一个全面的流程图,以最大限度地提高直接动力喷射测试的结果

IF 0.9 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Pablo J. Gardella;Daniel Lamela;Philippe Dutriez;Eduardo Mariani
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引用次数: 0

摘要

开发直接功率注入(DPI)测试方法的目的是在测量集成电路(ic)的传导抗扰度(CI)时实现强相关性和可重复性。然而,在实际实现中,这一目标可能会受到不同因素的影响。例如,以3 dB的增量执行DPI测试是很常见的。然而,在考虑无限高阻抗时,27 dBm的这种不确定性水平可能导致峰值电压幅值在5 V到10 V之间。此外,在查找故障的过程中,通常只记录在观察到故障的阈值处的性能,而忽略IC(在故障发生之前)的行为。然而,这种趋势对IC设计师来说具有重要的价值,因为失效模式与模拟的相关性比绝对水平更强。本信函介绍了DPI流程的一系列增强功能,特别是针对减少结果不确定性,从每次测试中提取最大信息以及实现高效执行。此外,这些改进可以无缝扩展,以适应任何其他传导或辐射抗扰度测试。关注技术人员和工程师的日常挑战,这封信是写给有兴趣增强现有方法以减少DPI不确定性,提高测试可重复性及其效率的个人的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Comprehensive Flowchart to Maximize the Outcome of Direct Power Injection Tests
The direct power injection (DPI) test method was developed with the intention of achieving a strong correlation and repeatability in measuring the conducted immunity (CI) of integrated circuits (ICs). Nonetheless, in practical implementation, this goal can be compromised by different factors. For example, it is not uncommon to come across DPI tests performed in 3-dB increments. However, this level of uncertainty at 27 dBm could result in peak voltage amplitudes ranging from 5 to 10 V when considering an infinitely high impedance. Furthermore, in the process of finding a failure, only the performance at the threshold where the failure is observed is typically recorded, while the behavior of the IC (before the failure occurs) is ignored. However, this trend carries significant value for IC designers, as failure modes demonstrate a stronger correlation to simulations than absolute levels. This letter introduces a series of enhancements to the DPI flow, specifically targeting the reduction of the result uncertainty, the extraction of maximum information from each test, and the achievement of time-efficient execution. Furthermore, these improvements can be seamlessly extended to accommodate any other conducted or acrlong RI test. Focused on the day-to-day challenges of technicians and engineers, this letter is addressed to individuals interested in enhancing preexisting methodologies for reducing DPI uncertainty, improving test repeatability and its efficiency.
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