2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)最新文献

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Reduction and IR-drop compensations techniques for reliable neuromorphic computing systems 可靠神经形态计算系统的还原和红外降补偿技术
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001330
Beiye Liu, Hai Helen Li, Yiran Chen, Xin Li, Tingwen Huang, Qing Wu, Mark D. Barnell
{"title":"Reduction and IR-drop compensations techniques for reliable neuromorphic computing systems","authors":"Beiye Liu, Hai Helen Li, Yiran Chen, Xin Li, Tingwen Huang, Qing Wu, Mark D. Barnell","doi":"10.1109/ICCAD.2014.7001330","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001330","url":null,"abstract":"Neuromorphic computing system (NCS) is a promising architecture to combat the well-known memory bottleneck in Von Neumann architecture. The recent breakthrough on memristor devices made an important step toward realizing a low-power, small-footprint NCS on-a-chip. However, the currently low manufacturing reliability of nano-devices and the voltage IR-drop along metal wires and memristors arrays severely limits the scale of memristor crossbar based NCS and hinders the design scalability. In this work, we propose a novel system reduction scheme that significantly lowers the required dimension of the memristor crossbars in NCS while maintaining high computing accuracy. An IR-drop compensation technique is also proposed to overcome the adverse impacts of the wire resistance and the sneak-path problem in large memristor crossbar designs. Our simulation results show that the proposed techniques can improve computing accuracy by 27.0% and 38.7% less circuit area compared to the original NCS design.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"32 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124597091","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 119
ReSCALE: Recalibrating sensor circuits for aging and lifetime estimation under BTI 重新校准传感器电路的老化和寿命估计下的BTI
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001396
Deepashree Sengupta, S. Sapatnekar
{"title":"ReSCALE: Recalibrating sensor circuits for aging and lifetime estimation under BTI","authors":"Deepashree Sengupta, S. Sapatnekar","doi":"10.1109/ICCAD.2014.7001396","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001396","url":null,"abstract":"Bias temperature instability (BTI) induced delay shifts in a circuit depend strongly on its operating environment. While sensors can capture some operating parameters, they are ineffective in measuring vital performance shifts due to changes in the workloads and signal probabilities. This paper determines the delay of an aged circuit by amalgamating more frequent measurements on ring-oscillator sensors with infrequent online delay measurements on a monitored circuit to recalibrate the sensors. Our approach reduces the pessimism in predicting circuit delays, thus permitting lower delay guardbanding overheads compared to conventional methods.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"1128 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125103240","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
A novel linear algebra method for the determination of periodic steady states of nonlinear oscillators 一种确定非线性振子周期稳态的新线性代数方法
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001416
Haotian Liu, Kim Batselier, N. Wong
{"title":"A novel linear algebra method for the determination of periodic steady states of nonlinear oscillators","authors":"Haotian Liu, Kim Batselier, N. Wong","doi":"10.1109/ICCAD.2014.7001416","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001416","url":null,"abstract":"Periodic steady-state (PSS) analysis of nonlinear oscillators has always been a challenging task in circuit simulation. We present a new way that uses numerical linear algebra to identify the PSS(s) of nonlinear circuits. The method works for both autonomous and excited systems. Using the harmonic balancing method, the solution of a nonlinear circuit can be represented by a system of multivariate polynomials. Then, a Macaulay matrix based root-finder is used to compute the Fourier series coefficients. The method avoids the difficult initial guess problem of existing numerical approaches. Numerical examples show the accuracy and feasibility over existing methods.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130824716","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Data-parallel simulation for fast and accurate timing validation of CMOS circuits 数据并行仿真用于快速准确的CMOS电路时序验证
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001324
E. Schneider, S. Holst, X. Wen, H. Wunderlich
{"title":"Data-parallel simulation for fast and accurate timing validation of CMOS circuits","authors":"E. Schneider, S. Holst, X. Wen, H. Wunderlich","doi":"10.1109/ICCAD.2014.7001324","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001324","url":null,"abstract":"Gate-level timing simulation of combinational CMOS circuits is the foundation of a whole array of important EDA tools such as timing analysis and power-estimation, but the demand for higher simulation accuracy drastically increases the runtime complexity of the algorithms. Data-parallel accelerators such as Graphics Processing Units (GPUs) provide vast amounts of computing performance to tackle this problem, but require careful attention to control-flow and memory access patterns. This paper proposes the novel High-Throughput Oriented Parallel Switch-level Simulator (HiTOPS), which is especially designed to take full advantage of GPUs and provides accurate timesimulation for multi-million gate designs at an unprecedented throughput. HiTOPS models timing at transistor granularity and supports all major timing-related effects found in CMOS including pattern-dependent delay, glitch filtering and transition ramps, while achieving speedups of up to two orders of magnitude compared to traditional gate-level simulators.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"316 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127846406","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space 基于高维变分空间子集仿真的罕见电路故障事件快速统计分析
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001370
Shupeng Sun, Xin Li
{"title":"Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space","authors":"Shupeng Sun, Xin Li","doi":"10.1109/ICCAD.2014.7001370","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001370","url":null,"abstract":"In this paper, we propose a novel subset simulation (SUS) technique to efficiently estimate the rare failure rate for nanoscale circuit blocks (e.g., SRAM, DFF, etc.) in high-dimensional variation space. The key idea of SUS is to express the rare failure probability of a given circuit as the product of several large conditional probabilities by introducing a number of intermediate failure events. These conditional probabilities can be efficiently estimated with a set of Markov chain Monte Carlo samples generated by a modified Metropolis algorithm, and then used to calculate the rare failure rate of the circuit. To quantitatively assess the accuracy of SUS, a statistical methodology is further proposed to accurately estimate the confidence interval of SUS based on the theory of Markov chain Monte Carlo simulation. Our experimental results of two nanoscale circuit examples demonstrate that SUS achieves significantly enhanced accuracy over other traditional techniques when the dimensionality of the variation space is more than a few hundred.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"105 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117311715","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 32
A zonotoped macromodeling for reachability verification of eye-diagram in high-speed I/O links with jitter 带抖动的高速I/O链路眼图可达性验证的分区宏建模
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001428
Sai Manoj Pudukotai Dinakarrao, Hao Yu, Chenjie Gu, Cheng Zhuo
{"title":"A zonotoped macromodeling for reachability verification of eye-diagram in high-speed I/O links with jitter","authors":"Sai Manoj Pudukotai Dinakarrao, Hao Yu, Chenjie Gu, Cheng Zhuo","doi":"10.1109/ICCAD.2014.7001428","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001428","url":null,"abstract":"With the use of zonotope to model uncertainty of input data pattern (or jitter), a reachability-based verification is developed in this paper to compute the worst-case eye-diagram. The proposed zonotope-based reachability analysis can consider both spatial and temporal variations in one-time simulation of high-speed I/O links. Moreover, nonlinear zonotoped macromodeling is developed to reduce the verification complexity. As shown by experiments, the zonotoped macromodel achieves up to 450× speedup compared to the Monte Carlo simulation of the original model within small error under specified macromodel order for highspeed I/O links verification.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133902100","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Opportunistic through-silicon-via inductor utilization in LC resonant clocks: Concept and algorithms LC谐振时钟中机会通硅电感的应用:概念和算法
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001435
Umamaheswara Rao Tida, V. Mittapalli, Cheng Zhuo, Yiyu Shi
{"title":"Opportunistic through-silicon-via inductor utilization in LC resonant clocks: Concept and algorithms","authors":"Umamaheswara Rao Tida, V. Mittapalli, Cheng Zhuo, Yiyu Shi","doi":"10.1109/ICCAD.2014.7001435","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001435","url":null,"abstract":"LC resonant clock is an attracting option for low power on-chip clock distribution designs. However, a major limiting factor to its implementation is the large area overhead due to the conventional spiral inductors. On the other hand, idle through-silicon-vias (TSVs) in three-dimensional integrated circuits (3D ICs) can form vertical inductors with minimal footprint and little noise coupling with horizontal traces, particularly suitable for the application of LC resonant clock. However, due to the strict constraints on the location of idle TSVs, the use of the TSV inductor is limited by the constrained choices of its location, inductance and quality factor. Moreover, these TSV inductors can be in any orientation with any distance apart, thereby causing complicated coupling effects. In this paper, we present a novel scheme to opportunistically use idle TSVs to form inductors in LC resonant clock of 3D ICs for maximum power reduction. We formulate the problem and devise a greedy algorithm to efficiently solve it. Experimental results on a few industrial designs show that compared with the conventional resonant clock designs using spiral inductors, our scheme with TSV inductors can reduce the inductor footprint by up to 6.30x with the same power consumption. Especially these TSV inductors are formed by existing idle TSVs so they essentially come for free. To the best of the authors' knowledge, this is the very first work to apply TSV inductors to the resonant CDN.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133445112","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Smart grid load balancing techniques via simultaneous switch/tie-line/wire configurations 智能电网负载平衡技术通过同步开关/联络线/电线配置
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001380
I. Jiang, Gi-Joon Nam, Hua-Yu Chang, S. Nassif, J. Hayes
{"title":"Smart grid load balancing techniques via simultaneous switch/tie-line/wire configurations","authors":"I. Jiang, Gi-Joon Nam, Hua-Yu Chang, S. Nassif, J. Hayes","doi":"10.1109/ICCAD.2014.7001380","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001380","url":null,"abstract":"Fast changing power distribution systems request a dynamic system configuration capability of reacting to volatile consumption demands in an economical way. Load balancing in power distribution systems is an essential technique for smart grid that enables reliable electricity delivery to end customers. This paper is the first work focusing on load balancing using switch reconfiguration, tie-line addition, and wire upgrade simultaneously, while existing works adopt only one of the three techniques to configure the power distribution system. We observe that the new load balancing problem induces a new challenge, dynamic topology rotation, which cannot be handled by existing solutions. To overcome this challenge, we first consider bidirectional power flows and formulate the load balancing problem as a mixed-integer quadratically constrained quadratic program (MIQCQP). To reduce the computational complexity, it is further transformed into a mixed-integer linear program (MILP) without loss of optimality. Experimental results show that, on real power distribution networks, our approach produces optimal solutions that are unlikely to be found in ad-hoc heuristics methods.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"65 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114795479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Cellular neural networks for image analysis using steep slope devices 使用陡坡装置的细胞神经网络图像分析
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001337
Indranil Palit, Qiuwen Lou, M. Niemier, B. Sedighi, J. Nahas, X. Hu
{"title":"Cellular neural networks for image analysis using steep slope devices","authors":"Indranil Palit, Qiuwen Lou, M. Niemier, B. Sedighi, J. Nahas, X. Hu","doi":"10.1109/ICCAD.2014.7001337","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001337","url":null,"abstract":"Traditional CMOS based von Neumann architectures face daunting challenges in performing complex computational tasks at high speed and with low power on spatio-temporal data, e.g., image processing, pattern recognition, etc. In this study, we discuss the utilities of various steep slope, beyond-CMOS emerging devices for image processing applications within the non-von Neumann computing paradigm of cellular neural networks (CNNs). In general, the steep subthreshold swing of the devices obviates the output transfer hardware used in a conventional CNN cell. For image processing with binary stable outputs, Tunnelling FETs (TFETs) can facilitate low power operation. For multi-valued problems, devices like graphene transistors, Symmetric tunnelling FETs (SymFETs) might be leveraged to solve a problem with fewer computational steps. The potential for additional hardware reduction when compared to functional equivalents via conventional CNNs is also possible. Emerging devices can also lead to lower power implementations of the voltage controlled current sources (VCCSs) that are an integral component of any CNN cell. Furthermore, non-linear implementations of the VCCSs via emerging devices could enable simpler computational paths for many image processing tasks.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"174 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116131244","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
A non-volatile memory based physically unclonable function without helper data 一种基于非易失性内存的不带辅助数据的物理不可克隆函数
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001345
Wenjie Che, J. Plusquellic, S. Bhunia
{"title":"A non-volatile memory based physically unclonable function without helper data","authors":"Wenjie Che, J. Plusquellic, S. Bhunia","doi":"10.1109/ICCAD.2014.7001345","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001345","url":null,"abstract":"Stability across environmental variations such as temperature and voltage, is critically important for Physically Unclonable Functions (PUFs). Nearly all existing PUF systems to date need a mechanism to deal with “bit flips” when exact regeneration of the bitstring is required, e.g., for cryptographic applications. Error correction (ECC) and error avoidance schemes have been proposed but both of these require helper data to be stored for the regeneration process. Unfortunately, helper data adds time and area overhead to the PUF system and provides opportunities for adversaries to reverse engineer the secret bitstring. In this paper, we propose a non-volatile memory-based (NVM) PUF that is able to avoid bit flips without requiring any type of helper data. A voltage-to-digital converter technique is described for digitizing the analog entropy source and a robust median-finding algorithm is proposed as the reprograming strategy. Analysis on published experimental data is presented to demonstrate the practicability of our proposed strategy. We describe the technique in the context of emerging nano-devices, in particular, resistive random access memory (Memristor) cells, but the methodology is applicable to any type of NVM including Flash.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121217142","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 60
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