微带线和参考平面不同表面的表面粗糙度效应

IF 0.9 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Yuanzhuo Liu;Yuandong Guo;Chaofeng Li;Xiaoning Ye;Donghyun Kim
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引用次数: 0

摘要

微带线结构由不同的导体组成,如迹线和参考平面,由于印刷电路板的制造工艺,这些导体具有不同的表面粗糙度水平。迹线的底表面通常比迹线的顶表面粗糙,并且不同参考平面的粗糙度水平因不同的箔类型和制造工艺而异。为了准确地对微带线中这种差异引起的额外导体损耗进行建模,与传统的粗糙度建模方法相比,提出了一种新的建模方法,即在不同表面和参考平面上具有不同的粗糙度水平,传统的粗糙率建模方法考虑所有表面的均匀粗糙度分布。通过应用附加的微带模型来分析不同表面的表面粗糙度的影响,并基于建模的总电阻来提高插入损耗预测的准确性,从而确定不同表面对电阻的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Surface Roughness Effect From Different Surfaces of Microstrip Lines and Reference Plane
Microstrip line structures consist of different conductors, such as trace and reference planes, which have different surface roughness levels due to the printed-circuit board manufacturing process. The bottom surface of the trace is often rougher than the top surface of the trace, and the roughness levels of different reference planes vary for different foil types and manufacturing processes. To accurately model the additional conductor loss caused by such differences in microstrip lines, a new modeling method is proposed with different roughness levels on different surfaces and a reference plane, in contrast to the traditional roughness modeling approach, which considers a uniform roughness distribution for all surfaces. The effect of the different surfaces on the resistance is determined by applying additional microstrip models to analyze the effect of surface roughness from different surfaces and to improve the accuracy of insertion loss prediction based on the modeled total resistance.
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