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Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)最新文献

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Field emission properties from double walled carbon nanotubes produced by a catalytic CVD 催化气相沉积法制备双壁碳纳米管的场发射特性
Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1354898
T. Lee, S. Choi, S. Seo, S. Lee, S.I. Jung, C.J. Lee
{"title":"Field emission properties from double walled carbon nanotubes produced by a catalytic CVD","authors":"T. Lee, S. Choi, S. Seo, S. Lee, S.I. Jung, C.J. Lee","doi":"10.1109/IVNC.2004.1354898","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354898","url":null,"abstract":"High quality DWNTs (double-walled carbon nanotubes) was produced by a catalytic CVD. The field emission was measured using parallel-plate geometry with a gap distance of 270 /spl sim/ 370 /spl mu/m under a 2 /spl times/ 10/sup -7 /Torr. The turn-on electric field of DWNTs was about 1.7 /spl sim/ 3.5 V//spl mu/m at /spl sim/ 1.0 /spl times/ 10/sup -7/ mA/cm/sup 2/ and the current density of DWNTs was about /spl sim/ 20mA/cm/sup 2/ at the applied electric field of /spl sim/ 8V//spl mu/m. The lifetime indicated good stability for 20 hours when constant DC voltage applied at high current density of /spl sim/ 1.0 /spl times/ 10/sup -3/ A/cm/sup 2/.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116745204","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
High intensity pulse X-ray generation by using graphite-nanocrater cold cathode 石墨纳米晶冷阴极产生高强度脉冲x射线
Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1116/1.1854692
T. Matsumoto, H. Mimura
{"title":"High intensity pulse X-ray generation by using graphite-nanocrater cold cathode","authors":"T. Matsumoto, H. Mimura","doi":"10.1116/1.1854692","DOIUrl":"https://doi.org/10.1116/1.1854692","url":null,"abstract":"A new nanometer-sized tailored cathode is fabricated by hydrogen plasma etching of a graphite substrates. SEM was used to characterize the graphite surface before and after etching. Based on the correlation between the field emission characteristics and surface morphology, the nanometer-sized crater structures play an important role in the field emission behavior of the graphite nanocrater cathode (GRANC). The field emission characteristics of GRANC was compared with CNT and graphite nanofibers. Finally, the performance of GRANC as a cold cathode is demonstrated by obtaining high intensity pulse x-ray generation. The single shot x-ray radiography image of a rotating chopper are shown by using the x-ray pulses. This cold cathode is not only promising for pulse x-ray generation but also for the fabrication of sophisticated devices which require stable high current density operation.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114612153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Physical considerations of operating and characteristics modeling of nanostructural field emission devices 纳米结构场发射器件的操作和特性建模的物理考虑
Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1354910
N. I. Tatarenko, A. Vorobyev
{"title":"Physical considerations of operating and characteristics modeling of nanostructural field emission devices","authors":"N. I. Tatarenko, A. Vorobyev","doi":"10.1109/IVNC.2004.1354910","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354910","url":null,"abstract":"In this paper, the characteristics of nanostructural field emission devices (FEDs) are determined based on a basic model that is a field emission triode cell which has more complicated structure compared with a diode. The basic elements of a field emission triode cell was characterized using the following parameters; conductor elements, dielectric elements, the boundary of a field emission triode cell, and an electron gas region or vacuum region. Physical processes was described by means of the fundamental equations of Maxwell, Fowler-Nordheim and hydrodynamical equations describing the behaviour of electron gas.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"155 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114645966","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
One of perspective directions of creation of highly effective field emission microdevices and microdisplays 高效场发射微器件和微显示器的研究方向之一
Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1354935
N. Mukhurov, S. Zhdanok, I. Gasenkova, F.V. Plevako
{"title":"One of perspective directions of creation of highly effective field emission microdevices and microdisplays","authors":"N. Mukhurov, S. Zhdanok, I. Gasenkova, F.V. Plevako","doi":"10.1109/IVNC.2004.1354935","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354935","url":null,"abstract":"The paper is a suggested approach to the construction of vacuum triode type microdevices on field emitter (FE) matrix cathodes and anodes for flat cathode ray tube microdisplays based on alumina technology combined with nanocarbon diamondlike materials. Modeling of triode systems with FE from carbonlike thick films and separate controlling structures on 3D-AA substrates showed high efficiency.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127550468","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Desorption/ionization mass spectrometry on array of silicon micro tips 硅微针尖阵列的解吸/电离质谱分析
Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1116/1.1861046
A. Gorecka-Drzazga, J. Dziuban, W. Drzazga, A. Kraj, J. Silberring
{"title":"Desorption/ionization mass spectrometry on array of silicon micro tips","authors":"A. Gorecka-Drzazga, J. Dziuban, W. Drzazga, A. Kraj, J. Silberring","doi":"10.1116/1.1861046","DOIUrl":"https://doi.org/10.1116/1.1861046","url":null,"abstract":"We have shown that a sample of bio-species deposited onto the spot of the array of protruded metal gated silicon tips (DIOST) may be effectively ionized and evaporated by UV laser pulsed light illumination. This phenomenon has been never observed on flat surface of silicon dioxide or TiW-Au thin film layers the materials which were used in construction of the tips array. Nature of this process is not known; the most intriguing fact is the protonization as well as negative electron ionization of bio-samples. The new DIOST platform was used for TOF MS tests, and clearly readable, low-noised mass spectrograms of LGG and dopamine were observed.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"1 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126542796","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Field emission properties of defect-removed single-walled carbon nanotubes 去缺陷单壁碳纳米管的场发射特性
Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1354908
Seungkwang Roh, Jiyoung Jang, Jihoon Oh, Y. Choi, W. Yi
{"title":"Field emission properties of defect-removed single-walled carbon nanotubes","authors":"Seungkwang Roh, Jiyoung Jang, Jihoon Oh, Y. Choi, W. Yi","doi":"10.1109/IVNC.2004.1354908","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354908","url":null,"abstract":"Defect-free single-walled nanotubes (SWNTs) were prepared by chemical reaction from normal SWNTs, and field emission and dispersion properties of both were compared. The field emission currents of defect-removed SWNTs are measured as a function of the number of defects, i.e., reaction time with methyl acrylate. As the defects are removed from surface of nanotubes, the SWNTs become entangled and more separated between themselves, thus the separated SWNTs have the higher aspect-ratio than the pristine SWNTs. Consequently the SWNTs having the small number of defects show the higher field emission currents. It was also shown in the UV absorption spectra of the samples in ethanol in the field emission experiment, that the more defect-removed SWNTs are better dispersed in the solvent.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123513369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Transistor characteristics of thermal CVD carbon nanotubes field emission triode 热CVD碳纳米管场致发射三极管的晶体管特性
Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1355016
Y. Wong, W. Kang, J. Davidson, W. Hofmeister, S. Wei, J.H. Huang
{"title":"Transistor characteristics of thermal CVD carbon nanotubes field emission triode","authors":"Y. Wong, W. Kang, J. Davidson, W. Hofmeister, S. Wei, J.H. Huang","doi":"10.1109/IVNC.2004.1355016","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1355016","url":null,"abstract":"In this paper, the study of thermal CVD grown CNT field emitters in a triode amplifier configuration is reported. The DC characteristics of the CNT triode are investigated, including I/sub a/ vs. V/sub a/ for different V/sub g/. Moreover, DC parameters such as transconductance, amplification factor and anode resistance of the triode amplifier are determined. It was shown that a higher amplification factor can be achieved with optimum gate-anode-cathode spacing such that the cathode is effectively shielded from the anode by the gate but the anode still collects all electrons emitted from the cathode. High emission current at low gate voltage is key to achieving high transconductance. This can be obtained by optimum configuration of high-density CNTs array in a triode structure with a common gate.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120879406","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Method and structure for local emission regulation and arc prevention in field emitter arrays 场射极阵列局部发射调节和防弧方法及结构
Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1116/1.1849191
J. Shaw, D. Hsu
{"title":"Method and structure for local emission regulation and arc prevention in field emitter arrays","authors":"J. Shaw, D. Hsu","doi":"10.1116/1.1849191","DOIUrl":"https://doi.org/10.1116/1.1849191","url":null,"abstract":"We propose an alternative arc-prevention and emission regulation method that allows high current densities and enforces a narrow energy distribution. The method requires a structure incorporating a filter aperture over the usual gate aperture. The top aperture acts as a high-pass energy filter. When the filter is negative with respect to the gate, a potential energy barrier is created in the path of the emitted electrons. Also, the energy distribution often becomes narrower and shifts closer to E/sub F/ after operating the emitters in UHV. The energy shift shows that the potential drop in the emitter is reduced, suggesting that the dielectric surface layer has become more conductive and/or thinner.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"38 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121478934","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Ion-beam morphological conditioning of carbon field emission cathode surfaces 碳场发射阴极表面离子束形态调理
Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1116/1.1880052
C. Hunt, A. Chakhovskoi, Yu Wang
{"title":"Ion-beam morphological conditioning of carbon field emission cathode surfaces","authors":"C. Hunt, A. Chakhovskoi, Yu Wang","doi":"10.1116/1.1880052","DOIUrl":"https://doi.org/10.1116/1.1880052","url":null,"abstract":"Square-cm samples of bulk graphite, reticulated vitreous carbon, and paste graphite film have been evaluated for field-emission properties both before and after surface modification using a novel Ar-ion flood bombardment method. The Ar-ion treatment results in a change in surface morphology of the emission cathode which physically resembles results of emission treatments using lasers or other heat sources, as well as results obtained using current or voltage stress treatment methods. Emission properties become more uniform, exhibit less noise, and, in the best cases, match results seen from carbon nanotubes or ultra-nanocrystalline diamond cathodes. The results demonstrate a method for obtaining large total currents at optimal extraction voltages, from large-area, low-cost cathodes. This method is useful for applications, such as field-emission lamps and x-ray tubes, which do not require nanofabricated cathode structures.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128226672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Optimization of electron beam focusing for CNT-FEDs cnt - fed电子束聚焦优化
Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1354884
J. Choi, A. Zoulkarneev, Y. Jin, Young Jun Park, D. Chung, B. K. Song, I. Han, Ha Jin Kim, H. Lee, S. H. Park, H. Kang, Mun Jin Shin, Ha Jong Kim, K. Min, Jung Woo Kim, J. Jung, J. M. Kim
{"title":"Optimization of electron beam focusing for CNT-FEDs","authors":"J. Choi, A. Zoulkarneev, Y. Jin, Young Jun Park, D. Chung, B. K. Song, I. Han, Ha Jin Kim, H. Lee, S. H. Park, H. Kang, Mun Jin Shin, Ha Jong Kim, K. Min, Jung Woo Kim, J. Jung, J. M. Kim","doi":"10.1109/IVNC.2004.1354884","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354884","url":null,"abstract":"An electron beam focusing was optimized to obtain high color purity in 38\" high definition level carbon nanotube-field emission devices (CNT-FEDs). We could successfully adopted the focusing structure where each CNT dot is aligned to a gate and a focus gate hole, which results in electric field symmetry and makes it easy to focus electron beam. The structure also has a concave geometry. By varying the sizes of the focus gate hole, the optimum I-V conditions are obtained. The fine electron beam focusing even under wide e-beam divergence of CNTs could be achieved.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131190005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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