Lucas Machado, V. D. Bem, F. Moll, Sergio Gómez, R. Ribas, A. Reis
{"title":"Logic synthesis for manufacturability considering regularity and lithography printability","authors":"Lucas Machado, V. D. Bem, F. Moll, Sergio Gómez, R. Ribas, A. Reis","doi":"10.1109/ISVLSI.2013.6654638","DOIUrl":"https://doi.org/10.1109/ISVLSI.2013.6654638","url":null,"abstract":"This paper presents a novel yield model for integrated circuits manufacturing, considering lithography printability problems as a source of yield loss. The use of regular layouts can improve the printability of IC layouts, but it results in a significant area overhead by introducing regularity. To the best of our knowledge, this is the first approach that considers the tradeoff of cells with different levels of regularity and different area overheads during the logic synthesis, in order to improve overall design yield. A technology remapping tool with such yield model as cost function is proposed and implemented and interesting results are presented.","PeriodicalId":439122,"journal":{"name":"2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116333725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Breaking power delivery walls using voltage stacking","authors":"M. Stan","doi":"10.1109/ISVLSI.2013.6654642","DOIUrl":"https://doi.org/10.1109/ISVLSI.2013.6654642","url":null,"abstract":"The power delivery walls include: power density (power consumption density increases beyond the heat dissipation capabilities of the technology), power and ground power delivery pins (chip power consumption requires increasing numbers of pins), 3DIC power density (physical stacking in the third dimension exacerbates the two dimensional explosion), on-chip power regulation efficiency (relatively poor efficiencies achievable with on-chip regulators limit the effectiveness of many low power schemes). This talk shows how voltage stacking is a comprehensive method for addressing the power delivery walls above, with special emphasis on 3DIC.","PeriodicalId":439122,"journal":{"name":"2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131366361","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"On analyzing and mitigating SRAM BER due to random thermal noise","authors":"Vikram B. Suresh, S. Kundu","doi":"10.1109/ISVLSI.2013.6654652","DOIUrl":"https://doi.org/10.1109/ISVLSI.2013.6654652","url":null,"abstract":"Embedded memory is a major design element in microprocessors and system-on-chips. Typically embedded memories are constituted of SRAM circuits. SRAM cell stability is a major determinant of Vmin for ultra-low power mobile computing. At low voltages, thermal noise plays a role in SRAM cell stability. In this work, we present an analysis of random thermal noise on stability of SRAM bit cells. Of specific concern to us, is the process of device aging, where a transistor performance may degrade over time. A marginal SRAM bit cell that is stable at the time of manufacturing test may become susceptible to random bit flips due to thermal noise under aging related degradation. In order to quantify the impact of random thermal noise on SRAM cell stability, we present a methodology to measure the expected Random Bit Error Rate (BER). Such analysis helps select minimum supply voltage to meet target BER. Next we propose selective multi-level WL control for access transistors of marginal cells to improve their stability during read and write operations. Simulation studies show a BER of ~1 per 106 reads at a low operating voltage of 700mV. The proposed design techniques reduce probability of random bit errors to nearly zero at marginal performance penalty. Application of stochastic analysis to a sample 2MB cache shows >10X improvement in BER and hence improved longevity of marginal cells.","PeriodicalId":439122,"journal":{"name":"2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132725338","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Design & implementation of software defined radios on a homogeneous multi-processor architecture","authors":"Roberto Airoldi, J. Nurmi","doi":"10.1109/ISVLSI.2013.6654646","DOIUrl":"https://doi.org/10.1109/ISVLSI.2013.6654646","url":null,"abstract":"Wireless communications have been one of the main forces behind the growth of microelectronics industry for the past two decades. In fact, the continuous technological advance in the field of wireless communications has required the design and implementation of increasingly complex Systems-on-Chip (SoCs) to cope with the higher complexity of algorithms/communication protocols. Furthermore, in the past few years we have witness a gradual shift towards the implementation of multi-mode and multi-standard transceivers.","PeriodicalId":439122,"journal":{"name":"2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130544306","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Matthew Lewandowski, N. Ranganathan, Matthew Morrison
{"title":"Behavioral model of integrated qubit gates for quantum reversible logic design","authors":"Matthew Lewandowski, N. Ranganathan, Matthew Morrison","doi":"10.1109/ISVLSI.2013.6654658","DOIUrl":"https://doi.org/10.1109/ISVLSI.2013.6654658","url":null,"abstract":"Reversible logic is gaining significant consideration as the potential logic design style for implementation in modern nanotechnology and quantum computing with minimal impact on physical entropy. Recent advances in reversible logic allow schemes for computer architectures using improved quantum computer algorithms. We present a VHDL behavioral model for the design and simulation of the quantum interactions of qubits in theoretical reversible logic structures. Modeling IQ gates, as opposed to only Control-V gates or Toffoli gates, allows for a more robust model that more accurately reflects a theoretical reversible computing structure. This method is an extension to existing programming language and modeling method that allows for reversible logic structures to be designed, simulated, and verified. To the best of our knowledge, this is the first work in the behavioral model of integrated qubit gates.","PeriodicalId":439122,"journal":{"name":"2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126522617","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A novel optimization method for reversible logic circuit minimization","authors":"Matthew Morrison, N. Ranganathan","doi":"10.1109/ISVLSI.2013.6654656","DOIUrl":"https://doi.org/10.1109/ISVLSI.2013.6654656","url":null,"abstract":"Programmable reversible logic is emerging as a prospective logic design style for implementation in modern nanotechnology and quantum computing with minimal impact on circuit heat generation. Recent advances in reversible logic using and quantum computer algorithms allow for improved computer architecture and arithmetic logic unit designs. We present an optimization method for reversible logic synthesis based on the Integrated Qubit (IQ) library. This method works in conjunction with existing methods to further improve quantum cost and delay of a synthesized reversible logic circuit. This algorithm runs in O(N) time, and reduces the quantum cost of synthesized circuit by up to 45 percent. In addition, the process of replacing the gates in the synthesized circuits with IQ gates uses a locally optimal technique whose major benefits include reduction of cost as well as delay.","PeriodicalId":439122,"journal":{"name":"2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","volume":"155 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115262022","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Ankita Arora, Jude Angelo Ambrose, Jorgen Peddersen, S. Parameswaran
{"title":"A double-width algorithmic balancing to prevent power analysis Side Channel Attacks in AES","authors":"Ankita Arora, Jude Angelo Ambrose, Jorgen Peddersen, S. Parameswaran","doi":"10.1109/ISVLSI.2013.6654626","DOIUrl":"https://doi.org/10.1109/ISVLSI.2013.6654626","url":null,"abstract":"Advanced Encryption Standard (AES) is one of the most widely used cryptographic algorithms in embedded systems, and is deployed in smart cards, mobile phones and wireless applications. Researchers have found various techniques to attack the encrypted data or the secret key using Side Channel information (execution time, power variations, electro migration, sound, etc.). Power analysis attack is most prevalent out of all Side Channel Attacks (SCAs), the popular being the Differential Power Analysis (DPA). Balancing of signal transitions is one of the methods by which a countermeasure is implemented. Existing balancing solutions to counter power analysis attacks are either costly in terms of power and area or involve much complexity, hence lacks practicality. This paper for the first time proposes a double-width single core (earlier methods used two separate cores)processor algorithmic balancing to obfuscate power variations resulting in a DPA resistant system. The countermeasure only includes code/algorithmic modifications, hence can be easily deployed in any embedded system with a 16 bits bitwidth (or wider) processor. A DPA attack is demonstrated on the Double Width Single Core (DWSC) solution. The attack proved unsuccessful in finding the correct secret key. The instruction memory size overhead is only 16.6% while data memory increases by 15.8%.","PeriodicalId":439122,"journal":{"name":"2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","volume":"318 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122839348","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Dynamic encryption key design and management for memory data encryption in embedded systems","authors":"Mei Hong, Hui Guo, S. Parameswaran","doi":"10.1109/ISVLSI.2013.6654625","DOIUrl":"https://doi.org/10.1109/ISVLSI.2013.6654625","url":null,"abstract":"To effectively encrypt data memory contents of an embedded processor, multiple keys which are dynamically changed are necessary. However, the resources required to store and manage these keys on-chip (so that they are secure) can be extensive. This paper presents a design where each dynamic key is determined by a random number, a counter value, and a memory address, and is unique to the data in a memory location. The counter value, dedicated to a given memory location, controls the duration of the random number for the key associated with the location. The counter table and random number table are used for key storage. We reduce on-chip resources by customizing the counter table and allowing a pool of random numbers to be shared amongst the keys. The random numbers are dynamically updated during the application execution. We propose a key generation and management scheme such that the random number pool is extremely small (hence low memory consumption) yet sufficient for the uniqueness and randomness of each dynamic key. Experiments on a set of applications show that on average, large overhead (90% on chip area and 92% on power consumption) can be saved for a same security level, when compared to the state-of-the-art approach.","PeriodicalId":439122,"journal":{"name":"2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121218509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A yield-driven regular layout synthesis","authors":"C. Meinhardt, R. Reis","doi":"10.1109/ISVLSI.2013.6654649","DOIUrl":"https://doi.org/10.1109/ISVLSI.2013.6654649","url":null,"abstract":"The continuous devices shrinking has introduced new challenges to integrated circuit design, mainly to deal with the overall yield loss (Beckett 2002). Designers start to take into account process variability impact in the early design stages to successful deal with yield loss. Process variability have a critical effect on integrated circuits increasing power consumption to out of design specifications, accelerating circuit degradation or introducing erroneous circuit functionality. Routing ... This work proposes two main contributions to improve yield: explore regular detailed routing reducing the number of vias and explore new approaches of basic cells in a regular layout synthesis.","PeriodicalId":439122,"journal":{"name":"2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123064246","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Memory subsystem architecture design for multimedia applications","authors":"A. Bonatto, A. Susin","doi":"10.1109/ISVLSI.2013.6654645","DOIUrl":"https://doi.org/10.1109/ISVLSI.2013.6654645","url":null,"abstract":"Multimedia applications for processing high resolution video, data and audio sequences are known to require a high speed and high density memory port. Several hardware modules accessing the same main memory simultaneously generate concurrent accesses and memory conflicts, which reduce the memory port bandwidth and increase data latency. This paper proposes to integrate the SoC modules using an intelligent memory controller, in a memory-centric design approach. Also, it presents a memory system design analysis for a multimedia SoC with an analytical model for latency reduction in a multi-level memory hierarchy.","PeriodicalId":439122,"journal":{"name":"2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","volume":"205 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123017223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}