Modelling of Electromagnetic Immunity of Integrated Circuits by Artificial Neural Networks

Abstract

A simple and efficient method of modelling electromagnetic immunity (EMI) of integrated circuits (IC) with respect to conducted electromagnetic interference by using artificial neural networks (ANN) is presented. A pulse signal generator is controlled by an ANN to improve stability, robustness and accuracy of the model. A simple and effective way to obtain necessary data for learning the artificial neural network used in EMI modelling is presented. The methodology described in this paper ensures a simple, fast and accurate modelling. As a test case, the EMI model of conducted interference of a simple local interconnect network (LIN) interface circuit is presented.