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IEEE Letters on Electromagnetic Compatibility Practice and Applications最新文献

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Synopsis of the March 2024 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications 电气和电子工程师学会电磁兼容性实践与应用通讯》2024 年 3 月刊简介
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2024-03-08 DOI: 10.1109/LEMCPA.2024.3363569
{"title":"Synopsis of the March 2024 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications","authors":"","doi":"10.1109/LEMCPA.2024.3363569","DOIUrl":"https://doi.org/10.1109/LEMCPA.2024.3363569","url":null,"abstract":"Summary form only: Abstracts of articles presented in this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"6 1","pages":"2-5"},"PeriodicalIF":0.0,"publicationDate":"2024-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10463728","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140067521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
AI, MACHINE LEARNING, AND DEEP LEARNING: ADVANCES AND APPLICATIONS FOR EMC 人工智能、机器学习和深度学习：EMC 的进展与应用
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2024-03-08 DOI: 10.1109/LEMCPA.2024.3362692
{"title":"AI, MACHINE LEARNING, AND DEEP LEARNING: ADVANCES AND APPLICATIONS FOR EMC","authors":"","doi":"10.1109/LEMCPA.2024.3362692","DOIUrl":"https://doi.org/10.1109/LEMCPA.2024.3362692","url":null,"abstract":"","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"6 1","pages":"43-44"},"PeriodicalIF":0.0,"publicationDate":"2024-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10463729","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140066455","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Common-Mode EMI Reduction Control Strategy for Interleaved Converters 交错式转换器的共模 EMI 降低控制策略
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2024-03-08 DOI: 10.1109/LEMCPA.2024.3375309
Patrick Koch;Cathrine E. S. Feloups;Niek Moonen;Frank Leferink
{"title":"Common-Mode EMI Reduction Control Strategy for Interleaved Converters","authors":"Patrick Koch;Cathrine E. S. Feloups;Niek Moonen;Frank Leferink","doi":"10.1109/LEMCPA.2024.3375309","DOIUrl":"https://doi.org/10.1109/LEMCPA.2024.3375309","url":null,"abstract":"Isolated dc/dc converters have been adopted in numerous applications because of their advantages in efficiency, reliability, total cost, and electrical isolation. Interleaving converters can achieve the aforementioned criteria while lowering differential-mode (DM) noise and therefore filter weight and volume, which are limiting factors in all-electric aircraft (AEA). The switching of the converters, on the other hand, produces common-mode (CM) noise. As a result, the emphasis of this letter is on the impact of interleaving forward converters on possible CM noise reduction via pulse alignment. This letter discusses theory as well as potential practical limits. The data revealed that the rise and fall duration and the number of interleaved converters have an influence on CM noise reduction. To demonstrate the concept of this interleaving method, simulation results and experimental setups are used.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"6 2","pages":"79-83"},"PeriodicalIF":0.0,"publicationDate":"2024-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141164691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effective EMI Suppression Procedure Using RL Snubbers for Automotive Brush Motor Systems 为汽车电刷电机系统使用 RL 缓冲器的有效 EMI 抑制程序
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2024-02-28 DOI: 10.1109/LEMCPA.2024.3366881
Shohei Kan;Zhenhong Xu;Akito Mashino;Kengo Iokibe;Yoshitaka Toyota
{"title":"Effective EMI Suppression Procedure Using RL Snubbers for Automotive Brush Motor Systems","authors":"Shohei Kan;Zhenhong Xu;Akito Mashino;Kengo Iokibe;Yoshitaka Toyota","doi":"10.1109/LEMCPA.2024.3366881","DOIUrl":"https://doi.org/10.1109/LEMCPA.2024.3366881","url":null,"abstract":"In automotive brush motor systems, there are two types of noise that cause electromagnetic interference (EMI) problems: 1) brush noise from the brush motor and 2) switching noise from the electronic control unit (ECU). Brush noise can be mitigated by installing an EMI filter into the brush motor. However, another EMI issue related to switching noise may arise due to \u0000<inline-formula> <tex-math>$LC$ </tex-math></inline-formula>\u0000 resonance between the X capacitor of the EMI filter and the equivalent series inductance (ESL) of the power cables. The \u0000<inline-formula> <tex-math>$RL$ </tex-math></inline-formula>\u0000 snubber is promising for resonance suppression because its components can be easily mounted on the ECU board, thus reducing EMI without necessitating many design process revisions. Furthermore, our proposed optimal design method for \u0000<inline-formula> <tex-math>$RL$ </tex-math></inline-formula>\u0000 snubbers, based on circuit simulations, is applicable. This is because an automotive brush motor system equipped with an \u0000<inline-formula> <tex-math>$RL$ </tex-math></inline-formula>\u0000 snubber can be represented by a simple equivalent circuit characterized by a third-order characteristic equation, meeting the requirements of our optimal design method. In this study, we introduced an implementation procedure for an \u0000<inline-formula> <tex-math>$RL$ </tex-math></inline-formula>\u0000 snubber based on the optimal design method and tested it within the automotive brush motor system. The experimental results confirmed that the proposed implementation procedure is effective in designing \u0000<inline-formula> <tex-math>$RL$ </tex-math></inline-formula>\u0000 snubbers that significantly suppress EMI in practical applications.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"6 2","pages":"51-56"},"PeriodicalIF":0.0,"publicationDate":"2024-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141164690","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Prescan Method to Accelerate Near-Field Scan Immunity Tests 加速近场扫描免疫测试的预扫描方法
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2024-02-06 DOI: 10.1109/LEMCPA.2024.3363113
Alexandre Boyer;Fabrice Caignet
{"title":"A Prescan Method to Accelerate Near-Field Scan Immunity Tests","authors":"Alexandre Boyer;Fabrice Caignet","doi":"10.1109/LEMCPA.2024.3363113","DOIUrl":"https://doi.org/10.1109/LEMCPA.2024.3363113","url":null,"abstract":"Near-field scan immunity (NFSI) is a powerful measurement method to diagnose susceptibility issues at printed-circuit board (PCB) and integrated-circuit (IC) levels. However, one limitation of this approach is the excessive measurement time required to build the susceptibility maps, which reveal the sensitive pins or traces of the device under test (DUT). This letter presents a prescan method based on a large-band injection in order to determine rapidly the more relevant scanning positions, the frequency range of interests, and an estimation of the susceptibility level on each scanning position. The prescan provides the configuration parameters of the full NFSI scan in order to keep an acceptable test duration.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"6 2","pages":"57-61"},"PeriodicalIF":0.0,"publicationDate":"2024-02-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141164682","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Investigations Into Conducted Emissions of a 10-kW Photovoltaic Plant 10 千瓦光伏电站传导排放调查
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2024-01-29 DOI: 10.1109/LEMCPA.2024.3359485
Makarand M. Kane;Nathaniel Taylor;Daniel Månsson
{"title":"Investigations Into Conducted Emissions of a 10-kW Photovoltaic Plant","authors":"Makarand M. Kane;Nathaniel Taylor;Daniel Månsson","doi":"10.1109/LEMCPA.2024.3359485","DOIUrl":"https://doi.org/10.1109/LEMCPA.2024.3359485","url":null,"abstract":"Considering the inverter as the source of electromagnetic emission signals in a photovoltaic (PV) plant, a comprehensive set of measurements of conducted emissions at the input and output of the inverter in a 10-kW PV plant are presented. These are particularly relevant on the backdrop of 1) the ban of products in the EU market due to noncompliance and 2) the increased switching frequency in the inverters \u0000<inline-formula> <tex-math>$(sim 100$ </tex-math></inline-formula>\u0000 s of kHz) in the near future. Specifically, the common-mode (CM) and differential-mode (DM) currents and voltages are measured, and their frequency-domain behavior is studied. It is suggested that conducted emissions from PV can be classified into three zones: 1) extremely low-frequency (ELF) zone, 2) power frequency zone, and 3) switching frequency zone. Important observations from this exercise are the measurement of harmonic contents of current with total rated current distortion (TRD), imbalance in the output voltage, and low-frequency ripples in the dc voltage. Frequency-domain behavior of the CM quantities is studied which throws light on important points like a relation between input and output CM quantities and a relation between CM voltage and CM current.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"6 1","pages":"16-21"},"PeriodicalIF":0.0,"publicationDate":"2024-01-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140067534","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design and Modeling of a Miniaturized Multilayer Metamaterial Absorber With Oblique Angle and Polarization Insensitivity 具有斜角和偏振不敏感性的小型化多层超材料吸收器的设计与建模
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2024-01-26 DOI: 10.1109/LEMCPA.2024.3359149
Punyatoya Routray;Debalina Ghosh
{"title":"Design and Modeling of a Miniaturized Multilayer Metamaterial Absorber With Oblique Angle and Polarization Insensitivity","authors":"Punyatoya Routray;Debalina Ghosh","doi":"10.1109/LEMCPA.2024.3359149","DOIUrl":"https://doi.org/10.1109/LEMCPA.2024.3359149","url":null,"abstract":"This letter introduces a novel multilayer metamaterial absorber design suitable for multiband applications in the C, X, and Ku frequency bands. The absorber’s compact nature, wide oblique angle coverage, and insensitivity to polarization angles make it a versatile solution. This absorber is designed by stacking two dual-band metamaterial absorbers. The upper layer incorporates a design composed of four concentric rings loaded in a cross configuration. Meanwhile, the middle layer is formed with two sets of embedded rings and split rings, all centered around a crossed rod. The absorber exhibits absorption peaks above 90% in the frequency bands of operation. Importantly, its performance remains consistent across varying polarization angles and is capable of sustaining absorptivity exceeding 90% at oblique angles of up to 60° for both transverse electric (TE) and transverse magnetic (TM) modes. A comprehensive model is established to elucidate the absorption mechanism and investigate the interplay between geometric characteristics and absorptivity. This model aids in adapting the structure to specific frequency requirements. Practical fabrication is accomplished using a straightforward printed-circuit board fabrication technique. Experimental measurements closely align with the anticipated performance, validating the effectiveness of the proposed multilayer absorber design.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"6 1","pages":"29-34"},"PeriodicalIF":0.0,"publicationDate":"2024-01-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140067563","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Differences Between NSA 94–106 and IEEE Std. 299 Setups for Low-Frequency Magnetic Shielding Effectiveness Characterization: A Study Using Numerical Simulations NSA 94-106 和 IEEE Std：数值模拟研究
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2024-01-18 DOI: 10.1109/LEMCPA.2024.3355849
Lirim Koraqi;Tim Claeys;Johan Catrysse;Davy Pissoort
{"title":"Differences Between NSA 94–106 and IEEE Std. 299 Setups for Low-Frequency Magnetic Shielding Effectiveness Characterization: A Study Using Numerical Simulations","authors":"Lirim Koraqi;Tim Claeys;Johan Catrysse;Davy Pissoort","doi":"10.1109/LEMCPA.2024.3355849","DOIUrl":"https://doi.org/10.1109/LEMCPA.2024.3355849","url":null,"abstract":"This letter employs simulation findings to demonstrate the practical reasons why the low-frequency magnetic shielding effectiveness (SE) is different when characterized using two parallel loops (NSA 94-106) or two coplanar loops (IEEE Std. 299). It shows how the change in the loop radius impacts the SE for the NSA 94–106 setup rather than for the IEEE 299 one. The observation is rooted in the difference of the wave impedance for both scenarios. Additionally, this letter elucidates the reason behind the wave impedance difference.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"6 1","pages":"22-28"},"PeriodicalIF":0.0,"publicationDate":"2024-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140066436","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
2023 Index IEEE Letters on Electromagnetic Compatibility Practice and Applications Vol. 5 2023索引IEEE电磁兼容性实践和应用第5卷
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-11-29 DOI: 10.1109/LEMCPA.2023.3336493
{"title":"2023 Index IEEE Letters on Electromagnetic Compatibility Practice and Applications Vol. 5","authors":"","doi":"10.1109/LEMCPA.2023.3336493","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3336493","url":null,"abstract":"","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 4","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2023-11-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10334004","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138468123","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
AI, MACHINE LEARNING, AND DEEP LEARNING: ADVANCES AND APPLICATIONS FOR EMC 人工智能，机器学习和深度学习:emc的进展和应用
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-11-22 DOI: 10.1109/LEMCPA.2023.3325491
{"title":"AI, MACHINE LEARNING, AND DEEP LEARNING: ADVANCES AND APPLICATIONS FOR EMC","authors":"","doi":"10.1109/LEMCPA.2023.3325491","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3325491","url":null,"abstract":"","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 4","pages":"159-160"},"PeriodicalIF":0.0,"publicationDate":"2023-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10325839","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138431299","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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