IEEE Letters on Electromagnetic Compatibility Practice and Applications最新文献_第6页

System-Level Validation of Radiated Noise Source Characterization Using Only Near-Field Magnitude Information 仅使用近场幅度信息对辐射噪声源特性进行系统级验证

IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-11-06 DOI: 10.1109/LEMCPA.2023.3330402

Ze Sun;Yansheng Wang;DongHyun Kim

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A Novel FSS-Based Bandstop Filter for TE/TM Polarization 基于 FSS 的新型 TE/TM 偏振带阻滤波器

IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-10-24 DOI: 10.1109/LEMCPA.2023.3327027

Sourodipto Das;Anil Rajput;Biswajeet Mukherjee

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On-Site Radiated Emissions Result Visualization Using Augmented Reality 使用增强现实的现场辐射排放结果可视化

IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-10-12 DOI: 10.1109/LEMCPA.2023.3324267

Denys Pokotilov;Robert Vogt-Ardatjew;Frank Leferink

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IEEE ELECTROMAGNETIC COMPATIBILITY SOCIETY IEEE电磁兼容性协会

IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-09-22 DOI: 10.1109/LEMCPA.2023.3315564

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Synopsis of the September 2023 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications 《IEEE电磁兼容性实践与应用快报》2023年9月号简介

IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-09-22 DOI: 10.1109/LEMCPA.2023.3308279

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An Electromagnetic Time Reversal Technique to Locate Partial Discharge in Transformer Winding 变压器绕组局部放电定位的电磁逆时技术

IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-09-18 DOI: 10.1109/LEMCPA.2023.3316714

Viral B. Rathod;Ganesh B. Kumbhar;Bhavesh R. Bhalja

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A Comprehensive Flowchart to Maximize the Outcome of Direct Power Injection Tests 一个全面的流程图，以最大限度地提高直接动力喷射测试的结果

IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-09-18 DOI: 10.1109/LEMCPA.2023.3316712

Pablo J. Gardella;Daniel Lamela;Philippe Dutriez;Eduardo Mariani

{"title":"A Comprehensive Flowchart to Maximize the Outcome of Direct Power Injection Tests","authors":"Pablo J. Gardella;Daniel Lamela;Philippe Dutriez;Eduardo Mariani","doi":"10.1109/LEMCPA.2023.3316712","DOIUrl":"10.1109/LEMCPA.2023.3316712","url":null,"abstract":"The direct power injection (DPI) test method was developed with the intention of achieving a strong correlation and repeatability in measuring the conducted immunity (CI) of integrated circuits (ICs). Nonetheless, in practical implementation, this goal can be compromised by different factors. For example, it is not uncommon to come across DPI tests performed in 3-dB increments. However, this level of uncertainty at 27 dBm could result in peak voltage amplitudes ranging from 5 to 10 V when considering an infinitely high impedance. Furthermore, in the process of finding a failure, only the performance at the threshold where the failure is observed is typically recorded, while the behavior of the IC (before the failure occurs) is ignored. However, this trend carries significant value for IC designers, as failure modes demonstrate a stronger correlation to simulations than absolute levels. This letter introduces a series of enhancements to the DPI flow, specifically targeting the reduction of the result uncertainty, the extraction of maximum information from each test, and the achievement of time-efficient execution. Furthermore, these improvements can be seamlessly extended to accommodate any other conducted or acrlong RI test. Focused on the day-to-day challenges of technicians and engineers, this letter is addressed to individuals interested in enhancing preexisting methodologies for reducing DPI uncertainty, improving test repeatability and its efficiency.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 4","pages":"154-158"},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135502432","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A Method for Extracting Plausible Images From EM Leakage Measured at Low Sampling Rates 一种从低采样率下测量的EM泄漏中提取可信图像的方法

IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-08-02 DOI: 10.1109/LEMCPA.2023.3301431

Taiki Kitazawa;Hiroyuki Kubo;Yuichi Hayashi

{"title":"A Method for Extracting Plausible Images From EM Leakage Measured at Low Sampling Rates","authors":"Taiki Kitazawa;Hiroyuki Kubo;Yuichi Hayashi","doi":"10.1109/LEMCPA.2023.3301431","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3301431","url":null,"abstract":"Threats of compromising emanations, which allow malicious eavesdroppers to screen information through electromagnetic (EM) waves that have leaked from video display units (VDUs), are expanding their target devices with the development of low-cost and portable measurement setups. On the other hand, such low-cost instruments have a lower sampling rate than the pixel clock in VDUs; pixel information is lost in the image reconstructed from the measured EM waves, and the quality of the image is also degraded. In this letter, we propose a novel method to reconstruct high-quality images from lower sampling rate observations by a nonnegative linear optimization. Our method can recover clear images even when measuring EM leakage at low sampling rates and fluctuating sampling clocks. To obtain a stable and plausible solution to the optimization problem, we focus on fluctuations in sample points caused by clock jitter in devices and instruments and use pixel information obtained by observing multiple frames. To verify the proposed method, we generated simulated data from leaked EM waves, including screen information, and evaluated the visibility of the reconstructed images. Consequently, the images reconstructed using the proposed method were of the same quality as those reconstructed by applying conventional methods to data measured at a high sampling rate sufficient for information recovery. Moreover, we confirmed that even if the image quality is degraded by a decrease in the signal-to-noise ratio of the observed signal and an increase in the clock jitter, the proposed method can still be used to obtain high-quality reconstructed images by increasing the number of observed frames.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 3","pages":"87-91"},"PeriodicalIF":0.0,"publicationDate":"2023-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/10260712/10201909.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868215","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Analysis of Stair-Like 3-D-Printed Layers for Suppression of Conduction Noise on Microstrip Line 阶梯状3d打印层对微带线传导噪声的抑制分析

IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-08-01 DOI: 10.1109/LEMCPA.2023.3300896

Chung-Yen Hsu;Lih-Shan Chen

引用次数: 0

EMC Uncertainty Simulation Method Based on Improved Kriging Model 基于改进Kriging模型的电磁兼容不确定性仿真方法

IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-07-27 DOI: 10.1109/LEMCPA.2023.3299244

Jinjun Bai;Bing Hu;Zhengyu Xue

引用次数: 0