2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)最新文献
J. Vojtěch, O. Havlis, Sarbojeet Bhowmick, Martin Šlapák, P. Munster, T. Horváth, R. Velc, J. Kundrát, L. Altmannova, Rudolf Vohnout, P. Škoda, V. Smotlacha
{"title":"White Rabbit Single Fibre Bidirectional Transmission of Precise Time Using Unconventional Wavelengths","authors":"J. Vojtěch, O. Havlis, Sarbojeet Bhowmick, Martin Šlapák, P. Munster, T. Horváth, R. Velc, J. Kundrát, L. Altmannova, Rudolf Vohnout, P. Škoda, V. Smotlacha","doi":"10.1109/IFCS-ISAF41089.2020.9234815","DOIUrl":"https://doi.org/10.1109/IFCS-ISAF41089.2020.9234815","url":null,"abstract":"In this paper, we present results of experimental two way transmission of precise time over 400 km fully reciprocal bi-directionally amplified optical path outside the telecommunication C band. Used was the White Rabbit system, which combines synchronous Ethernet and Precise Time Protocol (IEEE-1588) however previously developed Time Transfer Adapters should provide slightly better performance.","PeriodicalId":6872,"journal":{"name":"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)","volume":"51 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89751338","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Precision Resonant Beam Strain Sensor Employing Gap-Dependent Frequency Shift","authors":"A. Ozgurluk, C. Nguyen","doi":"10.1109/IFCS-ISAF41089.2020.9234911","DOIUrl":"https://doi.org/10.1109/IFCS-ISAF41089.2020.9234911","url":null,"abstract":"A micromechanical structure for on-chip strain sensing maps strain-induced gap changes to resonance frequency shifts while employing differential strategies to null out bias uncertainty, all towards repeatable measurement of sub-nm displacement changes that equate to sub-$-muvarepsilon$ strain increments. The key enabler here is the use of gap-dependent electrical stiffness to shift resonance frequencies as structural elements stretch or shrink to relieve stress. An output based on the difference frequency between two close proximity structures with unequal stress arm lengths (cf. Fig. 1) removes uncertainty on the initial gap spacing and permits a $206 text{Hz}/muvarepsilon$ scale factor. The ability to precisely measure the frequency of the high-$Q$ (∼4000) structures, down to at least 1 Hz, puts the resolution of this sensor at least $5mathrm{n}varepsilon$ (or 790 Pa for polysilicon). An on-chip highly sensitive strain sensing device like this will likely be instrumental to managing stress changes over the lifetime of micromechanical circuits, such as oscillators and filters.","PeriodicalId":6872,"journal":{"name":"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)","volume":"195 2 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85602791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Secondary Frequency Versus Temperature Compensation of an OCXO Using a Segmented Polynomial Array","authors":"J. Esterline, Dewain Stange","doi":"10.1109/IFCS-ISAF41089.2020.9234937","DOIUrl":"https://doi.org/10.1109/IFCS-ISAF41089.2020.9234937","url":null,"abstract":"The temperature performance of Oven Controlled Crystal Oscillators (OCXOs) and Double Oven Controlled Crystal Oscillators (DOCXOs) have been the pinnacle of quartz crystal frequency versus temperature performance for decades. DOCXOs can provide frequency versus temperature stabilities under +/− 1ppb. This superior performance comes at the cost of the power consumption of running two ovens, as well as footprint impact from the extra circuitry. Wide temperature ranges are also a challenge for DOCXOs due to the need to run the ovens at very high temperatures. This paper focuses on a secondary method of compensating OCXOs for frequency versus temperature performance using a segmented polynomial array compensation. This method of compensation can achieve results unobtainable through conventional compensation methods. A group of eight OCXOs in a $20 text{mm} times 20 text{mm}$ package with SC cut crystals were studied for this paper. The inherent mean frequency versus temperature performance of the most improved unit was ±4.29 ppb over the industrial range of −40 to 85 °C. Using 4 segments to compensate the unit the frequency versus temperature performance was reduced to mean performance of ±0.153 ppb over the industrial range. This is a 28 to 1 improvement over the OCXOs inherent performance. This compensated single oven technology provides superior temperature performance over a wider temperature range with lower power consumption than can be achieved with traditional methods. The theory of this compensation method will be discussed, and data showing the results of frequency versus temperature compensation on the qualification group will be presented.","PeriodicalId":6872,"journal":{"name":"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)","volume":"55 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85640139","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Coleman, J. Walker, Wanlin Zhu, S. Ko, P. Mardilovich, S. Trolier-McKinstry
{"title":"Failure Mechanisms of Lead Zirconate Titanate Thin Films during Electromechanical Loading","authors":"K. Coleman, J. Walker, Wanlin Zhu, S. Ko, P. Mardilovich, S. Trolier-McKinstry","doi":"10.1109/IFCS-ISAF41089.2020.9234833","DOIUrl":"https://doi.org/10.1109/IFCS-ISAF41089.2020.9234833","url":null,"abstract":"Understanding the failure mechanisms of piezoelectric thin films is critical for the commercialization of piezoelectric microelectromechanical systems. This paper describes the failure of $0.6 mu mathrm{m}$ lead zirconate titanate (PZT) thin films on Si wafers with different in-plane stresses under large electric fields. The films failed by a combination of cracking and thermal breakdown events. It was found that the crack initiation and propagation behavior varied with the stress state of the films. The total stress required for crack initiation was estimated to be near 500 MPa. As expected, cracks propagated perpendicular to the maximum tensile stress direction. Thermal breakdown events and cracks were correlated, suggesting coupling between electrical and mechanical failure. It was also found that films that were released from the underlying substrates were less susceptible to failure by cracking. It was proposed that during electric field loading the released film stacks were able to bow and alleviate some of the stress. Released films may also experience enhanced domain wall motion that increases their fracture toughness. The results indicate that both applied stress and clamping conditions play important roles in the electromechancial failure of piezoelectric thin films.","PeriodicalId":6872,"journal":{"name":"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)","volume":"90 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80478167","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Trapped Charge Effect on Composite Lithium Niobate-Silicon Acoustoelectric Delay Lines","authors":"Hakhamanesh Mansoorzare, R. Abdolvand","doi":"10.1109/IFCS-ISAF41089.2020.9234933","DOIUrl":"https://doi.org/10.1109/IFCS-ISAF41089.2020.9234933","url":null,"abstract":"Acoustoelectric delay lines (AEDL) fabricated on a composite lithium niobate-silicon (LN-Si) platform could enable acoustoelectric (AE) nonreciprocity and gain provided that the material properties of the LN-Si heterostructure are properly selected. Among such properties are the carrier density and mobility in the Si substrate. However, the bulk Si properties are subject to substantial perturbation at the LN-Si interface as a result of interfacial trapped charges at dislocations and dangling bond sites. The metal-insulator-semiconductor (MIS) capacitor inherently formed in such heterostructures, however, could allow for some level of control over the Si carrier distribution at the LN film interface. In this work, we demonstrate that the AE gain achieved by the momentum transfer from the carriers drifting in Si and the subsequent nonreciprocity could be fine-tuned and the efficiency of the device could be improved by utilizing the MIS capacitor. The device efficiency is found to be enhanced once the majority electron carriers in n-type Si are slightly depleted at the LN-Si interface resulting in ∼1.5 times improvement in the AE gain at a lower bias current, increasing the efficiency by ∼60%.","PeriodicalId":6872,"journal":{"name":"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)","volume":"12 1","pages":"1-2"},"PeriodicalIF":0.0,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88117581","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IDT-based Acoustic Wave Devices Using Ultrathin Lithium Niobate and Lithium Tantalate","authors":"Shuji Tanaka, M. Kadota","doi":"10.1109/IFCS-ISAF41089.2020.9234811","DOIUrl":"https://doi.org/10.1109/IFCS-ISAF41089.2020.9234811","url":null,"abstract":"Ultrathin lithium niobite (LN) and lithium tantalate (LT) have opened a new era of acoustic wave devices. The performances such as impedance ratio, bandwidth and temperature stability of new types of devices are incredibly high compared with those of conventional ones. The R&D is showing a kind of boom in both industry and academia. In this paper, plate wave devices and HAL (Hetero Acoustic Layer) SAW (surface acoustic wave) devices using ultrathin LN or LT developed by the authors' group are described.","PeriodicalId":6872,"journal":{"name":"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)","volume":"20 1","pages":"1-3"},"PeriodicalIF":0.0,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84245858","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Improved Electromechanical Transduction for PiezoMUMPS HBAR Impedance Sensors","authors":"Jesus Yanez, E. Ledesma, A. Uranga, N. Barniol","doi":"10.1109/IFCS-ISAF41089.2020.9234913","DOIUrl":"https://doi.org/10.1109/IFCS-ISAF41089.2020.9234913","url":null,"abstract":"This study discloses how the distribution of the effective electromechanical coupling in the modes of our HBAR ultrasonic sensors at GHz range is significantly affected by the configuration of layers and materials used for its manufacture. Using analytical models from the literature supported by FEM simulations, frequency bands with greater coupling were found due to the effect of extra materials on the stack. S11 measurement of the devices proved this effect. The foregoing is a glance of how to increase the effective coupling in HBAR modes far distant from the resonance frequency of the piezoelectric element while preserving the high bandwidth and low input impedance inherent to the thin piezoelectric layer, in contrast to the relatively low coupling that can be expected with a similar HBAR of negligible electrodes at such frequencies.","PeriodicalId":6872,"journal":{"name":"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)","volume":"26 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75766544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Segovia-Fernandez, Ernest Ting-Ta Yen, Javier Rojas, T. Tran, M. Chowdhury, P. Smeys
{"title":"An Analytical Model to Predict Extrinsic Aging in BAW Resonators","authors":"J. Segovia-Fernandez, Ernest Ting-Ta Yen, Javier Rojas, T. Tran, M. Chowdhury, P. Smeys","doi":"10.1109/IFCS-ISAF41089.2020.9234907","DOIUrl":"https://doi.org/10.1109/IFCS-ISAF41089.2020.9234907","url":null,"abstract":"This manuscript introduces a 1D analytical model to predict the Bulk Acoustic Wave (BAW) resonator aging when it is due to package stress relaxation. Classical micro-acoustic resonator aging models rely on a logarithmic function to estimate the 10-year instability. However, this function is fitted through experiments and does not take into account the physical stress phenomenon. Instead, our proposed analytical model computes the frequency drift by relating the thermally-induced stress in BAW to the creep response of attached epoxy. To validate the model, we design an experiment in which a type of BAW resonator known as DBAR is attached to a single epoxy layer and subjected to different baking conditions.","PeriodicalId":6872,"journal":{"name":"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)","volume":"2 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89770080","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Vageeswar Rajaram, Sungho Kang, S. Calisgan, Antea Risso, Z. Qian, M. Rinaldi
{"title":"A Zero Standby Power MEMS Switch-based Infrared Sensor with Frequency Output","authors":"Vageeswar Rajaram, Sungho Kang, S. Calisgan, Antea Risso, Z. Qian, M. Rinaldi","doi":"10.1109/IFCS-ISAF41089.2020.9234827","DOIUrl":"https://doi.org/10.1109/IFCS-ISAF41089.2020.9234827","url":null,"abstract":"This paper reports on the first demonstration of an Infrared (IR) sensor based on a micromechanical photoswitch (MP) with frequency-based IR power measurement capability. By leveraging the event-driven narrowband infrared (IR) sensing capability of an MP and an integrated thermal feedback mechanism, we show for the first time a zero standby power IR sensor that can not only detect above-threshold IR power levels (> 600 nW), but also generate a pulse waveform whose frequency (range: 0.58 Hz to 5.34 Hz) is a function of the incident IR power level. The unique capability of zero power detection and variable AC waveform generation from a DC input signal (IR radiation) without additional electronics paves the way for a new class of long-lasting, maintenance-free microdevices with potential applications in large-scale remote IoT sensor networks, biomedical implants and microrobotics.","PeriodicalId":6872,"journal":{"name":"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)","volume":"23 1","pages":"1-3"},"PeriodicalIF":0.0,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79370144","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Review of the Approaches to Improve The Effective Coupling Coefficient of AlN based RF MEMS Resonators","authors":"Yao Zhu, Nan Wang, Chen Liu, Ying Zhang","doi":"10.1109/IFCS-ISAF41089.2020.9234821","DOIUrl":"https://doi.org/10.1109/IFCS-ISAF41089.2020.9234821","url":null,"abstract":"This work reviews various methods which improve the effective coupling coefficient (${k^{2}}_{eff}$) of non-bulk acoustic wave (BAW) aluminum nitride (AlN) based RF MEMS resonators, mainly focusing on the innovative structural design of the resonators. ${k^{2}}_{eff}$ is the key parameter for a resonator in communication applications because it measures the achievable fractional bandwidth of the filter constructed. The resonator's configuration, dimension, material stack and the fabrication process will all have impact on its ${k^{2}}_{eff}$. In this paper, the authors will review the efforts in improving the ${k^{2}}_{eff}$ of piezoelectric MEMS resonators from research community in the past 15 years, mainly from the following three approaches: coupling lateral wave with vertical wave, exciting two-dimensional (2-D) lateral wave, as well as coupling 2-D lateral wave with vertical wave. The material will be limited to AlN family, which is proven to be manageable for manufacturing. The authors will also try to make recommendations to the effectiveness of various approaches and the path forward.","PeriodicalId":6872,"journal":{"name":"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)","volume":"122 1","pages":"1-2"},"PeriodicalIF":0.0,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80982255","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}