IEEE Letters on Electromagnetic Compatibility Practice and Applications最新文献

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Efficient Use of a Hybrid Chamber for Radiated Susceptibility Tests 混合室在辐射敏感度测试中的有效使用
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2022-08-16 DOI: 10.1109/LEMCPA.2022.3197056
Danilo Izzo;Robert Vogt-Ardatjew;Frank Leferink
{"title":"Efficient Use of a Hybrid Chamber for Radiated Susceptibility Tests","authors":"Danilo Izzo;Robert Vogt-Ardatjew;Frank Leferink","doi":"10.1109/LEMCPA.2022.3197056","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3197056","url":null,"abstract":"This letter describes the design and operation of a novel type of hybrid chamber used for radiated susceptibility tests. This is a semi-anechoic chamber with the possibility to install a vibrating intrinsic reverberation chamber inside. This testing environment can be used for the execution of the radiated susceptibility tests using both the deterministic and stochastic methodologies but without changing the test location, nor moving the device under test with its auxiliary equipment. This allows test engineers to combine the advantages of both reverberation and semi-anechoic chambers with a minimum effort, making it a very practical, cost- and time-efficient solution. The electric field into the reverberation chamber is monitored by eight electric field probes, permitting the closed-loop control of the electric field strength level and an efficient real-time analysis of the performance indicators discussed in this letter.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 4","pages":"97-102"},"PeriodicalIF":0.0,"publicationDate":"2022-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67853855","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Discussion of the New M-component Engineering Model From Azadifar et al. by Simultaneous Measurements in Rocket-Triggered Lightning Azadifar等提出的新M分量工程模型在火箭触发闪电中的同时测量讨论
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2022-07-28 DOI: 10.1109/LEMCPA.2022.3194088
Quanxin Li;Jianguo Wang;Li Cai;Mi Zhou;Yadong Fan
{"title":"A Discussion of the New M-component Engineering Model From Azadifar et al. by Simultaneous Measurements in Rocket-Triggered Lightning","authors":"Quanxin Li;Jianguo Wang;Li Cai;Mi Zhou;Yadong Fan","doi":"10.1109/LEMCPA.2022.3194088","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3194088","url":null,"abstract":"A discussion of the new M-component engineering model proposed by Azadifar \u0000<italic>et al.</i>\u0000 (2019) is presented. The M-component electric fields were measured at both close distance of 78 m and far multiple-station distances ranging 69 km −126 km in rocket-triggered lightning. Both the fast microsecond-scale pulse and the following slow millisecond-scale pulse are reproduced in the new engineering model. The electrostatic field component produced by the return-stroke like process along the branch among the new engineering model contributes to weaken the positive overshoot of the close M-component electric field. The modified new engineering model considering an exponential current decay along the grounded channel in the study allows a more satisfactory performance of reproducing full M-component electric fields than that of the model from Azadifar \u0000<italic>et al</i>\u0000.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 3","pages":"61-65"},"PeriodicalIF":0.0,"publicationDate":"2022-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868258","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
GPU and CPU-Based Parallel FDTD Methods for Frequency-Dependent Transmission Line Models 基于GPU和CPU的频率相关传输线模型并行FDTD方法
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2022-07-15 DOI: 10.1109/LEMCPA.2022.3191597
Manuja Gunawardana;Behzad Kordi
{"title":"GPU and CPU-Based Parallel FDTD Methods for Frequency-Dependent Transmission Line Models","authors":"Manuja Gunawardana;Behzad Kordi","doi":"10.1109/LEMCPA.2022.3191597","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3191597","url":null,"abstract":"Finite-difference time-domain (FDTD) is a popular method utilized for solving frequency-dependent transmission line structures. It is also conveniently applicable to nonuniform wires. The FDTD algorithm discretizes the transmission line problem into a finite number of space-segments and solve for the voltage and current of each segment at every time-step. Therefore, they inherently involve more computations per timestep than conventional terminal based models. In this letter, parallel implementations of a modified FDTD algorithm for a frequency-dependent transmission line problem using multicore CPU and GPU architectures are proposed in order to increase its computational efficiency. Accuracy and performance of the parallel FDTD methods are discussed with examples. The results indicate that a speedup of a few folds compared to serial execution is achieved by the parallel implementation using multicore CPU architecture whereas a massive speedup is achieved by using GPU. The proposed model is also suitable for modelling transmission lines in massively parallel electromagnetic transient (EMT) simulation methods.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 3","pages":"66-70"},"PeriodicalIF":0.0,"publicationDate":"2022-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868261","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Shielding Effectiveness of Gaskets: MIL DTL 83528G Conditions Against Requirements in Practice 垫片的屏蔽效果:MIL DTL 83528G实践中不符合要求的条件
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2022-06-15 DOI: 10.1109/LEMCPA.2022.3183448
Pavithrakrishnan Radhakrishnan;Tim Claeys;Johan Catrysse;Davy Pissoort
{"title":"Shielding Effectiveness of Gaskets: MIL DTL 83528G Conditions Against Requirements in Practice","authors":"Pavithrakrishnan Radhakrishnan;Tim Claeys;Johan Catrysse;Davy Pissoort","doi":"10.1109/LEMCPA.2022.3183448","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3183448","url":null,"abstract":"In this letter, it is suggested how the basic setup of MIL DTL 83528G can easily be adapted to the situations occurring in practice: factors such as the orientations of antennas with respect to the setup, beam width of antennas, and distances between the clamping bolts which hold the gaskets in place, are taken into account. Typical measurement results under different measuring conditions related to practical situations, are reported and discussed, as well as suggestions for good design.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 3","pages":"71-76"},"PeriodicalIF":0.0,"publicationDate":"2022-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868260","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
RF Heating Dependence of Head Model Positioning Using 4-Channel Parallel Transmission MRI and a Deep Brain Stimulation Construct 利用4通道并行传输MRI和脑深部刺激构建的头部模型定位的射频加热相关性
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2022-06-08 DOI: 10.1109/LEMCPA.2022.3180974
Benson Yang;Chih-Hung Chen;Simon J. Graham
{"title":"RF Heating Dependence of Head Model Positioning Using 4-Channel Parallel Transmission MRI and a Deep Brain Stimulation Construct","authors":"Benson Yang;Chih-Hung Chen;Simon J. Graham","doi":"10.1109/LEMCPA.2022.3180974","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3180974","url":null,"abstract":"Parallel radiofrequency transmission (pTx) continues to demonstrate promise in addressing magnetic resonance imaging (MRI) challenges at higher magnetic-field strengths, particularly regarding the safety of patients with implanted deep brain stimulation (DBS) devices. Radiofrequency (RF) shimming optimization methods have shown the potential of pTx to minimize DBS implant safety concerns relating to induced RF heating at 3T. This letter continues the assessment of 4-channel pTx technology and its associated “safe mode” for the DBS application. Safe mode sensitivity to patient setup mispositioning and movement is important and was studied in proof-of-concept. Phantom mispositioning can impact the electromagnetic near-field distribution and potentially affect the RF heating effects along an implanted DBS device. However, thermal simulations studying DBS patient head movements were performed and indicated minimal safety risks. These results were further validated by an MRI phantom mispositioning experiment encompassing the head motion studied in simulation. Temperature increases remained below +1°C for all tested scenarios in simulation and experiment. However, a severe pitch rotation in the experiment led to a +0.8°C increase, indicating that significant patient movement may still shift implanted DBS leads into higher risk zones. In conclusion, this letter further supports the potential of 4-channel pTx to address DBS patient safety.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 3","pages":"83-87"},"PeriodicalIF":0.0,"publicationDate":"2022-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"68148624","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Behavioral Modeling of an Off-the-Shelf Damped Sinusoidal Transient Generator 现成阻尼正弦瞬态发生器的行为建模
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2022-04-08 DOI: 10.1109/LEMCPA.2022.3165762
Xiaokang Liu;Flavia Grassi;François Trotti;Werner Hirschi
{"title":"Behavioral Modeling of an Off-the-Shelf Damped Sinusoidal Transient Generator","authors":"Xiaokang Liu;Flavia Grassi;François Trotti;Werner Hirschi","doi":"10.1109/LEMCPA.2022.3165762","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3165762","url":null,"abstract":"In this letter, experimental characterization and behavioral modeling of an off-the-shelf damped sinusoidal wave generator operating at different frequencies are addressed. Two modeling strategies are developed which lead to an active and a passive circuit representation of the generator, whose involved parameters are optimized by making use of time-domain measurement results obtained with the generator connected to different load impedances. It is shown that either the active or the passive model can assure accurate prediction of the generated waveforms, depending on the specific frequency. The proposed models can be effortlessly implemented in common circuit simulators, and used for systematic design of injection devices for transient conducted susceptibility testing as well as for simulation of the corresponding test setups. As an illustrative example, the proposed models are exploited to predict the actual waveform induced at the input pins of the device under test in a simplified pulse current injection test setup.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 3","pages":"56-60"},"PeriodicalIF":0.0,"publicationDate":"2022-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868262","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A Comparative Performance Analysis of 6T & 9T SRAM Integrated Circuits: SOI vs. Bulk 6T与9T SRAM集成电路的性能比较分析:SOI与Bulk
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2022-04-01 DOI: 10.1109/LEMCPA.2022.3163963
Qazi Mashaal Khan;Richard Perdriau;Mohamed Ramdani;Mohsen Koohestani
{"title":"A Comparative Performance Analysis of 6T & 9T SRAM Integrated Circuits: SOI vs. Bulk","authors":"Qazi Mashaal Khan;Richard Perdriau;Mohamed Ramdani;Mohsen Koohestani","doi":"10.1109/LEMCPA.2022.3163963","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3163963","url":null,"abstract":"This letter evaluates the performance of 6T & 9T static random access memory (SRAM) cells, for data stability and power metrics, with the aim to compare silicon-on-insulator (SOI) and bulk CMOS technologies. Each SRAM topology was designed & simulated in 180 nm 5 V XFAB-SOI and AMS-bulk processes, using optimized parameters and compatible devices. The fundamental variables analyzed were read noise margins, write trip current & voltage as well as leakage current (LC) and static power dissipation (SPD) under process and temperature (PT) variations. The static noise margin (SNM) butterfly curve and N-curve methodologies were used to assess the mentioned parameters. Compared to bulk technology, the SRAM cells designed with SOI were found to have lower SPD & LC, higher data stability, lower write ability, larger sensitivity to process variations and higher resilience to temperature deviations.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 2","pages":"25-30"},"PeriodicalIF":0.0,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67896190","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A Hybrid Model to Estimate Mean of Maximum Fields Inside Small Metal Enclosures Using Deep Neural Networks and Maximum Likelihood Estimator 用深度神经网络和最大似然估计估计小金属外壳内最大场平均值的混合模型
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2022-03-24 DOI: 10.1109/LEMCPA.2022.3162068
Neda Nourshamsi;Amir H. Jafari;Pedro Uría Rodríguez;Jeffrey A. Nanzer
{"title":"A Hybrid Model to Estimate Mean of Maximum Fields Inside Small Metal Enclosures Using Deep Neural Networks and Maximum Likelihood Estimator","authors":"Neda Nourshamsi;Amir H. Jafari;Pedro Uría Rodríguez;Jeffrey A. Nanzer","doi":"10.1109/LEMCPA.2022.3162068","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3162068","url":null,"abstract":"This letter addresses a new regression model with the deep neural network (DNN) to estimate the mean of the maximum field inside two different nested-reverberation chamber configurations. In this model, a frequency range that the enclosure is expected to be in the over-moded regime is used as an input of the network, and the mean of the maximum field for both aperture scenarios is used as the output of the network. A 16-layer network with two regression heads provided the best regression model for both configurations, manifesting the trained model can accurately extrapolate the mean of maxima in the other frequency steps that are not used in the training data set. The tested and training root-mean-squared errors \u0000<inline-formula> <tex-math>$(485e^{-5}, 851e^{-5})$ </tex-math></inline-formula>\u0000 are achieved with the network, demonstrating the network is feasible to detect the mean of maxima for two different nested-chamber configurations, extending the earlier work which considered estimation of the mean of maxima for a single nested chamber-configuration.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 2","pages":"31-35"},"PeriodicalIF":0.0,"publicationDate":"2022-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67896191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Synopsis of the June 2022 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications 《IEEE电磁兼容性实践与应用快报》2022年6月号综述
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2022-03-24 DOI: 10.1109/LEMCPA.2022.3169630
{"title":"Synopsis of the June 2022 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications","authors":"","doi":"10.1109/LEMCPA.2022.3169630","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3169630","url":null,"abstract":"Summary form only: Abstracts of articles presented in this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 2","pages":"22-24"},"PeriodicalIF":0.0,"publicationDate":"2022-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/9780465/09780632.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"68072225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Synergistic Effect of Multitone EMI on the Conducted Immunity of Integrated Oscillators 多音EMI对集成振荡器传导抗扰度的协同效应
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2022-03-17 DOI: 10.1109/LEMCPA.2022.3175433
Qazi Mashaal Khan;Lokesh Devaraj;Mohsen Koohestani;Alastair R. Ruddle;Mohamed Ramdani;Richard Perdriau
{"title":"Synergistic Effect of Multitone EMI on the Conducted Immunity of Integrated Oscillators","authors":"Qazi Mashaal Khan;Lokesh Devaraj;Mohsen Koohestani;Alastair R. Ruddle;Mohamed Ramdani;Richard Perdriau","doi":"10.1109/LEMCPA.2022.3175433","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3175433","url":null,"abstract":"The performance of two oscillator circuits, namely a current-starved voltage controlled oscillator and a ring oscillator, is compared with respect to multi-tone direct power injection (DPI). The objective is to investigate the impact of causal dependence between multi-tones on the immunity levels of integrated blocks with different architectures but similar functionality. The multi-tone immunity analysis performed using the probabilistic noisy-OR model reveals an increase in the probability of failure due to electromagnetic interference relatively to single-tone EM disturbance. The proportions of inhibition and positive causality, as well as the mean degree of synergy (\u0000<italic>DoS</i>\u0000) caused by multi-tone EM disturbances, are extensively compared for both oscillator circuits.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 3","pages":"77-82"},"PeriodicalIF":0.0,"publicationDate":"2022-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868259","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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