{"title":"WSI evolution: increasing cell size to generalize designs","authors":"S. Millman","doi":"10.1109/ICWSI.1994.291255","DOIUrl":null,"url":null,"abstract":"The current state of the art of wafer-scale integration is explored in this paper. Problems which must be solved to generalize the applicability of products using wafer-scale integration are also discussed. The goal of this paper is to provide a framework for discussion on the future of wafer-scale integration, as well as to provide topics for future research.<<ETX>>","PeriodicalId":183733,"journal":{"name":"Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-01-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICWSI.1994.291255","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The current state of the art of wafer-scale integration is explored in this paper. Problems which must be solved to generalize the applicability of products using wafer-scale integration are also discussed. The goal of this paper is to provide a framework for discussion on the future of wafer-scale integration, as well as to provide topics for future research.<>