{"title":"场射极阵列局部发射调节和防弧方法及结构","authors":"J. Shaw, D. Hsu","doi":"10.1116/1.1849191","DOIUrl":null,"url":null,"abstract":"We propose an alternative arc-prevention and emission regulation method that allows high current densities and enforces a narrow energy distribution. The method requires a structure incorporating a filter aperture over the usual gate aperture. The top aperture acts as a high-pass energy filter. When the filter is negative with respect to the gate, a potential energy barrier is created in the path of the emitted electrons. Also, the energy distribution often becomes narrower and shifts closer to E/sub F/ after operating the emitters in UHV. The energy shift shows that the potential drop in the emitter is reduced, suggesting that the dielectric surface layer has become more conductive and/or thinner.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"38 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Method and structure for local emission regulation and arc prevention in field emitter arrays\",\"authors\":\"J. Shaw, D. Hsu\",\"doi\":\"10.1116/1.1849191\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose an alternative arc-prevention and emission regulation method that allows high current densities and enforces a narrow energy distribution. The method requires a structure incorporating a filter aperture over the usual gate aperture. The top aperture acts as a high-pass energy filter. When the filter is negative with respect to the gate, a potential energy barrier is created in the path of the emitted electrons. Also, the energy distribution often becomes narrower and shifts closer to E/sub F/ after operating the emitters in UHV. The energy shift shows that the potential drop in the emitter is reduced, suggesting that the dielectric surface layer has become more conductive and/or thinner.\",\"PeriodicalId\":137345,\"journal\":{\"name\":\"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)\",\"volume\":\"38 3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-07-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1116/1.1849191\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1116/1.1849191","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Method and structure for local emission regulation and arc prevention in field emitter arrays
We propose an alternative arc-prevention and emission regulation method that allows high current densities and enforces a narrow energy distribution. The method requires a structure incorporating a filter aperture over the usual gate aperture. The top aperture acts as a high-pass energy filter. When the filter is negative with respect to the gate, a potential energy barrier is created in the path of the emitted electrons. Also, the energy distribution often becomes narrower and shifts closer to E/sub F/ after operating the emitters in UHV. The energy shift shows that the potential drop in the emitter is reduced, suggesting that the dielectric surface layer has become more conductive and/or thinner.