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IEEE Letters on Electromagnetic Compatibility Practice and Applications最新文献

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Characterization of Near-Field Interactions Between Multiple Noise Sources and a Conductive Wire 多噪声源与导线之间近场相互作用的表征
IF 1
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2025-08-22 DOI: 10.1109/LEMCPA.2025.3601614
Martin Humeau;Mohsen Koohestani;David Boudikian;Mohamed Ramdani
{"title":"Characterization of Near-Field Interactions Between Multiple Noise Sources and a Conductive Wire","authors":"Martin Humeau;Mohsen Koohestani;David Boudikian;Mohamed Ramdani","doi":"10.1109/LEMCPA.2025.3601614","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3601614","url":null,"abstract":"This letter presents the development of an analytical model to characterize near-field electromagnetic coupling between multiple noise sources and a metallic wire. The noise sources are modeled as two spatially separated, radiating single-turn metallic closed loops positioned above the wire in the presence of a ground plane. The analytical model applies the superposition theorem to account for the combined magnetic-field contributions of both noise sources. Validation was performed through full-wave simulations in Ansys HFSS and experimental measurements. Whatever the distance between the two radiating loops, the results demonstrate a reasonable correlation between the analytical model predictions, simulations, and measurements across a frequency range of 1 MHz–1 GHz. Notably, the analytical model maintains its computational advantage, providing accurate results in seconds compared to the hours required by full-wave simulations. This enhancement is particularly beneficial for electromagnetic-compatibility-compliant designs in industrial applications, where accurate and rapid assessments of complex multisource environments are essential.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 4","pages":"123-128"},"PeriodicalIF":1.0,"publicationDate":"2025-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824300","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modern EMC Power Quality Issues: Overvoltage Caused by PV Penetration 现代EMC电能质量问题：由PV穿透引起的过电压
IF 1
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2025-08-12 DOI: 10.1109/LEMCPA.2025.3598177
Amr Madi;Piotr Lezynski;Robert Smolenksi;Niek Moonen;Frank Leferink
{"title":"Modern EMC Power Quality Issues: Overvoltage Caused by PV Penetration","authors":"Amr Madi;Piotr Lezynski;Robert Smolenksi;Niek Moonen;Frank Leferink","doi":"10.1109/LEMCPA.2025.3598177","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3598177","url":null,"abstract":"Due to the global vision and actions taken to lower the <inline-formula> <tex-math>${mathrm { CO}}_{2}$ </tex-math></inline-formula> and decrease the emitted greenhouse gases, there has been a boost and encouragement for deploying photovoltaic (PV) systems in Poland and many other countries. However, the extensive installation of PV units in residential prosumers has led to a new electromagnetic-compatibility (EMC) problem. This problem is the overvoltage (OV) resulting from high penetration of the PV units. Energy companies started to receive complaints from customers about service interruptions. However, in many cases, these OV incidents were not detected by the companies’ metering systems, making it difficult to identify the root cause of the problem. This letter presents a field investigation showing the recognized EMC issue, highlighting how high PV penetration can lead to OV in the low-voltage distribution network. It also explains why the energy companies fail to detect OV. In addition, this letter provides insight into the PV inverter’s operation and protection in accordance with the IEC standard.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 4","pages":"118-122"},"PeriodicalIF":1.0,"publicationDate":"2025-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824291","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Combo Chokes of Differential-Mode and Common-Mode Filters 差模和共模滤波器的组合扼流圈
IF 1
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2025-08-11 DOI: 10.1109/LEMCPA.2025.3597528
Yeu-Torng Yau;Tsung-Liang Hung
{"title":"Combo Chokes of Differential-Mode and Common-Mode Filters","authors":"Yeu-Torng Yau;Tsung-Liang Hung","doi":"10.1109/LEMCPA.2025.3597528","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3597528","url":null,"abstract":"This letter proposes an integrated choke for designing electromagnetic-interference filters in switching power converters. The suggested method combines common-mode (CM) and differential-mode (DM) chokes within a single core structure. This approach addresses the limitations of conventional combo choke solutions, such as their inability to design CM and DM inductances independently and the complex manufacturing process. It also offers a high degree of integration and design flexibility. Compared with discrete filters, the proposed solution reduces the component size significantly while effectively balancing DM and CM filtering performance. In addition, this innovative design reduces system complexity while demonstrating excellent performance and considerable commercialization potential.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 3","pages":"97-103"},"PeriodicalIF":1.0,"publicationDate":"2025-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145036771","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Clinical Workflow-Oriented Risk-Based EMC Approach: A Case Study of EM Emissions From a UV Light Therapy System and Implications for Cardiovascular Implants 以临床工作流程为导向的基于风险的电磁兼容方法：紫外光治疗系统电磁发射的案例研究及其对心血管植入物的影响
IF 1
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2025-07-30 DOI: 10.1109/LEMCPA.2025.3593820
Nandun Senevirathna;Rob Kleihorst;Barbel van den Berg;David Versteegen
{"title":"Clinical Workflow-Oriented Risk-Based EMC Approach: A Case Study of EM Emissions From a UV Light Therapy System and Implications for Cardiovascular Implants","authors":"Nandun Senevirathna;Rob Kleihorst;Barbel van den Berg;David Versteegen","doi":"10.1109/LEMCPA.2025.3593820","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3593820","url":null,"abstract":"This letter introduces a clinical workflow-oriented risk-based electromagnetic compatibility approach for professional healthcare environments. For practical implementation of such an approach, it proposes a framework for electromagnetic interference-induced risk management. Further, this letter details the application of the aforementioned approach in a case study of a UV light therapy system EM emissions to study the implications of those EM emissions on implanted cardiac electronic devices.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 3","pages":"90-96"},"PeriodicalIF":1.0,"publicationDate":"2025-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145036792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
AC Saturation Measurement Method for Inductor Cores 电感铁芯交流饱和测量方法
IF 1
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2025-07-01 DOI: 10.1109/LEMCPA.2025.3584402
Rodica Botnarevscaia;Cathrine E. S. Feloups;Tom Hartman;Niek Moonen;Frank Leferink
{"title":"AC Saturation Measurement Method for Inductor Cores","authors":"Rodica Botnarevscaia;Cathrine E. S. Feloups;Tom Hartman;Niek Moonen;Frank Leferink","doi":"10.1109/LEMCPA.2025.3584402","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3584402","url":null,"abstract":"Saturation of common-mode chokes (CMCs) in high-power and wide-frequency band applications leads to elevated electromagnetic-interference levels that negatively impact the primary system and nearby devices. However, detecting such CMC saturation is often complex, time-consuming, and costly. This letter presents a method for detecting core saturation by introducing a high-frequency (HF) signal alongside the operational frequencies, including the fundamental switching signal and its harmonics, of a high-power system. To validate the concept, the technique is tested in a controlled environment using an HF detection signal combined with low-frequency saturating current. Experimental results confirm the method’s feasibility, and recommendations for practical implementation are provided.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 3","pages":"84-89"},"PeriodicalIF":1.0,"publicationDate":"2025-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145036770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Impact of Sensing Resistor on IC-Level Noise Measurement of DC–DC Converters by 1-Ω Method 传感电阻对1-Ω法测量DC-DC变换器ic级噪声的影响
IF 1
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2025-06-05 DOI: 10.1109/LEMCPA.2025.3577070
Hyun Ho Park;Jiseong Kim;Eakhwan Song;Hongseok Kim;Sangho Cho
{"title":"Impact of Sensing Resistor on IC-Level Noise Measurement of DC–DC Converters by 1-Ω Method","authors":"Hyun Ho Park;Jiseong Kim;Eakhwan Song;Hongseok Kim;Sangho Cho","doi":"10.1109/LEMCPA.2025.3577070","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3577070","url":null,"abstract":"This letter presents the permissible sensing resistance range for measuring ground noise in DC–DC converter integrated circuits using the 1-<inline-formula> <tex-math>$Omega $ </tex-math></inline-formula> method from IEC 61967-4. The DC–DC converter was modeled as an equivalent RLC resonant loop to examine the impact of the sensing resistor, and the effects of resistance and parasitic inductance were analyzed in both frequency- and time-domain measurements. A 10-m<inline-formula> <tex-math>$Omega $ </tex-math></inline-formula> sensing resistor of size 0603 in a DC–DC buck converter for digital TVs demonstrated accurate noise measurement. As a result, the permissible range of sensing resistor values, considering parasitic inductance, was derived.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 3","pages":"79-83"},"PeriodicalIF":1.0,"publicationDate":"2025-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145036987","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Top-Loaded Circular Patch Log-Periodic Antenna for IEMI Sensing 用于IEMI传感的顶部加载圆形贴片对数周期天线
IF 1
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2025-04-22 DOI: 10.1109/LEMCPA.2025.3563437
Amiya Kumar Mondal;Sreenath Reddy Thummaluru;K. Premkumar;P. Prasanna Kumar;M. V. Kartikeyan
{"title":"Top-Loaded Circular Patch Log-Periodic Antenna for IEMI Sensing","authors":"Amiya Kumar Mondal;Sreenath Reddy Thummaluru;K. Premkumar;P. Prasanna Kumar;M. V. Kartikeyan","doi":"10.1109/LEMCPA.2025.3563437","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3563437","url":null,"abstract":"This letter presents the top-loaded circular patch planar log-periodic dipole array (PLPDA) antenna for detecting intentional electromagnetic interference (IEMI) within the 0.5–2.0-GHz operating band. The dipoles of the traditional log-periodic antenna have been modified using circular patches and achieved a compact design with dimensions of <inline-formula> <tex-math>$25.5mathbf {times } 27mathbf {times }0.16$ </tex-math></inline-formula> cm3. The modified design’s dimensions are 31.65% and 15% lower compared to the conventional PLPDA antenna along lateral and horizontal directions, respectively. Even with a compact size, the presented antenna gives good impedance matching with a reflection coefficient <inline-formula> <tex-math>$| mathbf {S}_{mathbf {11}} |$ </tex-math></inline-formula> of less than −10 dB, a gain of <inline-formula> <tex-math>$5~pm $ </tex-math></inline-formula>1 dB, 70% radiation efficiency, and a stable radiation pattern with low cross polarizations. Considering such high performance with a compact size, the proposed antenna is well suited for system-level integration as a nonpowered passive sensor to detect the IEMI signals. At the end of this letter, the experiments relating to IEMI detection and their results are discussed to explain how well the presented design is able to detect the IEMI signals.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 3","pages":"68-72"},"PeriodicalIF":1.0,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145036986","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Active Isolation Structure for Directional Stress Current Injection 定向应力电流注入主动隔离结构
IF 0.9
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2025-04-08 DOI: 10.1109/LEMCPA.2025.3558877
Zhekun Peng;Giorgi Maghlakelidze;Srinath Penugonda;Harald Gossner;David Pommerenke;DongHyun Kim
{"title":"Active Isolation Structure for Directional Stress Current Injection","authors":"Zhekun Peng;Giorgi Maghlakelidze;Srinath Penugonda;Harald Gossner;David Pommerenke;DongHyun Kim","doi":"10.1109/LEMCPA.2025.3558877","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3558877","url":null,"abstract":"In the testing of high-speed interfaces for electrostatic discharge (ESD)-induced soft failure susceptibility, for example, using a transmission-line pulse (TLP), the current propagates toward both ends of the channel from the injection point, resulting in the inability to determine if the host or the device under test (DUT) failed. Unidirectional current injection toward the DUT is necessary. An active circuit design is proposed for unidirectional current injection in high-speed simplex interfaces. The proposed method is applied to a USB3 Gen 1 interface. To verify the effectiveness of the proposed unidirectional injection structure, directionality, gain flatness, and maximum stress level are measured. Eye diagram simulation results verify the negligible electrical impact of the proposed isolating structure.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 2","pages":"50-54"},"PeriodicalIF":0.9,"publicationDate":"2025-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144170867","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Call for Application Letters on the Special Issue Practical Applications and Advancements in Electromagnetic Shielding and Absorbers 《电磁屏蔽与吸收剂的实际应用与进展》特刊征信
IF 0.9
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2025-03-28 DOI: 10.1109/LEMCPA.2025.3565077
{"title":"Call for Application Letters on the Special Issue Practical Applications and Advancements in Electromagnetic Shielding and Absorbers","authors":"","doi":"10.1109/LEMCPA.2025.3565077","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3565077","url":null,"abstract":"","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 2","pages":"61-62"},"PeriodicalIF":0.9,"publicationDate":"2025-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11017413","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144170865","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Synopsis of the June 2025 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications 《IEEE电磁兼容实践与应用快报》2025年6月号摘要
IF 0.9
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2025-03-28 DOI: 10.1109/LEMCPA.2025.3563776
{"title":"Synopsis of the June 2025 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications","authors":"","doi":"10.1109/LEMCPA.2025.3563776","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3563776","url":null,"abstract":"Summary form only: Abstracts of articles presented in this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 2","pages":"31-34"},"PeriodicalIF":0.9,"publicationDate":"2025-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11017411","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144170973","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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