{"title":"ScaDA-Rou: A Scalable, Deadlock-Free, and Adaptive Routing for 3-D Multi-Chiplet System","authors":"Lijing Zhu;Huaxi Gu;Yun Tan;Guangming Zhang","doi":"10.1109/TCSII.2026.3659753","DOIUrl":"https://doi.org/10.1109/TCSII.2026.3659753","url":null,"abstract":"With the rapid advancement of high-performance computing and AI applications, the demand for computational power has escalated dramatically. Chiplet technology has emerged as a pivotal solution to meet increasingly complex computational requirements. Three-dimension integration technology has further enabled three-dimensional chiplet systems to achieve high-density computing, offering substantial computational capabilities. However, combining several chiplets into a single system-on-chip (SoC) presents serious deadlock concerns between processor units and chiplets. To address this challenge, this brief presents ScaDA-Rou, a scalable, deadlock-free, and adaptive routing algorithm specifically designed for 3D chiplet systems. ScaDA-Rou combines the turn model with virtual network partitioning to efficiently avoid deadlocks while optimizing network performance. In-plane deadlocks are avoided by setting turn restrictions in the routers. In addition, deadlocks among different planes are avoided by separating the virtual channels used for the source and destination planes of the cross-plane packets. The benchmark results demonstrate that ScaDA-Rou achieves, on average, performance improvement of 89.2% in latency under various synthetic traffic and system sizes. Moreover, with several real application trace scenarios, ScaDA-Rou achieves higher performance compared with traditional routing algorithms.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"73 4","pages":"433-437"},"PeriodicalIF":4.6,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148506694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Amir Aghajani;Mohammad Makhdoumi Akram;Reza Bostani;Ahmad Hassan;Benoit Gosselin
{"title":"A 1.2-ns Delay Level Shifter Circuit Using Multiple Fast Charging, Discharging, and Feed-Forward Paths","authors":"Amir Aghajani;Mohammad Makhdoumi Akram;Reza Bostani;Ahmad Hassan;Benoit Gosselin","doi":"10.1109/TCSII.2026.3667894","DOIUrl":"https://doi.org/10.1109/TCSII.2026.3667894","url":null,"abstract":"This brief presents a new high-speed, low-power level shifter circuit capable of converting low-voltage input pulses to high-voltage output pulses with minimal propagation delay and dynamic power consumption. The proposed architecture leverages fast feed-forward, charging and discharging paths to enhance speed and energy efficiency, making it suitable for high-performance and high-speed applications such as system-on-chip (SoCs), high-speed memories, and FPGAs. Implemented in 130 nm TSMC CMOS technology, the circuit supports input voltages ranging from 200 mV to 0.8 V and converts them to a 1.2 V output. It achieves propagation delays of 1.19 ns and 0.34 ns for input voltages of 0.3 V and 0.4 V, respectively. The level shifter exhibits low energy consumption, with average energy per transition measured at 16.22 fJ and 14.92 fJ for 0.3 V and 0.4 V inputs, respectively. The total silicon area of the circuit is <inline-formula> <tex-math>$49.4~mu $ </tex-math></inline-formula>m<sup>2</sup>. We show that the presented design outperforms recent solutions.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"73 4","pages":"393-397"},"PeriodicalIF":4.6,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148505519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 12-bit 200-MS/s SAR ADC With Capacitor-Reuse-Based Redundant Weighting Technique","authors":"Angyang Li;Yi Shen;Anji Huang;Shubin Liu;Ruixue Ding;Zhangming Zhu","doi":"10.1109/TCSII.2026.3669414","DOIUrl":"https://doi.org/10.1109/TCSII.2026.3669414","url":null,"abstract":"This work presents a capacitor-reuse-based redundant weighting (CRRW) technique to realize the redundancy for successive approximation register analog-to-digital converters (SAR ADCs). By reusing the capacitors which have been switched in the previous comparison cycles, it avoids introducing extra compensative capacitors. Moreover, it can skip the redundant-bit cycles in certain situations, thus reducing power dissipation. To verify the proposed technique, a prototype 12-bit 200-MS/s SAR ADC with only a 5-pF reference decoupling capacitor was fabricated using a 28-nm CMOS process. The proposed CRRW technique can effectively address the reference settling error. With the proposed technique, the signal-to-noise and distortion ratio (SNDR) can be improved by 5.6 dB and the worst case integrated non-linearity (INL)/differential non-linearity (DNL) can be reduced by 10 times. Overall, the ADC achieves an SNDR of 59.8 dB with only a 5-pF reference decoupling capacitor.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"73 4","pages":"423-427"},"PeriodicalIF":4.6,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148505675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Lin Yang;Shihua Liu;Xingyuan Fu;Ming Zhang;Baozhu Wang;Qi Han;YuHang He;Weimin Hou
{"title":"A High Efficiency Doherty Power Amplifier MMIC With Active Second Harmonic Injection Technique","authors":"Lin Yang;Shihua Liu;Xingyuan Fu;Ming Zhang;Baozhu Wang;Qi Han;YuHang He;Weimin Hou","doi":"10.1109/TCSII.2026.3663733","DOIUrl":"https://doi.org/10.1109/TCSII.2026.3663733","url":null,"abstract":"In this brief, a novel design methodology for Doherty power amplifier (DPA) MMIC is proposed to improve the efficiency of the DPAs. The design equations of a compact harmonic-controlled bias network (CHCBN) are derived, which can achieve inverse class-F amplifier load conditions with adjustable fundamental frequency impedance, this approach effectively improves the saturated and back-off efficiency of the DPA. An active second harmonic injection network (HIN) is proposed which utilizes the second harmonic components generated by the carrier and peaking devices for mutual injection to achieve the amplitude modulation of the DPA drain waveform in the saturated state, further improving the saturated efficiency of the DPA. To validate the methodology, a C-band high efficiency DPA MMIC is designed and fabricated in a <inline-formula> <tex-math>$0.25~mu $ </tex-math></inline-formula>m GaN-HEMT process. The measurement results show that the fabricated DPA exhibits the saturated output power (Psat) of 39.6 dBm–40.6 dBm, with a saturated drain efficiency (DE) of 53.9%–61.5%, and a 6-dB back-off DE of 51.4%–56.0% over the 4.8-5.4 GHz frequency band. The proposed DPA demonstrates the highest 6-dB back-off efficiency among the published broadband GaN MMIC DPAs operating in similar frequency band.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"73 4","pages":"443-447"},"PeriodicalIF":4.6,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148506570","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Comprehensive High-to-Low Delay Model for NCFET Circuits","authors":"Ananda Sankar Chakraborty;Ali M. Niknejad","doi":"10.1109/TCSII.2026.3665021","DOIUrl":"https://doi.org/10.1109/TCSII.2026.3665021","url":null,"abstract":"In this work, we present a comprehensive high-to-low propagation delay model for NCFET based circuits–which is also fully compatible with any baseline Si-MOSFET. The proposed physics-based analytical delay model is quick to converge, portable, covers all regions of operation, and is technology independent. The model is successfully validated against the 90nm Berkeley NCFET measurement data as well as different commercial MOSFET Process Design Kit (PDK)–under variable device dimensions, supply voltage, external load and temperature.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"73 4","pages":"463-467"},"PeriodicalIF":4.6,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148507219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 47-nA Quiescent Current Dual-Mode Buck Converter With Fast Load Transient Response From Ultra-Light Load Mode","authors":"Dongxu Li;Yanqi Zheng;Xian Tang","doi":"10.1109/TCSII.2026.3668052","DOIUrl":"https://doi.org/10.1109/TCSII.2026.3668052","url":null,"abstract":"This brief proposes a dual-mode ultra-low quiescent current buck converter that achieves high efficiency over a wide load range. The system employs adaptive on-time control (AOT) for heavy load and adaptive clock control (ACC) for light load. To enhance transient performance under light load, a fast clock frequency locking (FCFL) circuit is proposed to enable quick load tracking with simple digital logic. Additionally, a nA low-power load step transient enhancement (LSTE) circuit is presented, effectively reducing overshoot and undershoot during load transients. The converter is implemented in a <inline-formula> <tex-math>$0.18~mu $ </tex-math></inline-formula>m process and operates with an input voltage of 2.4 V to 3.3 V and an output of 1.6 V. The load current ranges from 500 nA to 300 mA. The total quiescent current is 47 nA contributed to ACC digital control and it achieves 87% efficiency at <inline-formula> <tex-math>$1~mu $ </tex-math></inline-formula>A load current, with a peak efficiency of 95.9% at 2.4V input. It achieves an undershoot voltage of 60 mV with recovery time of <inline-formula> <tex-math>$6~mu $ </tex-math></inline-formula>s when load current switching from <inline-formula> <tex-math>$100~mu $ </tex-math></inline-formula>A to 100 mA.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"73 4","pages":"398-402"},"PeriodicalIF":4.6,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148507499","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Han Wu;Zheyu Yu;Zhihao Liu;Hui Chen;Cheng Ma;Shaobo Qu;Yanzheng Bai;Zebing Zhou
{"title":"Suppression of Low-Frequency Noise From Diode Forward Voltage Based on Chopper Stabilization in a Charge-Discharge Capacitive Sensing Circuit","authors":"Han Wu;Zheyu Yu;Zhihao Liu;Hui Chen;Cheng Ma;Shaobo Qu;Yanzheng Bai;Zebing Zhou","doi":"10.1109/TCSII.2026.3670226","DOIUrl":"https://doi.org/10.1109/TCSII.2026.3670226","url":null,"abstract":"Charge-discharge capacitive sensing circuit has the advantages of high precision, simple structure and low power consumption. However, its low-frequency noise performance is limited by the fluctuations of the forward voltage of the switching diodes in the ring-diode circuit. In this brief, a chopper stabilization circuit is designed by periodically interchanging the positions of the four diodes to suppress the low-frequency noise introduced by the ring-diode circuit. The principle is analyzed and the noise performance is validated. Experimental results show that this method can significantly suppress the low-frequency noise of the sensing circuit. At a carrier frequency of 2.5 MHz, the equivalent capacitance resolution of the sensing circuit at 0.01 Hz is improved from about 1.1 aF/Hz<inline-formula> <tex-math>${}^{mathrm {1/2}}$ </tex-math></inline-formula> to about 0.12 aF/Hz<inline-formula> <tex-math>${}^{mathrm {1/2}}$ </tex-math></inline-formula>. The optimized sensing circuit can promote the application in fields with high requirements for low-frequency performance, such as space inertial sensors and planetary seismometers.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"73 4","pages":"428-432"},"PeriodicalIF":4.6,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148507178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 37–48 GHz Frequency Doubler With >47.8 dBc FRR Utilizing a Staggered Fundamental Suppression Technique","authors":"Yuyang Chen;Chao Yang;Xiaoming Liu;Jing Jin;Jianjun Zhou","doi":"10.1109/TCSII.2026.3660904","DOIUrl":"https://doi.org/10.1109/TCSII.2026.3660904","url":null,"abstract":"This brief presents a 37–48 GHz push-push doubler (PPD) exhibiting excellent harmonic rejection. To address the challenge of wideband fundamental suppression in millimeter-wave PPDs, a staggered fundamental suppression technique is proposed, which integrates a frequency-selective degeneration network with an asymmetric-capacitor-loaded balun. In addition, a split-capacitor-based harmonic nulling scheme is employed to suppress the 4th harmonic. The proposed PPD is fabricated in a 40 nm CMOS process, and measurement results reveal a fundamental rejection ratio (FRR) exceeding 47.8 dBc, a maximum 4th harmonic rejection ratio (HRR) of 46.9 dBc, a peak conversion gain of −0.5 dB, and a peak drain efficiency of 25.1%. Compared to a reference PPD, the proposed PPD exhibits over 12 dB FRR enhancement across the entire bandwidth, demonstrating the effectiveness of the proposed staggered fundamental suppression technique.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"73 4","pages":"353-357"},"PeriodicalIF":4.6,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148507221","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Direct-Capacitance-Conversion FeRAM Characterization Platform for Enabling Non-Destructive 3-D Ferroelectric Capacitor Readout","authors":"Xiongfei Jiang;Chaohan Wang;Yang Xiang;Shiwei Wang;Themis Prodromakis;Marie Garcia Bardon;Jan Van Houdt;Fernando Garcia Redondo;Dwaipayan Biswas","doi":"10.1109/TCSII.2026.3668123","DOIUrl":"https://doi.org/10.1109/TCSII.2026.3668123","url":null,"abstract":"Ferroelectric-capacitor-based memory (FeRAM) is a promising emerging non-volatile memory technology that offers fast access and high endurance. Recent studies have demonstrated Ferroelectric-capacitor-based memory (FeRAM) has the potential to support Non-Destructive Readout (NDRO) as well as 3D stacking, enabling read operations that do not disturb or minor disturb the stored polarization state and higher density. However, variations in ferroelectric materials and layer structures lead to diverse hysteresis behaviors, resulting in different sensing requirements. In addition, the reduced capacitor size in deeply stacked 3D architectures further decreases the available charge, making accurate readout increasingly challenging. To better understand these issues, this work presents a highly scalable direct-capacitance-conversion characterization circuit that is capable of extracting the equivalent ferroelectric capacitance from a 3D FeRAM array. Leveraging a continuous-time delta-sigma modulator (CTDSM), the proposed platform can accurately quantize small ferroelectric equivalent capacitances ranging from 0 to 72fF with low noise and high resolution, and achieves a capacitance resolution of <inline-formula> <tex-math>$0.045mathrm {fF_{rms}}$ </tex-math></inline-formula> while consuming only <inline-formula> <tex-math>$3mu $ </tex-math></inline-formula>W power and occupying 0.001mm<sup>2</sup> chip area under a 22nm FDSOI technology. These results demonstrate the capability to characterize 3D FeRAM arrays with up to 64 vertically stacked ferroelectric capacitors (FeCAPs) and highlight strong scalability for large-scale FeRAM evaluation and design exploration.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"73 4","pages":"403-407"},"PeriodicalIF":4.6,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148507408","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Javier Granizo;Ruben Garvi;Victor Medina;Andres Quintero;Andreas Wiesbauer;Luis Hernandez
{"title":"Compensation Techniques for Frequency and Gain Temperature Drift in Open-Loop VCO-ADCs","authors":"Javier Granizo;Ruben Garvi;Victor Medina;Andres Quintero;Andreas Wiesbauer;Luis Hernandez","doi":"10.1109/TCSII.2026.3666238","DOIUrl":"https://doi.org/10.1109/TCSII.2026.3666238","url":null,"abstract":"This manuscript presents two approaches to improve the temperature effects on ring oscillators used in open-loop VCO-ADCs. The first approach is a circuit design optimization, which is based on an analysis of the ring oscillator against temperature, considering both gain and frequency deviations. It is shown that ring oscillators can be biased in regions with stable frequency or gain. The second technique is an oscillator stabilization circuitry for differential VCO-ADCs. We propose a common-mode feedback circuit that tracks the VCO frequencies to tune the common bias point. Therefore, intrinsic VCO variations are also compensated by this feedback. A proof of concept chip demonstrating both techniques has been implemented in <inline-formula> <tex-math>$0.13mu $ </tex-math></inline-formula>m. The chip measurements show a frequency and gain drift of 6% and ±0.25dB respectively between -40°C to 100°C. These measurements are comparable to the results achieved by digital temperature calibration without requiring an on-chip temperature sensor.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"73 4","pages":"378-382"},"PeriodicalIF":4.6,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148504518","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}