2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)最新文献_第3页

BIST-PUF: Online, hardware-based evaluation of physically unclonable circuit identifiers BIST-PUF:基于硬件的物理不可克隆电路标识符的在线评估

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001347

S. Hussain, Sudha Yellapantula, Mehrdad Majzoobi, F. Koushanfar

{"title":"BIST-PUF: Online, hardware-based evaluation of physically unclonable circuit identifiers","authors":"S. Hussain, Sudha Yellapantula, Mehrdad Majzoobi, F. Koushanfar","doi":"10.1109/ICCAD.2014.7001347","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001347","url":null,"abstract":"Physical Unclonable Functions (PUF) are of increasing importance due to their many hardware security applications including chip fingerprinting, metering, authentication, anti-counterfeiting, and supply-chain tracing, e.g., DARPA SHIELD. This paper presents BIST-PUF, the first built-in-self-test (BIST) methodology for online evaluation of weak and strong PUFs. BIST-PUF provides a paradigm shift in the evaluation of the un-clonable circuit identifiers: unlike earlier known PUF evaluation suites that are software-based and offline, BIST-PUF enables on-the-fly assessment of the desired PUF properties all in hardware. More specifically, the BIST-PUF structure is designed to evaluate two main properties of PUFs, namely unpredictability and stability. These properties are important for ensuring robustness and security in face of operational, structural, and environmental fluctuations due to variations, aging or adversarial acts. For BIST-PUF unpredictability evaluation, we identify and adopt the tests of randomness that are amenable to hardware implementation. For stability assessment, the BIST-PUF suggests three distinct methods, namely, sensor-based, parametric interrogation, and multiple interrogations. Proof-of-concept implementation of the BIST-PUF in FPGA demonstrates its low overhead, effectiveness, and practicality.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131378180","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 22

Reinforcement learning based self-adaptive voltage-swing adjustment of 2.5D I/Os for many-core microprocessor and memory communication 基于强化学习的多核微处理器和存储器通信2.5D I/ o自适应摆压调节

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001356

Hantao Huang, Sai Manoj Pudukotai Dinakarrao, Dongjun Xu, Hao Yu, Zhigang Hao

引用次数: 12

BDD-based synthesis of reconfigurable single-electron transistor arrays 基于bdd的可重构单电子晶体管阵列合成

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001328

Zheng Zhao, Chian-Wei Liu, Chun-Yao Wang, Weikang Qian

引用次数: 9

Self-learning MIMO-RF receiver systems: Process resilient real-time adaptation to channel conditions for low power operation 自学习MIMO-RF接收机系统:过程弹性实时适应低功耗操作的信道条件

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001430

D. Banerjee, B. Muldrey, Shreyas Sen, Xian Wang, A. Chatterjee

{"title":"Self-learning MIMO-RF receiver systems: Process resilient real-time adaptation to channel conditions for low power operation","authors":"D. Banerjee, B. Muldrey, Shreyas Sen, Xian Wang, A. Chatterjee","doi":"10.1109/ICCAD.2014.7001430","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001430","url":null,"abstract":"Prior research has established that dynamically trading-off the performance of the RF front-end for reduced power consumption across changing channel conditions, using a feedback control system that modulates circuit and algorithmic level \"tuning knobs\" in real-time, leads to significant power savings. It is also known that the optimal power control strategy depends on the process conditions corresponding to the RF devices concerned. This complicates the problem of designing the feedback control system that guarantees the best control strategy for minimizing power consumption across all channel conditions and process corners. Since this problem is largely intractable due to the complexity of simulation across all channel conditions and process corners, we propose a self-learning strategy for adaptive MIMO-RF systems. In this approach, RF devices learn their own performance vs. power consumption vs. tuning knob relationships \"on-the-fly\" and formulate the optimum reconfiguration strategy using neural-network based learning techniques during real-time operation. The methodology is demonstrated for a MIMO-RF receiver front-end and is supported by hardware validation leading to 2.5X power savings in minimal learning time.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132295328","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 11

Data-aware DRAM refresh to squeeze the margin of retention time in hybrid memory cube 数据感知的DRAM刷新压缩混合内存立方体的保留时间

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001366

Yinhe Han, Ying Wang, Huawei Li, Xiaowei Li

{"title":"Data-aware DRAM refresh to squeeze the margin of retention time in hybrid memory cube","authors":"Yinhe Han, Ying Wang, Huawei Li, Xiaowei Li","doi":"10.1109/ICCAD.2014.7001366","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001366","url":null,"abstract":"With the increase of storage density, DRAM refresh leads to higher overhead of power and bandwidth, particularly in emerging 3D stacked memory design like Hybrid Memory Cube (HMC). To exploit the hardware resources for a smarter solution, we propose a data-aware refresh control scheme, Trial and Error (Trial-n-Error), which leverages the data-pattern dependence characteristics of the cells' retention time to reduce refresh operations. Trial-n-Error is a systematic approach that employs our proposed Synergy Testing to capture the refresh bottleneck of DRAM memory: “weak” cells that have a relatively shorter retention time. By locating the dominant weak cells sensitized by applications, Trial-n-Error can avoid the worst-case refresh setting, and adjust the refresh rate under the control of our self-tuning algorithm. Thus, Trial-n-Error can gradually approach to the possible lower-bound of refresh rate for less energy and memory bandwidth consumption. In experiments of 3D-stacked DRAMs, we successfully eliminate an average of 28% refresh operations and save 21% refresh energy for a set of pre-profiled synthetic data patterns and real benchmarks.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134445951","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 19

IR-drop based electromigration assessment: Parametric failure chip-scale analysis 基于红外降的电迁移评估:参数失效芯片级分析

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001387

V. Sukharev, Xin Huang, Hai-Bao Chen, S. Tan

引用次数: 23

Workload dependent evaluation of thin-film thermoelectric devices for on-chip cooling and energy harvesting 片上冷却和能量收集用薄膜热电器件的负荷依赖性评价

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001402

S. H. Choday, K. Kwon, K. Roy

{"title":"Workload dependent evaluation of thin-film thermoelectric devices for on-chip cooling and energy harvesting","authors":"S. H. Choday, K. Kwon, K. Roy","doi":"10.1109/ICCAD.2014.7001402","DOIUrl":"https://doi.org/10.1109/ICCAD.2014.7001402","url":null,"abstract":"The recent advances in thin-film thermoelectric (TE) materials have created opportunities for on-chip cooling and energy-harvesting with heat-fluxes >100W/cm2. However, it remains unclear how effective these materials are in the context of realistic microprocessor floorplan and workloads. Moreover, these TE materials suffer from contact parasitics that can significantly impact their performance. To evaluate the workload dependent performance of on-chip TE devices, we developed a hierarchical simulation methodology that connects an architectural simulator and a power estimation tool with a thermal simulator capable of simulating TE devices. The well-known HotSpot thermal simulator is modified to incorporate TE equations along with contact parasitics in the TE module. SimpleScalar and McPAT were used to generate the runtime power of different functional units in an Out-of-Order processor across the SPEC2000 workloads. The power-map generated by McPAT is used by our TE enhanced HotSpot simulator to evaluate the cooling and harvesting capabilities of on-chip TE modules. Our results indicate that it is possible to obtain 11°C peak cooling at the hot-spots, or harvest upto 85mW of power from the hot-spots. We also show that on-chip TE devices can aid in boosting the clock frequency of the processor from 1200MHz to 1600MHz under iso-temperature comparison with the no-TE case. This framework also allows for the rapid design space exploration of TE module's material/physical parameters and the optimum placement options for the TE module on the chip floorplan.","PeriodicalId":426584,"journal":{"name":"2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125492971","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Multithreaded pipeline synthesis for data-parallel kernels 数据并行内核的多线程管道合成

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001431

Mingxing Tan, B. Liu, Steve Dai, Zhiru Zhang

引用次数: 25

Efficient and effective packing and analytical placement for large-scale heterogeneous FPGAs 大规模异构fpga的高效封装和分析安置

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001421

Yu-Chen Chen, Sheng-Yen Chen, Yao-Wen Chang

引用次数: 32

Modeling oscillator arrays for video analytic applications 为视频分析应用建模振荡器阵列

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Pub Date : 2014-11-03 DOI: 10.1109/ICCAD.2014.7001336

Yan Fang, V. Yashin, Andrew J. Seel, Brandon B. Jennings, Reggie Barnett, D. Chiarulli, S. Levitan

引用次数: 5