Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI)最新文献_第4页

Reconfigurable fault tolerant binary tree-implementation in two-dimensional arrays and reliability analysis 二维阵列中可重构容错二叉树的实现与可靠性分析

Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI) Pub Date : 1994-01-19 DOI: 10.1109/ICWSI.1994.291258

I. Takanami, K. Inoue, T. Watanabe

{"title":"Reconfigurable fault tolerant binary tree-implementation in two-dimensional arrays and reliability analysis","authors":"I. Takanami, K. Inoue, T. Watanabe","doi":"10.1109/ICWSI.1994.291258","DOIUrl":"https://doi.org/10.1109/ICWSI.1994.291258","url":null,"abstract":"We propose a reconfiguration scheme of repairing faulty processors where processors on each level of a binary tree are considered to be a linear array In which spare processors are inserted at regular intervals. The switching networks for compensation are regular and comparatively simple. The logic circuits are simple and their switchings for repair are done autonomously. We give a method of embedding the proposed tree architectures into two-dimensional arrays for WSI implementations. The method embeds the PE's from the root to a certain level L/sub 0/ into a rectangular array, which is called a root module. For levels L(>L/sub 0/), the linear array on each level is partitioned into subarrays. Such subarrays are called level modules. A binary tree-connected computer with a specified height is constructed by embedding these modules into two-dimensional arrays. Next, for the proposed scheme. We derive the necessary and sufficient condition for reconfigurability. Using the result, we obtain a formula for computing system's reliability. The reliabilities of our systems are compared with those of several systems already known, and the effectiveness of our systems is shown.<<ETX>>","PeriodicalId":183733,"journal":{"name":"Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-01-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124605843","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Optimal chip sizing for hybrid-WSI 混合wsi的最佳芯片尺寸

Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI) Pub Date : 1994-01-19 DOI: 10.1109/ICWSI.1994.291231

P. Singh, D. Landis

引用次数: 2

Quasi-analytical analysis of the broadband properties of multiconductor transmission lines on semiconducting substrates 半导体基板上多导体传输线宽带特性的准解析分析

Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI) Pub Date : 1994-01-19 DOI: 10.1109/ICWSI.1994.291230

E. Groteluschen, L. S. Dutta, S. Zaage

引用次数: 56

WSI evolution: increasing cell size to generalize designs WSI进化:增加单元尺寸以推广设计

Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI) Pub Date : 1994-01-19 DOI: 10.1109/ICWSI.1994.291255

S. Millman

引用次数: 2

What designers of wafer scale systems should know about local sparing 晶圆规模系统的设计者应该知道什么是局部节约

Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI) Pub Date : 1994-01-19 DOI: 10.1109/ICWSI.1994.291259

L. LaForge

{"title":"What designers of wafer scale systems should know about local sparing","authors":"L. LaForge","doi":"10.1109/ICWSI.1994.291259","DOIUrl":"https://doi.org/10.1109/ICWSI.1994.291259","url":null,"abstract":"Local sparing is a simple way to organize the redundancy of a fault tolerant system. Any system can be locally spared. Furthermore, local sparing preserves both regularity and planarity. In spite of this, the potential usefulness of local sparing appears to have been overlooked. Suppose that the designer wishes to assure, with high probability, a fault-free copy of the n-element system desired. If local sparing is used then, as proved, i) the resulting area is /spl Theta/(log n) times the area of the system desired; ii) the wire length is /spl Oscr/(/spl radic/(log n)) times the maximum wirelength in the desired system; iii) an optimal diagnosis algorithm identifies the faulty elements in /spl Theta/(n log/sup 2/ n) time; iv) in optimal time /spl Theta/(n log n+number of wires in the desired system), a simple configuration algorithm achieves a fault-free copy of the desired system if and only if a fault-free copy exists. The authors illustrate these results for arrays, binary trees, and hypercubes. In addition, v) if Y denotes the probability of achieving a fault-free copy of the system desired then, using h-fold redundancy, the maximum rate at which elements can fail is ((/spl minus/ln Y)/n)/sup 1/h/. Local sparing is simple, widely-applicable, and low-cost. A disadvantage is that, depending on the system desired, the cost may not be optimal. However, there is strong reason to prefer local sparing over global sparing, and in some cases local sparing is better than more popular approaches to configuration.<<ETX>>","PeriodicalId":183733,"journal":{"name":"Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-01-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133285241","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 11

Progress and status of the WASP3 WSI massively parallel processor WASP3 WSI大规模并行处理器的研究进展与现状

Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI) Pub Date : 1994-01-19 DOI: 10.1109/ICWSI.1994.291236

I. Jalowiecki

引用次数: 2

Comparison of laser link crossbar and Omega network switching for wafer-scale integration defect avoidance 用于晶圆级集成缺陷避免的激光链路横杆与Omega网络交换的比较

Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI) Pub Date : 1994-01-19 DOI: 10.1109/ICWSI.1994.291238

G. H. Chapman, K. Fang

引用次数: 7