Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)最新文献_第6页

Seppen-Katamuki analysis of electron emission from chemical vapor deposited multiwall carbon nanotubes with and without laser irradiation 激光辐照前后化学气相沉积多壁碳纳米管电子发射的Seppen-Katamuki分析

Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1354889

Y. Gotoh, Y. Kawamura, K. Ishizu, H. Tsuji, J. Ishikawa, S. Nakata, S. Okuda

引用次数: 1

Study of the driving performances with different structures of field emission displays 场致发射显示器不同结构驱动性能的研究

Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1354915

Zhang Yuning, Lei Wei, Zhang Xiaobing, Liu Ao, Zong Geng, M. Xiaoyan, W. Qilong

引用次数: 0

Field emission-from arrays of free-standing carbon nanotubes grown by ICP-CVD 由ICP-CVD生长的独立碳纳米管阵列的场发射

Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1354911

S. Tseng, S. Tsai, B. Yao, Y.K. Lee, K. Leou, C. Tsai

{"title":"Field emission-from arrays of free-standing carbon nanotubes grown by ICP-CVD","authors":"S. Tseng, S. Tsai, B. Yao, Y.K. Lee, K. Leou, C. Tsai","doi":"10.1109/IVNC.2004.1354911","DOIUrl":"https://doi.org/10.1109/IVNC.2004.1354911","url":null,"abstract":"Carbon nanotubes (CNTs) have been considered as a prime candidate material of cold cathode emitter for field emission (FE) application. No matter whether the cathode assembly is fabricated by screen printing or in-situ chemical vapor deposition (CVD), the strict requirement of high emission uniformity on a large area display panel still remains a great challenge. There have been a large amount of publications demonstrating the ability of growing large area patterned well-aligned multi-walled carbon nanotubes with uniform diameter and height by thermal CVD. The field emission performance however was hampered due to high carbon nanotube density (> 10/sup 8/ cm/sup -2/) and low emission density (/spl sim/10/sup 4/ cm/sup -2/), which is not attributed solely to the electrical field screening effect. In this report, we used electron beam lithography (EBL) followed by metal deposition/lift-off to define the position and size of nickel catalyst and grew CNTs using inductively-coupled plasma (ICP) CVD. The EBL has been proven to be a straight forward method to define an array of catalyst metal dots with designated size and inter-distance. The ICP-CVD has been shown to grow free-standing vertically-aligned CNTs with uniform diameter and height. And then a gripper-type nano-object manipulation assembly inside a scanning electron microscope (SEM) was utilized to measure the field emission from individual carbon nanotube.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133520640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Preparation of aligned Cu/sub 2/S nanowire arrays and their field emission properties Cu/sub /S纳米线阵列的制备及其场发射性能

Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1354951

Q.B. Wu, S. Ren, S. Deng, Jun Chen, N. Xu

引用次数: 0

Double-gated silicon field emission arrays: fabrication and characterization 双门控硅场发射阵列:制造与表征

Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1354971

L. Chen, A. Akinwande

引用次数: 1

Influence of image force potential on the shot noise properties of field emitters 像力势对场发射体散粒噪声特性的影响

Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1354907

K. Rangaswamy, M. Cahay, K. Jensen

引用次数: 5

Field emission from teepee-shaped carbon nanotube bundles 锥形碳纳米管束的场发射

Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1116/1.1885009

H. Busta, Z. Toit, J. Montgomery, A. Feinerman

引用次数: 5

Field emission properties of selectively grown carbon nanotubes for electron emitters in microwave power amplifier 微波功率放大器中选择性生长碳纳米管电子发射体的场发射特性

Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1354890

Jae-Hee Han, S. Lee, A. Berdinsky, J. Yoo, Chong-Yun Park, J. J. Choi, T. Jung, I. Han, J. M. Kim

引用次数: 0

Calculations of enhanced field electron emission at the triple junction 三结处增强场电子发射的计算

Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1109/IVNC.2004.1354962

M. Chung, T. S. Choi, P. H. Cutler, N. Miskovsky

引用次数: 1

Ring-shaped images as a result of non-uniform field emission from capped carbon nanotubes 碳纳米管非均匀场发射的环形图像

Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Pub Date : 2004-07-11 DOI: 10.1116/1.1864059

L. Filip, D. Nicolaescu, S. Kanemaru, J. Itoh

{"title":"Ring-shaped images as a result of non-uniform field emission from capped carbon nanotubes","authors":"L. Filip, D. Nicolaescu, S. Kanemaru, J. Itoh","doi":"10.1116/1.1864059","DOIUrl":"https://doi.org/10.1116/1.1864059","url":null,"abstract":"Ring-shaped images may appear under high field emission conditions for very thin carbon nanotubes (CNTs). Such image patterns cannot be explained by the corresponding field enhancement only. A model for electron field emission from the CNT is developed. The model refers to a capped nanotube (with cylindrical body and hemispherical cap). It is assumed that for high emission currents/high local temperatures, part of the electrons behave as quasi-free. As a result, the spatial confinement quantization of their states appears. The Schrodinger equation for the single electron can be solved separately on the cylindrical and spherical parts of the structure and the corresponding solutions can be connected smoothly at the circular intersection of the two regions. Many electronic states that are possible on the two regions separately turn out to be forbidden for the capped nanotube. The selection of the possible electronic states under the aforementioned complex conditions is determined by the geometric parameters of the tube, namely the ratio between its length and diameter. The occupation of the allowed one- electron states is considered as governed by the usual Fermi statistics. Together with the quantum probability of finding an electron in some specified area of the surface, this gives the electron distribution on the tube, which is one of the key factors determining the electron field emission from the CNT. Another key factor is the applied extraction field. The extraction field has been numerically computed using Simion nanotube-on-post diode configuration.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121074270","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 9