A Prescan Method to Accelerate Near-Field Scan Immunity Tests

IF 0.9 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Alexandre Boyer;Fabrice Caignet
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引用次数: 0

Abstract

Near-field scan immunity (NFSI) is a powerful measurement method to diagnose susceptibility issues at printed-circuit board (PCB) and integrated-circuit (IC) levels. However, one limitation of this approach is the excessive measurement time required to build the susceptibility maps, which reveal the sensitive pins or traces of the device under test (DUT). This letter presents a prescan method based on a large-band injection in order to determine rapidly the more relevant scanning positions, the frequency range of interests, and an estimation of the susceptibility level on each scanning position. The prescan provides the configuration parameters of the full NFSI scan in order to keep an acceptable test duration.
加速近场扫描免疫测试的预扫描方法
近场扫描抗扰度(NFSI)是一种功能强大的测量方法,用于诊断印刷电路板(PCB)和集成电路(IC)级的易感性问题。然而,这种方法的一个局限是需要过长的测量时间来绘制易感性图,从而揭示被测设备(DUT)的敏感引脚或迹线。本文介绍了一种基于大波段注入的预扫描方法,以快速确定更相关的扫描位置、感兴趣的频率范围以及每个扫描位置上的易感水平估计值。预扫描提供了完整 NFSI 扫描的配置参数,以保持可接受的测试持续时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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