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IEEE Letters on Electromagnetic Compatibility Practice and Applications最新文献

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Impact of Antenna Tilt on Measurements Below 1 GHz in Semi-Anechoic Chamber 天线倾斜对1GHz以下半消声室测量的影响
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-04-10 DOI: 10.1109/LEMCPA.2023.3265771
Krzysztof Sieczkarek;Adam Maćkowiak
{"title":"Impact of Antenna Tilt on Measurements Below 1 GHz in Semi-Anechoic Chamber","authors":"Krzysztof Sieczkarek;Adam Maćkowiak","doi":"10.1109/LEMCPA.2023.3265771","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3265771","url":null,"abstract":"The conditions of measurement of radio disturbance emission are defined in the EN 55016-2-3 standard. It defines the detailed requirements of the measuring system and the methodology of the test. In case of the measurement up to 1 GHz, the antenna height scan is required but there is no regulation regarding the antenna tilt in the current edition of standard. As a result, most laboratories perform measurements of radiated emission with a fixed antenna angle of 0°—the antenna is located in parallel with the ground plane despite the actual height. Knowing that the antenna inclination angle in relation to the emission source affects its characteristics, it can lead to omit the measurement configuration at which the measured field strength is the highest. This letter investigates the influence of receiving antenna inclination angle on measurements of radiated disturbances from a reference emission source and real TV-set.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 2","pages":"37-40"},"PeriodicalIF":0.0,"publicationDate":"2023-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67861418","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Choice of the Parameters of an EMI Monitoring System for an AC Traction Network 交流牵引网EMI监测系统参数的选择
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-03-30 DOI: 10.1109/LEMCPA.2023.3281506
V. Havryliuk
{"title":"Choice of the Parameters of an EMI Monitoring System for an AC Traction Network","authors":"V. Havryliuk","doi":"10.1109/LEMCPA.2023.3281506","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3281506","url":null,"abstract":"The problem of ensuring the electromagnetic compatibility (EMC) of the traction network with railway signaling lines is of practical interest, since electromagnetic interference (EMI) from the traction network can cause malfunctions in the signaling systems. In order to ensure the EMC of traction current with track circuits, which are widely used as track vacancy sensors in front of a moving train, EMI in rails is periodically monitored in accordance with their maintenance schedule, which makes it possible to detect excessive increases in the level of interference in the rails in a timely manner and prevent possible failures in signaling systems. The problem of developing embedded systems for continuous monitoring of harmonics in the traction network lies in the need to ensure the necessary measurement accuracy of the interference monitoring system for a traction network in accordance with the strict requirements of standards. The correct choice of control system parameters is difficult because the traction current is a nonstationary random process. In addition, the alternating traction current has a large dynamic range of harmonic values, with their proximity to each other and to a powerful fundamental harmonic, as well as the limitations inherent in the discrete Fourier transform, associated with the impossibility of simultaneously improving the accuracy of measurements in the time and frequency domains. This leads to the need for compromises when choosing the parameters of the monitoring system. The work is devoted to the practice of applying the theory of analog-to-digital conversion and the windowed Fourier transform to develop a technique for correctly choosing the parameters of an EMI monitoring system for traction lines.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 3","pages":"77-81"},"PeriodicalIF":0.0,"publicationDate":"2023-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868213","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Synopsis of the June 2023 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications 《IEEE电磁兼容性实践与应用快报》2023年6月号简介
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-03-25 DOI: 10.1109/LEMCPA.2023.3275008
{"title":"Synopsis of the June 2023 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications","authors":"","doi":"10.1109/LEMCPA.2023.3275008","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3275008","url":null,"abstract":"Summary form only: Abstracts of articles presented in this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 2","pages":"34-36"},"PeriodicalIF":0.0,"publicationDate":"2023-03-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/10136242/10136355.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67861421","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Synopsis of the March 2023 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications 《IEEE电磁兼容性实践与应用快报》2023年3月号简介
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-03-23 DOI: 10.1109/LEMCPA.2023.3247259
{"title":"Synopsis of the March 2023 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications","authors":"","doi":"10.1109/LEMCPA.2023.3247259","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3247259","url":null,"abstract":"Summary form only: Abstracts of articles presented in this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 1","pages":"2-4"},"PeriodicalIF":0.0,"publicationDate":"2023-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/10079119/10079184.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67856112","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Surface Roughness Effect From Different Surfaces of Microstrip Lines and Reference Plane 微带线和参考平面不同表面的表面粗糙度效应
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-03-16 DOI: 10.1109/LEMCPA.2023.3276923
Yuanzhuo Liu;Yuandong Guo;Chaofeng Li;Xiaoning Ye;Donghyun Kim
{"title":"Surface Roughness Effect From Different Surfaces of Microstrip Lines and Reference Plane","authors":"Yuanzhuo Liu;Yuandong Guo;Chaofeng Li;Xiaoning Ye;Donghyun Kim","doi":"10.1109/LEMCPA.2023.3276923","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3276923","url":null,"abstract":"Microstrip line structures consist of different conductors, such as trace and reference planes, which have different surface roughness levels due to the printed-circuit board manufacturing process. The bottom surface of the trace is often rougher than the top surface of the trace, and the roughness levels of different reference planes vary for different foil types and manufacturing processes. To accurately model the additional conductor loss caused by such differences in microstrip lines, a new modeling method is proposed with different roughness levels on different surfaces and a reference plane, in contrast to the traditional roughness modeling approach, which considers a uniform roughness distribution for all surfaces. The effect of the different surfaces on the resistance is determined by applying additional microstrip models to analyze the effect of surface roughness from different surfaces and to improve the accuracy of insertion loss prediction based on the modeled total resistance.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 3","pages":"92-96"},"PeriodicalIF":0.0,"publicationDate":"2023-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868217","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Characterizing Transient Radio-Frequency Interference From Motors for the Square Kilometer Array Radio Telescopes 平方千米阵列射电望远镜电机瞬态射频干扰特性研究
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-02-24 DOI: 10.1109/LEMCPA.2023.3248641
Abraham J. Otto;Antheun R. Botha;Paul S. Van der Merwe;Treasure Nkawu
{"title":"Characterizing Transient Radio-Frequency Interference From Motors for the Square Kilometer Array Radio Telescopes","authors":"Abraham J. Otto;Antheun R. Botha;Paul S. Van der Merwe;Treasure Nkawu","doi":"10.1109/LEMCPA.2023.3248641","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3248641","url":null,"abstract":"This letter considers the characterization of wideband radio-frequency interference generated by motors, diesel generators, as well as fans for the Square Kilometer Array (SKA) radio telescopes. The transient and/or impulsive nature of the emissions from the equipment, required as part of the telescope or ancillary hardware designs, can have a detrimental impact on highly time-sensitive scientific observations, such as pulsar science or gravitational wave detection. Wideband interference from pulses generated by servo motors with pulse-width modulation drivers, diesel generators, and compressor alternating current fans are presented.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 2","pages":"53-56"},"PeriodicalIF":0.0,"publicationDate":"2023-02-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67861417","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Simplified Constrained Bayesian Optimization Approach to Optimize the Tx Equalization in SerDes Channels SerDes信道中Tx均衡优化的简化约束贝叶斯优化方法
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-02-22 DOI: 10.1109/LEMCPA.2023.3247777
Majid Ahadi Dolatsara
{"title":"A Simplified Constrained Bayesian Optimization Approach to Optimize the Tx Equalization in SerDes Channels","authors":"Majid Ahadi Dolatsara","doi":"10.1109/LEMCPA.2023.3247777","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3247777","url":null,"abstract":"Design of high-speed channels has become increasingly more complicated. Due to the eye diagram closure at higher speeds, designers use Tx equalization by placing a finite impulse response (FIR) filter at Tx. Assigning the FIR tap values can be time consuming and require domain expertise since it can require sweeping hundreds or more combinations of tap values. Therefore, in this letter, we propose a machine learning optimization approach to find the FIR tap values which result in the largest eye opening. Conventional optimization techniques may not be applicable in this context since specifications of the channel can require a constraint, which is the sum of the absolute value of the FIR taps needs to be equal to 1. Therefore, we have developed a simplified constrained Bayesian optimization (BO) approach that can automate this process and expedite calculation of the FIR tap values without requiring domain expertise. Numerical examples are provided to show efficiency of the proposed approach and compare its performance with BO and genetic algorithm for this problem.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 2","pages":"41-47"},"PeriodicalIF":0.0,"publicationDate":"2023-02-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67861419","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long-Lifespan Systems 结合老化和温度应力评估长寿命系统中电压调节器对直接功率注入的抗扰度
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2023-02-02 DOI: 10.1109/LEMCPA.2023.3240621
Jaber Al Rashid;Mohsen Koohestani;Richard Perdriau;Laurent Saintis;Mihaela Barreau
{"title":"Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long-Lifespan Systems","authors":"Jaber Al Rashid;Mohsen Koohestani;Richard Perdriau;Laurent Saintis;Mihaela Barreau","doi":"10.1109/LEMCPA.2023.3240621","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3240621","url":null,"abstract":"This letter compares the electromagnetic compatibility (EMC) performance of three different voltage regulator integrated circuits (ICs) (i.e., UA78L05, L78L05, and MC78L05) developed by three different manufacturers, with similar functionality and pin compatibility, under the influence of low and high temperature stress conditions (i.e., −30 °C and +100 °C). Direct power injection (DPI) was performed on these ICs to analyze the impact of applying thermal stress on the conducted immunity to the injection of a single-tone RF disturbance signal. The DPI immunity parameters were measured and recorded in real time for an incident amplified power, while the ICs were exposed to low and high thermal stress conditions. It was demonstrated that the minimum injected power required to reach the defined failure threshold voltage criterion \u0000<inline-formula> <tex-math>$(pm 4$ </tex-math></inline-formula>\u0000%) varied over frequency depending on the ICs. Moreover, these functionally identical ICs showed significant evolution of their conducted immunity in all the considered temperatures, depending on their manufacturer. Input impedance curves were monitored at low, high, and nominal temperatures, showing a noticeable decline of impedance at high frequencies. Moreover, the equivalent \u0000<inline-formula> <tex-math>$RLC$ </tex-math></inline-formula>\u0000 values of the lumped elements (i.e., resistor, inductor, and capacitor) were extracted and compared at these aforementioned temperature conditions to model the power supply network impedance for the selected ICs. The immunity behavior of these ICs was further investigated by generating lookup table data from the DPI measurements.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 1","pages":"27-32"},"PeriodicalIF":0.0,"publicationDate":"2023-02-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67856109","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
2022 Index IEEE Letters on Electromagnetic Compatibility Practice and Applications Vol. 4 2022年IEEE电磁兼容性实践与应用指南第4卷
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2022-12-16 DOI: 10.1109/LEMCPA.2022.3229251
{"title":"2022 Index IEEE Letters on Electromagnetic Compatibility Practice and Applications Vol. 4","authors":"","doi":"10.1109/LEMCPA.2022.3229251","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3229251","url":null,"abstract":"Presents the 2022 author/subject index for this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 4","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2022-12-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/9980833/09989517.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67853818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Synopsis of the December 2022 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications 《IEEE电磁兼容性实践与应用快报》2022年12月号综述
IEEE Letters on Electromagnetic Compatibility Practice and Applications Pub Date : 2022-12-12 DOI: 10.1109/LEMCPA.2022.3221229
{"title":"Synopsis of the December 2022 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications","authors":"","doi":"10.1109/LEMCPA.2022.3221229","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3221229","url":null,"abstract":"Summary form only: Abstracts of articles presented in this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 4","pages":"89-91"},"PeriodicalIF":0.0,"publicationDate":"2022-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/9980833/09980835.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67853854","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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