2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)最新文献_第8页

Towards interdependencies of aging mechanisms 衰老机制的相互依赖

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001394

H. Amrouch, Victor M. van Santen, T. Ebi, Volker Wenzel, J. Henkel

{"title":"Towards interdependencies of aging mechanisms","authors":"H. Amrouch, Victor M. van Santen, T. Ebi, Volker Wenzel, J. Henkel","doi":"10.1109/ICCAD.2014.7001394","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001394","url":null,"abstract":"With technology in deep nano scale, the susceptibility of transistors to various aging mechanisms such as Negative/ Positive Bias Temperature Instability (NBTI/PBTI) and Hot Carrier Induced Degradation (HCID) etc. is increasing. As a matter of fact, different aging mechanisms simultaneously occur in the gate dielectric of a transistor. In addition, scaling in conjunction with high-K materials has made aging mechanisms, that have often been assumed to be negligible (e.g., PBTI in NMOS and HCID in PMOS), become noticeable. Therefore, in this paper we investigate the key challenge of providing designers with an abstracted, yet accurate reliability estimation that combines, from the physical to system level, the effects of multiple simultaneous aging mechanisms and their interdependencies. We show that the overall aging can be modeled as a superposition of the interdependent aging effects. Our presented model deviates by around 6% from recent industrial physical measurements. We conclude from our experiments that an isolated treatment of individual aging mechanisms is insufficient to devise effective mitigation strategies in current and upcoming technology nodes. We also demonstrate that estimating reliability due to an individual dominant aging mechanism together with solely considering a single kind of failures, as currently is a main focus of state-of-the-art (e.g., [28], [22]), can result in 75% underestimation on average.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133257983","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 79

On application of data mining in functional debug 数据挖掘在功能调试中的应用

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001424

Kuo-Kai Hsieh, Wen Chen, Li-C. Wang, J. Bhadra

引用次数: 6

Large-signal MOSFET modeling using frequency-domain nonlinear system identification 基于频域非线性系统辨识的大信号MOSFET建模

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001418

Moning Zhang, Yang Tang, Zuochang Ye

引用次数: 0

Cryptoraptor: High throughput reconfigurable cryptographic processor Cryptoraptor:高吞吐量可重构密码处理器

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001346

Gokhan Sayilar, Derek Chiou

引用次数: 50

Design THINGS for the Internet of Things — An EDA perspective 面向物联网的设计——EDA视角

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001384

G. Qu, Lin Yuan

引用次数: 30

Modeling and analysis of nonstationary low-frequency noise in circuit simulators: Enabling non Monte Carlo techniques 电路模拟器中非平稳低频噪声的建模和分析:启用非蒙特卡罗技术

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001368

A. G. Mahmutoglu, A. Demir

{"title":"Modeling and analysis of nonstationary low-frequency noise in circuit simulators: Enabling non Monte Carlo techniques","authors":"A. G. Mahmutoglu, A. Demir","doi":"10.1109/ICCAD.2014.7001368","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001368","url":null,"abstract":"Modeling and analysis of low frequency noise in circuit simulators with time-varying bias conditions is a long-standing open problem. In this paper, we offer a definite solution for this problem and present a model for low-frequency noise that captures the internal, stochastic dynamics of the individual noise sources via dedicated internal pseudo nodes that are coupled with the rest of the circuit. Our method correctly incorporates the inherent nonstationarity of low-frequency noise into the device model and the circuit simulator. It is based on a probabilistic description of oxide traps in nano-scale devices that individually cause the so-called random telegraph signal (RTS) noise, and, en masse, are believed to be the culprits of other low-frequency noise phenomena, such as 1/f and burst noise. Our model captures the dependence of noise characteristics on the state variables of the circuit. Its simple yet precise mathematical formulation allows the utilization of well-established, non Monte Carlo techniques for nonstationary noise analysis. In one embodiment that we present in this paper, the proposed noise model is used to perform frequency-domain, non Monte Carlo, semi-analytical noise evaluation for circuits under periodic large-signal excitations. For this case, we verify that the computed noise spectral densities match the ones obtained via spectral estimation from timedomain Monte Carlo noise simulation data.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131254632","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 11

Triple patterning lithography aware optimization for standard cell based design 基于标准单元设计的三模光刻感知优化

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.5555/2691365.2691391

Jian Kuang, Wing-Kai Chow, Evangeline F. Y. Young

引用次数: 15

Removing concurrency for rapid functional verification 消除并发性以实现快速功能验证

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001371

S. Longfield, R. Manohar

引用次数: 3

UI-Timer: An ultra-fast clock network pessimism removal algorithm UI-Timer:一种超快速时钟网络悲观去除算法

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.5555/2691365.2691516

Tsung-Wei Huang, Pei-Ci Wu, Martin D. F. Wong

引用次数: 15

Shielding and securing integrated circuits with sensors 带传感器的集成电路的屏蔽和保护

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001348

D. Shahrjerdi, Jeyavijayan Rajendran, S. Garg, F. Koushanfar, R. Karri

{"title":"Shielding and securing integrated circuits with sensors","authors":"D. Shahrjerdi, Jeyavijayan Rajendran, S. Garg, F. Koushanfar, R. Karri","doi":"10.1109/ICCAD.2014.7001348","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001348","url":null,"abstract":"An integrated circuit (IC) Supply Chain Hardware Integrity for Electronics Defense (SHIELD) is envisioned to enable advanced supply chain hardware authentication and tracing capabilities. The suggested SHIELD is expected to be a ultra-lower power, minuscule electronic component that is physically attached to the host IC. This paper focuses on two important adversarial acts on SHIELD: physical reverse engineering and physical side-channel analysis. These attacks can be launched through mechanical or optical means and they can reveal and/or modify the confidential on-chip data or enable reverse-engineering of the design. For detection of these attacks and subsequent erasing of the sensitive data, sensors, erasure devices, and the relevant control circuitry need to be added to the SHIELD. We describe the device-level operation of the optical (photodetectors) and mechanical (nano- or micro-electromechanical switches) sensors and how they can be integrated within an IC to detect physical attacks. The operation of these micro/nano-scale sensors is unreliable due to environmental, operational, and structural fluctuations and noise. We outline system-level approaches to design a reliable countermeasure against physical attacks using unreliable sensors.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131292148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 42