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IEEE Letters on Electromagnetic Compatibility Practice and Applications最新文献

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Fast and Curious: Exposure of EMI Vulnerability of an Electric Scooter for a Risk-Based EMC Approach 快速而好奇：基于风险的EMC方法暴露电动滑板车的EMI漏洞
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-06-08 DOI: 10.1109/LEMCPA.2023.3284232
Vasiliki Gkatsi;Robert Vogt-Ardatjew;Frank Leferink
{"title":"Fast and Curious: Exposure of EMI Vulnerability of an Electric Scooter for a Risk-Based EMC Approach","authors":"Vasiliki Gkatsi;Robert Vogt-Ardatjew;Frank Leferink","doi":"10.1109/LEMCPA.2023.3284232","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3284232","url":null,"abstract":"Compliance of lone equipment with the electromagnetic compatibility (EMC) standards does not directly result in proper operation when used on the system level, especially in large and complex structures. A more robust way to incorporate possible unwanted behaviors and unpredicted scenarios is to expand the EMC testing by adopting the risk-based EMC approach. This letter addresses an electromagnetic interference (EMI) case caused by a differential mode voltage excitation on a cable harness of an electric scooter focusing on the first step of an EMC assessment procedure, which is the EMI vulnerability investigation. The objective of this research is to detect and expose the vulnerability of a real case study caused by an uncommon cause. This is done by a vector network analyzer measurement and the direct power injection method. The goal of this research is to demonstrate the importance of adopting a risk-based EMC approach while performing EMC testing.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 3","pages":"82-86"},"PeriodicalIF":0.0,"publicationDate":"2023-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/10260712/10146385.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868214","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Design of Nanosecond-Level Transient Electric Field Sensor and Its Application in HVDC Converter Station 纳秒级瞬态电场传感器的设计及其在高压直流换流站中的应用
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-04-26 DOI: 10.1109/LEMCPA.2023.3270405
Shaoyin He;Bohao Zhang;Xiaojun Ni;Peng Qiu;Yu Song;Liang Song
{"title":"Design of Nanosecond-Level Transient Electric Field Sensor and Its Application in HVDC Converter Station","authors":"Shaoyin He;Bohao Zhang;Xiaojun Ni;Peng Qiu;Yu Song;Liang Song","doi":"10.1109/LEMCPA.2023.3270405","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3270405","url":null,"abstract":"In this letter, a nanosecond-level transient electric field (E-field) sensor based on a monopole electrically small rod antenna is proposed. The working principle and design process of the sensor are analyzed in detail while a finite-element simulation is carried out to verify the response characteristics of the sensor both in time and frequency domains, whose upper cut-off frequency can reach 680 MHz. For the purpose of assessing the actual detection capability of the sensor in HVDC converter stations, the sensor designed in this letter was used to detect the transient radiation E-field in the valve hall during the artificial short-circuit test in the Zhoushan ±200-kV five-terminal flexible dc transmission project. The measurement results of the transient E-field indicates that the sensor is able to respond instantaneously to the radiated E-field generated by the operation of the key power electronic equipment in the valve hall. It demonstrates that the designed sensor can be effectively applied in the scenario of the measurement of transient electromagnetic environment and noninvasive situational awareness technology for high-voltage devices in HVDC systems.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 2","pages":"57-61"},"PeriodicalIF":0.0,"publicationDate":"2023-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67861416","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Error Analysis of the Maximum Coupling for HEMP Illumination Tests With EUT Rotations 带EUT旋转的HEMP照明测试的最大耦合误差分析
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-04-17 DOI: 10.1109/LEMCPA.2023.3267741
Yuewu Shi;Xin Nie;Yifu Zhou;Zhizhen Zhu;Wei Chen;Wei Wu
{"title":"Error Analysis of the Maximum Coupling for HEMP Illumination Tests With EUT Rotations","authors":"Yuewu Shi;Xin Nie;Yifu Zhou;Zhizhen Zhu;Wei Chen;Wei Wu","doi":"10.1109/LEMCPA.2023.3267741","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3267741","url":null,"abstract":"The maximum electromagnetic (EM) coupling is directly related to the polarization angle of the incident field in the high-altitude EM pulse (HEMP) illumination test. Aimed at the linear system, this letter analyzed the test error of the maximum coupling corresponding to the change of the angle between the polarization direction and the direction of the equipment under test (EUT) in EMP illumination tests. Characterized by the EM norm, the quantization estimation formula of the maximum coupling test error under illuminations with EUT rotations is deduced. The results show that the maximum measurement accuracy is the cosine of 1/2 of the maximum rotation angle of the EUTs. Finally, a test scheme of five illuminations (with rotations of the EUT and the rotation angle of each rotation is 36°) with 95% test accuracy of the maximum coupling of the method itself is recommended in this letter. The results can provide support for the design and evaluation of the EM illumination test.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 2","pages":"48-52"},"PeriodicalIF":0.0,"publicationDate":"2023-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"68028303","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Impact of Antenna Tilt on Measurements Below 1 GHz in Semi-Anechoic Chamber 天线倾斜对1GHz以下半消声室测量的影响
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-04-10 DOI: 10.1109/LEMCPA.2023.3265771
Krzysztof Sieczkarek;Adam Maćkowiak
{"title":"Impact of Antenna Tilt on Measurements Below 1 GHz in Semi-Anechoic Chamber","authors":"Krzysztof Sieczkarek;Adam Maćkowiak","doi":"10.1109/LEMCPA.2023.3265771","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3265771","url":null,"abstract":"The conditions of measurement of radio disturbance emission are defined in the EN 55016-2-3 standard. It defines the detailed requirements of the measuring system and the methodology of the test. In case of the measurement up to 1 GHz, the antenna height scan is required but there is no regulation regarding the antenna tilt in the current edition of standard. As a result, most laboratories perform measurements of radiated emission with a fixed antenna angle of 0°—the antenna is located in parallel with the ground plane despite the actual height. Knowing that the antenna inclination angle in relation to the emission source affects its characteristics, it can lead to omit the measurement configuration at which the measured field strength is the highest. This letter investigates the influence of receiving antenna inclination angle on measurements of radiated disturbances from a reference emission source and real TV-set.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 2","pages":"37-40"},"PeriodicalIF":0.0,"publicationDate":"2023-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67861418","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Choice of the Parameters of an EMI Monitoring System for an AC Traction Network 交流牵引网EMI监测系统参数的选择
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-03-30 DOI: 10.1109/LEMCPA.2023.3281506
V. Havryliuk
{"title":"Choice of the Parameters of an EMI Monitoring System for an AC Traction Network","authors":"V. Havryliuk","doi":"10.1109/LEMCPA.2023.3281506","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3281506","url":null,"abstract":"The problem of ensuring the electromagnetic compatibility (EMC) of the traction network with railway signaling lines is of practical interest, since electromagnetic interference (EMI) from the traction network can cause malfunctions in the signaling systems. In order to ensure the EMC of traction current with track circuits, which are widely used as track vacancy sensors in front of a moving train, EMI in rails is periodically monitored in accordance with their maintenance schedule, which makes it possible to detect excessive increases in the level of interference in the rails in a timely manner and prevent possible failures in signaling systems. The problem of developing embedded systems for continuous monitoring of harmonics in the traction network lies in the need to ensure the necessary measurement accuracy of the interference monitoring system for a traction network in accordance with the strict requirements of standards. The correct choice of control system parameters is difficult because the traction current is a nonstationary random process. In addition, the alternating traction current has a large dynamic range of harmonic values, with their proximity to each other and to a powerful fundamental harmonic, as well as the limitations inherent in the discrete Fourier transform, associated with the impossibility of simultaneously improving the accuracy of measurements in the time and frequency domains. This leads to the need for compromises when choosing the parameters of the monitoring system. The work is devoted to the practice of applying the theory of analog-to-digital conversion and the windowed Fourier transform to develop a technique for correctly choosing the parameters of an EMI monitoring system for traction lines.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 3","pages":"77-81"},"PeriodicalIF":0.0,"publicationDate":"2023-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868213","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Synopsis of the June 2023 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications 《IEEE电磁兼容性实践与应用快报》2023年6月号简介
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-03-25 DOI: 10.1109/LEMCPA.2023.3275008
{"title":"Synopsis of the June 2023 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications","authors":"","doi":"10.1109/LEMCPA.2023.3275008","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3275008","url":null,"abstract":"Summary form only: Abstracts of articles presented in this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 2","pages":"34-36"},"PeriodicalIF":0.0,"publicationDate":"2023-03-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/10136242/10136355.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67861421","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Synopsis of the March 2023 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications 《IEEE电磁兼容性实践与应用快报》2023年3月号简介
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-03-23 DOI: 10.1109/LEMCPA.2023.3247259
{"title":"Synopsis of the March 2023 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications","authors":"","doi":"10.1109/LEMCPA.2023.3247259","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3247259","url":null,"abstract":"Summary form only: Abstracts of articles presented in this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 1","pages":"2-4"},"PeriodicalIF":0.0,"publicationDate":"2023-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/10079119/10079184.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67856112","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Surface Roughness Effect From Different Surfaces of Microstrip Lines and Reference Plane 微带线和参考平面不同表面的表面粗糙度效应
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-03-16 DOI: 10.1109/LEMCPA.2023.3276923
Yuanzhuo Liu;Yuandong Guo;Chaofeng Li;Xiaoning Ye;Donghyun Kim
{"title":"Surface Roughness Effect From Different Surfaces of Microstrip Lines and Reference Plane","authors":"Yuanzhuo Liu;Yuandong Guo;Chaofeng Li;Xiaoning Ye;Donghyun Kim","doi":"10.1109/LEMCPA.2023.3276923","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3276923","url":null,"abstract":"Microstrip line structures consist of different conductors, such as trace and reference planes, which have different surface roughness levels due to the printed-circuit board manufacturing process. The bottom surface of the trace is often rougher than the top surface of the trace, and the roughness levels of different reference planes vary for different foil types and manufacturing processes. To accurately model the additional conductor loss caused by such differences in microstrip lines, a new modeling method is proposed with different roughness levels on different surfaces and a reference plane, in contrast to the traditional roughness modeling approach, which considers a uniform roughness distribution for all surfaces. The effect of the different surfaces on the resistance is determined by applying additional microstrip models to analyze the effect of surface roughness from different surfaces and to improve the accuracy of insertion loss prediction based on the modeled total resistance.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 3","pages":"92-96"},"PeriodicalIF":0.0,"publicationDate":"2023-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868217","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Characterizing Transient Radio-Frequency Interference From Motors for the Square Kilometer Array Radio Telescopes 平方千米阵列射电望远镜电机瞬态射频干扰特性研究
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-02-24 DOI: 10.1109/LEMCPA.2023.3248641
Abraham J. Otto;Antheun R. Botha;Paul S. Van der Merwe;Treasure Nkawu
{"title":"Characterizing Transient Radio-Frequency Interference From Motors for the Square Kilometer Array Radio Telescopes","authors":"Abraham J. Otto;Antheun R. Botha;Paul S. Van der Merwe;Treasure Nkawu","doi":"10.1109/LEMCPA.2023.3248641","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3248641","url":null,"abstract":"This letter considers the characterization of wideband radio-frequency interference generated by motors, diesel generators, as well as fans for the Square Kilometer Array (SKA) radio telescopes. The transient and/or impulsive nature of the emissions from the equipment, required as part of the telescope or ancillary hardware designs, can have a detrimental impact on highly time-sensitive scientific observations, such as pulsar science or gravitational wave detection. Wideband interference from pulses generated by servo motors with pulse-width modulation drivers, diesel generators, and compressor alternating current fans are presented.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 2","pages":"53-56"},"PeriodicalIF":0.0,"publicationDate":"2023-02-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67861417","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Simplified Constrained Bayesian Optimization Approach to Optimize the Tx Equalization in SerDes Channels SerDes信道中Tx均衡优化的简化约束贝叶斯优化方法
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-02-22 DOI: 10.1109/LEMCPA.2023.3247777
Majid Ahadi Dolatsara
{"title":"A Simplified Constrained Bayesian Optimization Approach to Optimize the Tx Equalization in SerDes Channels","authors":"Majid Ahadi Dolatsara","doi":"10.1109/LEMCPA.2023.3247777","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3247777","url":null,"abstract":"Design of high-speed channels has become increasingly more complicated. Due to the eye diagram closure at higher speeds, designers use Tx equalization by placing a finite impulse response (FIR) filter at Tx. Assigning the FIR tap values can be time consuming and require domain expertise since it can require sweeping hundreds or more combinations of tap values. Therefore, in this letter, we propose a machine learning optimization approach to find the FIR tap values which result in the largest eye opening. Conventional optimization techniques may not be applicable in this context since specifications of the channel can require a constraint, which is the sum of the absolute value of the FIR taps needs to be equal to 1. Therefore, we have developed a simplified constrained Bayesian optimization (BO) approach that can automate this process and expedite calculation of the FIR tap values without requiring domain expertise. Numerical examples are provided to show efficiency of the proposed approach and compare its performance with BO and genetic algorithm for this problem.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 2","pages":"41-47"},"PeriodicalIF":0.0,"publicationDate":"2023-02-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67861419","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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