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IEEE Letters on Electromagnetic Compatibility Practice and Applications最新文献

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Synopsis of the December 2023 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications 《IEEE电磁兼容性实践与应用快报》2023年12月刊摘要
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-11-22 DOI: 10.1109/LEMCPA.2023.3325502
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引用次数: 0
IEEE ELECTROMAGNETIC COMPATIBILITY SOCIETY 电磁兼容学会
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-11-22 DOI: 10.1109/LEMCPA.2023.3332790
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引用次数: 0
Simple Semianalytical Septum Design for Improved Matching in Open TEM Cells 改进开放式 TEM 单元匹配的简单半分析隔板设计
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-11-15 DOI: 10.1109/LEMCPA.2023.3333003
Giacomo Giannetti;Christian Spindelberger;Holger Arthaber
{"title":"Simple Semianalytical Septum Design for Improved Matching in Open TEM Cells","authors":"Giacomo Giannetti;Christian Spindelberger;Holger Arthaber","doi":"10.1109/LEMCPA.2023.3333003","DOIUrl":"10.1109/LEMCPA.2023.3333003","url":null,"abstract":"Open transverse electromagnetic (TEM) cells are used for many applications. Usually, such cells are built of metal sheets with linear profiles. Due to these simple geometries, impedance matching is limited. To improve the matching, a simple semianalytical method for an advanced septum profile is developed. Dominant TEM-mode propagation and an expression for the characteristic impedance of a stripline are considered. The characteristic impedances of the feed and the central stripline are equal to a given, desired value. To minimize reflections, the characteristic impedance of the TEM mode is enforced to be constant over the entire structure, especially along the tapered sections. In this way, the proposed method returns the septum width as a function of the longitudinal coordinate along the cell, such that each cross section has a characteristic impedance equal to the given, desired value. A septum designed according to the proposed method is manufactured and installed in a TEM cell prototype. The 30 MHz–1 GHz frequency range is considered to cover CISPR bands C and D. Both measurements and full-wave simulations indicate an improvement in the return loss of 4.6 dB from 10.6 to 15.2 dB with respect to the previously installed linearly tapered septum. Code supporting the findings available at: \u0000<uri>https://codeocean.com/capsule/4880490/tree</uri>\u0000.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"6 1","pages":"6-10"},"PeriodicalIF":0.0,"publicationDate":"2023-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10318185","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135710550","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
System-Level Validation of Radiated Noise Source Characterization Using Only Near-Field Magnitude Information 仅使用近场幅度信息对辐射噪声源特性进行系统级验证
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-11-06 DOI: 10.1109/LEMCPA.2023.3330402
Ze Sun;Yansheng Wang;DongHyun Kim
{"title":"System-Level Validation of Radiated Noise Source Characterization Using Only Near-Field Magnitude Information","authors":"Ze Sun;Yansheng Wang;DongHyun Kim","doi":"10.1109/LEMCPA.2023.3330402","DOIUrl":"10.1109/LEMCPA.2023.3330402","url":null,"abstract":"To characterize the radiated noise sources in the radio-frequency interference simulations, a novel equivalent dipole source extraction method was proposed by our group previously. An iteration algorithm and the genetic algorithm work together to reconstruct an equivalent source using near-field magnitude information only while minimizing the number of dipoles needed. In this letter, the previously proposed equivalent dipole extraction algorithm is extended to efficiently extract an equivalent source of harmonics. Furthermore, the algorithm is verified using the actual product instead of simplified test boards. A rigorous and systematic validation process is proposed and conducted, which ensures the robustness and credibility of the extraction algorithm for future applications.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"6 1","pages":"35-42"},"PeriodicalIF":0.0,"publicationDate":"2023-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135503785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Novel FSS-Based Bandstop Filter for TE/TM Polarization 基于 FSS 的新型 TE/TM 偏振带阻滤波器
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-10-24 DOI: 10.1109/LEMCPA.2023.3327027
Sourodipto Das;Anil Rajput;Biswajeet Mukherjee
{"title":"A Novel FSS-Based Bandstop Filter for TE/TM Polarization","authors":"Sourodipto Das;Anil Rajput;Biswajeet Mukherjee","doi":"10.1109/LEMCPA.2023.3327027","DOIUrl":"10.1109/LEMCPA.2023.3327027","url":null,"abstract":"A novel miniaturized unit-cell frequency-selective surface (FSS)-based bandstop filter (BSF) is presented in this letter. The proposed structure exhibits negative refractive index (NRI) characteristics by designing an epsilon-negative FSS. This design gives a 10-dB rejection bandwidth from 3.13 to 4.75 GHz and its unit cell has an electrical length of \u0000<inline-formula> <tex-math>$0.125,,lambda _{0} times 0.125,,lambda _{0}$ </tex-math></inline-formula>\u0000. In addition, the designed BSF has a center frequency of 3.96 GHz and an NRI value for a range of 220 MHz, starting from 4.07 to 4.29 GHz. Furthermore, its equivalent circuit model and surface current distribution are elucidated to explain the behavior of the proposed FSS. The structure manifests polarization-independent characteristics and provides a stable frequency response for normal and oblique angles under both transverse electric (TE) and transverse magnetic (TM) incident polarization. To validate the results, the BSF is fabricated, and good agreement between the simulated and measured responses is observed.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"6 1","pages":"11-15"},"PeriodicalIF":0.0,"publicationDate":"2023-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135156537","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On-Site Radiated Emissions Result Visualization Using Augmented Reality 使用增强现实的现场辐射排放结果可视化
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-10-12 DOI: 10.1109/LEMCPA.2023.3324267
Denys Pokotilov;Robert Vogt-Ardatjew;Frank Leferink
{"title":"On-Site Radiated Emissions Result Visualization Using Augmented Reality","authors":"Denys Pokotilov;Robert Vogt-Ardatjew;Frank Leferink","doi":"10.1109/LEMCPA.2023.3324267","DOIUrl":"10.1109/LEMCPA.2023.3324267","url":null,"abstract":"By focusing on regions exhibiting maximum electromagnetic (EM) emission levels, the duration required for standard EM emissions measurements can be substantially reduced. This letter outlines a rapid prescan technique that adheres to conventional measurement procedures. The proposed method considerably minimizes measurement time by identifying areas where emissions approach, or exceed, threshold limits. Furthermore, real-time visualization of EM emissions from the time-domain data enables testers to select a more effective scanning trajectory, thus diminishing the likelihood of overlooking areas with high-intensity EM emissions and time-variance sources.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 4","pages":"108-112"},"PeriodicalIF":0.0,"publicationDate":"2023-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10283900","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136303849","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE ELECTROMAGNETIC COMPATIBILITY SOCIETY IEEE电磁兼容性协会
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-09-22 DOI: 10.1109/LEMCPA.2023.3315564
{"title":"IEEE ELECTROMAGNETIC COMPATIBILITY SOCIETY","authors":"","doi":"10.1109/LEMCPA.2023.3315564","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3315564","url":null,"abstract":"","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 3","pages":"C2-C2"},"PeriodicalIF":0.0,"publicationDate":"2023-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/10260712/10260728.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Synopsis of the September 2023 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications 《IEEE电磁兼容性实践与应用快报》2023年9月号简介
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-09-22 DOI: 10.1109/LEMCPA.2023.3308279
{"title":"Synopsis of the September 2023 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications","authors":"","doi":"10.1109/LEMCPA.2023.3308279","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3308279","url":null,"abstract":"Summary form only: Abstracts of articles presented in this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 3","pages":"63-66"},"PeriodicalIF":0.0,"publicationDate":"2023-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/10260712/10260692.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67867180","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Electromagnetic Time Reversal Technique to Locate Partial Discharge in Transformer Winding 变压器绕组局部放电定位的电磁逆时技术
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-09-18 DOI: 10.1109/LEMCPA.2023.3316714
Viral B. Rathod;Ganesh B. Kumbhar;Bhavesh R. Bhalja
{"title":"An Electromagnetic Time Reversal Technique to Locate Partial Discharge in Transformer Winding","authors":"Viral B. Rathod;Ganesh B. Kumbhar;Bhavesh R. Bhalja","doi":"10.1109/LEMCPA.2023.3316714","DOIUrl":"10.1109/LEMCPA.2023.3316714","url":null,"abstract":"This letter introduces a new technique based on electromagnetic time reversal (EMTR) theory to locate partial discharge (PD) in transformer windings. The technique involves measuring PD signals at both ends of the winding, creating a ladder network model of the winding, and subsequently time-reversing and back-injecting the measured PD signals into the ladder network model. The PD current signal energy is then calculated for different guessed PD locations (GPDLs) using the ladder network model, and the actual PD location is identified as the location that corresponds to the maximum energy concentration. Ultimately, the simulation-based validation confirms the capability of the technique to accurately identify the location of PD within transformer winding.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 4","pages":"149-153"},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135502434","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Comprehensive Flowchart to Maximize the Outcome of Direct Power Injection Tests 一个全面的流程图，以最大限度地提高直接动力喷射测试的结果
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-09-18 DOI: 10.1109/LEMCPA.2023.3316712
Pablo J. Gardella;Daniel Lamela;Philippe Dutriez;Eduardo Mariani
{"title":"A Comprehensive Flowchart to Maximize the Outcome of Direct Power Injection Tests","authors":"Pablo J. Gardella;Daniel Lamela;Philippe Dutriez;Eduardo Mariani","doi":"10.1109/LEMCPA.2023.3316712","DOIUrl":"10.1109/LEMCPA.2023.3316712","url":null,"abstract":"The direct power injection (DPI) test method was developed with the intention of achieving a strong correlation and repeatability in measuring the conducted immunity (CI) of integrated circuits (ICs). Nonetheless, in practical implementation, this goal can be compromised by different factors. For example, it is not uncommon to come across DPI tests performed in 3-dB increments. However, this level of uncertainty at 27 dBm could result in peak voltage amplitudes ranging from 5 to 10 V when considering an infinitely high impedance. Furthermore, in the process of finding a failure, only the performance at the threshold where the failure is observed is typically recorded, while the behavior of the IC (before the failure occurs) is ignored. However, this trend carries significant value for IC designers, as failure modes demonstrate a stronger correlation to simulations than absolute levels. This letter introduces a series of enhancements to the DPI flow, specifically targeting the reduction of the result uncertainty, the extraction of maximum information from each test, and the achievement of time-efficient execution. Furthermore, these improvements can be seamlessly extended to accommodate any other conducted or acrlong RI test. Focused on the day-to-day challenges of technicians and engineers, this letter is addressed to individuals interested in enhancing preexisting methodologies for reducing DPI uncertainty, improving test repeatability and its efficiency.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 4","pages":"154-158"},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135502432","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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