基于单事件镦粗监视器的多节点镦粗辐射硬化闩锁

IF 4.9 2区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Circuits and Systems II: Express Briefs Pub Date : 2025-06-23 DOI:10.1109/TCSII.2025.3582493

Zhan Zheyu;Liu Hainan;Li Duoli;Ma Quangang;Zhao Wenxin;Yan Zhenzhen;Li Bo

{"title":"基于单事件镦粗监视器的多节点镦粗辐射硬化闩锁","authors":"Zhan Zheyu;Liu Hainan;Li Duoli;Ma Quangang;Zhao Wenxin;Yan Zhenzhen;Li Bo","doi":"10.1109/TCSII.2025.3582493","DOIUrl":null,"url":null,"abstract":"This brief describes a novel latch design, the Single-Event Upset (SEU) monitoring-based Radiation Hardened Latch (SMRHL), which is robust under multi-node upset (MNU) conditions. The SEU monitoring circuit of SMRHL is designed to detect the presence of SEU events inside the latch and trigger alarm signals accordingly, thus ensuring that the SMRHL can output correct data. The simulation results demonstrate that the proposed SMRHL minimizes the number of SEU-sensitive nodes and achieves a significant improvement of up to 57.9X in power-delay-area-product compared to other state-of-the-art MNU latches. Additionally, the SMRHL’s capability to generate SEU alarm signals enhances reliability at the system architecture level.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"72 8","pages":"1093-1097"},"PeriodicalIF":4.9000,"publicationDate":"2025-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Single-Event Upset Monitor-Based Radiation-Hardened Latch for Multi-Node Upset\",\"authors\":\"Zhan Zheyu;Liu Hainan;Li Duoli;Ma Quangang;Zhao Wenxin;Yan Zhenzhen;Li Bo\",\"doi\":\"10.1109/TCSII.2025.3582493\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This brief describes a novel latch design, the Single-Event Upset (SEU) monitoring-based Radiation Hardened Latch (SMRHL), which is robust under multi-node upset (MNU) conditions. The SEU monitoring circuit of SMRHL is designed to detect the presence of SEU events inside the latch and trigger alarm signals accordingly, thus ensuring that the SMRHL can output correct data. The simulation results demonstrate that the proposed SMRHL minimizes the number of SEU-sensitive nodes and achieves a significant improvement of up to 57.9X in power-delay-area-product compared to other state-of-the-art MNU latches. Additionally, the SMRHL’s capability to generate SEU alarm signals enhances reliability at the system architecture level.\",\"PeriodicalId\":13101,\"journal\":{\"name\":\"IEEE Transactions on Circuits and Systems II: Express Briefs\",\"volume\":\"72 8\",\"pages\":\"1093-1097\"},\"PeriodicalIF\":4.9000,\"publicationDate\":\"2025-06-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Circuits and Systems II: Express Briefs\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11048617/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Circuits and Systems II: Express Briefs","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11048617/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}

引用次数: 0

摘要

本文介绍了一种新颖的锁存器设计，即基于单事件扰动（SEU）监测的辐射硬化锁存器（SMRHL），该锁存器在多节点扰动（MNU）条件下具有鲁棒性。SMRHL的SEU监控电路用于检测锁存器内部是否存在SEU事件，并触发相应的报警信号，从而保证SMRHL能够输出正确的数据。仿真结果表明，与其他先进的MNU锁存器相比，所提出的SMRHL最大限度地减少了seu敏感节点的数量，并实现了高达57.9X的功率延迟面积产品的显著改进。此外，SMRHL生成SEU报警信号的能力增强了系统架构级别的可靠性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Single-Event Upset Monitor-Based Radiation-Hardened Latch for Multi-Node Upset

This brief describes a novel latch design, the Single-Event Upset (SEU) monitoring-based Radiation Hardened Latch (SMRHL), which is robust under multi-node upset (MNU) conditions. The SEU monitoring circuit of SMRHL is designed to detect the presence of SEU events inside the latch and trigger alarm signals accordingly, thus ensuring that the SMRHL can output correct data. The simulation results demonstrate that the proposed SMRHL minimizes the number of SEU-sensitive nodes and achieves a significant improvement of up to 57.9X in power-delay-area-product compared to other state-of-the-art MNU latches. Additionally, the SMRHL’s capability to generate SEU alarm signals enhances reliability at the system architecture level.

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来源期刊

IEEE Transactions on Circuits and Systems II: Express Briefs 工程技术-工程：电子与电气

CiteScore

7.90

自引率

20.50%

发文量

883

审稿时长

3.0 months

期刊介绍： TCAS II publishes brief papers in the field specified by the theory, analysis, design, and practical implementations of circuits, and the application of circuit techniques to systems and to signal processing. Included is the whole spectrum from basic scientific theory to industrial applications. The field of interest covered includes: Circuits: Analog, Digital and Mixed Signal Circuits and Systems Nonlinear Circuits and Systems, Integrated Sensors, MEMS and Systems on Chip, Nanoscale Circuits and Systems, Optoelectronic Circuits and Systems, Power Electronics and Systems Software for Analog-and-Logic Circuits and Systems Control aspects of Circuits and Systems.