically connected to supply rails of integrated circuits. In this configuration their source connections are subjected to RF disturbances. We provide measurement and simulation results of such interferences and their effects. The results reveal a complex behaviour at low frequencies when the power level is varied. This behaviour is caused by both non-linear characteristics of the intrinsic PMOS transistor and the turn-on of the parasitic drain-bulk diode at higher power levels. It is relevant up to RF frequencies of several hundred MHz.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129384896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Electromagnetic Emission of Pulsed Plasma Thrusters 脉冲等离子体推力器的电磁发射
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783380
A. Plokhikh, N. Antropov, N. Vazhenin, G. Popov, G. Shishkin, G. Soganova
{"title":"Electromagnetic Emission of Pulsed Plasma Thrusters","authors":"A. Plokhikh, N. Antropov, N. Vazhenin, G. Popov, G. Shishkin, G. Soganova","doi":"10.1109/EMCZUR.2009.4783380","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783380","url":null,"abstract":"This paper deals with the measurement of characteristics of electromagnetic emission of electric propulsions as applied to the EMC problems. Electric propulsion systems on the basis of pulsed plasma thrusters, which are used for the orbit correction of small satellites, are considered as the sources of unintended noise of artificial origin. Test results for the spectral characteristics of emission for the PPT model with the discharge energy of 50 J obtained under ground conditions and their discussion are presented in this paper.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121891736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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