{"title":"Analysis of Mobility, Volatility, Morphology, Physical States, and Oxidation Stability of Selected Contact Lubricants","authors":"J. Sinclair","doi":"10.1109/TPHP.1977.1135185","DOIUrl":"https://doi.org/10.1109/TPHP.1977.1135185","url":null,"abstract":"The increasingly strenuous and variable thermal environments in which static gold-plated contacts must operate has generated a need for expanded information on the physical properties of traditional and new lubricant materials. This work investigated the mobilities, volatilities, oxidation stabilities, morphologies, and physical states of microcrystalline waxes, synthesized hydrocarbons, polyphenyl ether, di-2-ethylhexylsebacate, and polyethylene glycol over a wide temperature range. The mobilities of the microcrystalline waxes, high viscosity synthesized hydrocarbons, polyphenyl ether, and polyethylene glycol were all very low. The relative volatilities were: di-2-ethylhexylsebacate > low viscosity synthesized hydrocarbon > polyethylene glycol > polyphenyl ether > microcrystalline wax> high viscosity synthesized hydrocarbon. Oxidation tests indicated that the microcrystalline waxes and synthesized hydrocarbons were mildly sensitive to oxidation. Morphologies of thin films, determined up to 150°C with scanning electron microscope, were variable. The microcrystalline waxes and high viscosity synthesized hydrocarbons existed as generally uniform films with some clustering. The di-2-ethylhexylsebacate produced a very uniform film, and the polyphenyl ether distributed itself in a beaded nonwetting manner.","PeriodicalId":387212,"journal":{"name":"IEEE Transactions on Parts, Hybrids, and Packaging","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1977-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134565001","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Oxygen Embrittlement of Copper Leads","authors":"N. Panousis, B. Wonsiewicz, L. Condra","doi":"10.1109/TPHP.1977.1135182","DOIUrl":"https://doi.org/10.1109/TPHP.1977.1135182","url":null,"abstract":"Electrolytic tough pitch copper (known as ETP, CDA110, or copper alloy no. 110) is a material used in the manufacture of external leads for hybrid integrated circuits. Cracking during the formation of 90° bends and the relatively poor cyclic fatigue behavior of this material are identified as due to embrittlement caused by second-phase oxide inclusions. Optical and SEM examinations of failures led to the following model for embrittlement. Under the applied loads, voids nucleate at the second-phase inclusions; continued loading causes the voids to grow and coalesce, resulting in a fracture. This model is consistent with the published literature. Cyclic fatigue behavior, i.e., the median number of cycles to failure (MCTF), was found to vary inversely with the oxygen concentration. Over the range 10-650 ppm oxygen (by weight), the fatigue results could be represented by [100/MCTF] = 0.0228 [ppm oxygen] + 8.32. For both CDA110 and oxygen-free copper (CDA102 or copper alloy no. 102) the MCTF was found to vary inversely with the percent of bond deformation over the 10-60-percent range. Therefore, all cyclic fatigue comparisons among the various CDA110 and CDA102 specimens were made at a common bond deformation, chosen to be 35 percent. Oxygen-free copper with ~10 ppm oxygen was found to have about twice the MCTF as CDA110 with ~400 ppm oxygen.","PeriodicalId":387212,"journal":{"name":"IEEE Transactions on Parts, Hybrids, and Packaging","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1977-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123795208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Stability of BaTiO 3 Ceramics Doped with Dy for High-Voltage Capacitor Use","authors":"T. Nozawa, J. Kato, T. Murakami, A. Yamaji","doi":"10.1109/TPHP.1977.1135186","DOIUrl":"https://doi.org/10.1109/TPHP.1977.1135186","url":null,"abstract":"For a small-size high-voltage capacitor for power separation filter (PSF) use, corona noises, capacitor characteristics changes, and the life characteristics of Dy-doped BaTiO 3 ceramics have been discussed. Noises caused by corona discharges are sufficiently small to meet the PSF requirement at an applied field below 2 kV/mm. The capacitance change with time for 20 years is estimated to be -5 percent, for use at 0-85°C and below 3 kV/mm. The life of the ceramic is expected to be more than 20 years; under normal temperature and below 2 kV/mm In association with the previously reported result on Dy-doped BaTiO 3 ceramics, the PSF capacitors made from small-grained BaTiO 3 ceramics doped with 0.8 atomic percent Dy will be operated for 20 years with small corona noise, without breakdown, and with a maximum capacitance variation of +7 to -14 percent.","PeriodicalId":387212,"journal":{"name":"IEEE Transactions on Parts, Hybrids, and Packaging","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1977-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133498438","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Resistance Increases in Gold Aluminum Interconnects with Time and Temperature","authors":"D. Bushmire","doi":"10.1109/TPHP.1977.1135189","DOIUrl":"https://doi.org/10.1109/TPHP.1977.1135189","url":null,"abstract":"Increases in the resistance of gold aluminum interconnects with time and temperature were investigated. Aluminum wife was ultrasonically bonded to Cr-Au and TiPd-Au thin-film metallization on ceramic substrates. The interconnects were exposed to temperatures from 150 to 300°C for times up to 400 h. The resistance of the interconnects was measured periodically during the exposure to elevated temperatures. There were significant increases in resistance on both types of metallization. Some measurements indicated electrically open interconnects, but the mechanical strength remained high. If systems containing gold aluminum interconnects axe anticipated to be processed or used at Or above 150°C, serious consideration should be given to the effects of increased resistance on circuit performance.","PeriodicalId":387212,"journal":{"name":"IEEE Transactions on Parts, Hybrids, and Packaging","volume":"146 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1977-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130953320","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Energy Storage Capacitors of Very High Energy Density","authors":"R. Parker","doi":"10.1109/TPHP.1977.1135188","DOIUrl":"https://doi.org/10.1109/TPHP.1977.1135188","url":null,"abstract":"A detailed discussion of the design and manufacture of reliable high-energy-density pulse-discharge capacitors is presented. Electrical design and thermal analysis of single sections are described and illustrated with actual test data. The physics of failure of high voltage capacitors is explored, and its application to the design and manufacturing process displayed. A unique winding method allowing the direct fabrication of fiat sections without mechanical flattening is described. Modified drying and impregnation cycles that produce wrinkle-free sections with oil resistivity above 2 X 1015 Omega ·cm are given. Life and energy density data from full pulse-forming network (PFN) pulse tests and from simulated PFN tests show 550 J/kg (250 J/lb) at 250 pps.","PeriodicalId":387212,"journal":{"name":"IEEE Transactions on Parts, Hybrids, and Packaging","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1977-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122340257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Correlation Between Thick-Film Resistance Values","authors":"A. Thorbjornsen, M. Dvorack, A. Riad","doi":"10.1109/TPHP.1977.1135192","DOIUrl":"https://doi.org/10.1109/TPHP.1977.1135192","url":null,"abstract":"Experiments have been performed with thick-film resistor arrays which provide information about ,the correlation between the values of untrimmed thick-film resistors. The results confirm that such a correlation does exist and is approximately inversely proportional to the distance separating two resistors. The results also show that the resistor area has a small effect on the correlation and that the resistor aspect ratio has very little effect. The results indicate that the correlation coefficient between thick-film resistors is always positive. The most important result is that there is a significant amount of correlation between two resistors on a substrate that are made of different pastes. This last correlation is caused by the common conductor printing step.","PeriodicalId":387212,"journal":{"name":"IEEE Transactions on Parts, Hybrids, and Packaging","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1977-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114527828","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Kinetics of Thermocompression Bonding to Organic Contaminated Gold Surfaces","authors":"J. Jellison","doi":"10.1109/TPHP.1977.1135191","DOIUrl":"https://doi.org/10.1109/TPHP.1977.1135191","url":null,"abstract":"The kinetics of thermocompression gold ball bonding were studied for gold metallization contaminated with organic films. The contaminants studied were residual photoresist and atmospheric contamination. For gold metallization contaminated with organic films, thermo-compression gold bonding is a two-stage process. The first stage occurs within a fraction of a second and results from the mechanical disruption of barrier films by shear displacements at the faying surface. Bonding during this initial stage is a strong function of the interface temperature, the bonding force, and the contaminant films. The second stage involves growth of the metal-metal interfaces by a sintering phenomenon. Growth of bonds by sintering also occurs in the absence of external loads though at a decreased rate. Analysis of the rate data leads to the conclusion that the growth mechanism follows a parabolic rate law and, in the absence of external loads, exhibits an activation energy of approximately 11 kcal/mole. Under high external loads, the rate of second-stage growth exhibited little temperature dependence, indicative of a stress-assisted process. Bond growth rates for the atmospherically contaminated metallization were an order of magnitude higher than that for the photoresist contaminated samples.","PeriodicalId":387212,"journal":{"name":"IEEE Transactions on Parts, Hybrids, and Packaging","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1977-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133313619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Production Parylene Coating Process for Hybrid Microcircuits","authors":"V. Kale, T. Riley","doi":"10.1109/TPHP.1977.1135214","DOIUrl":"https://doi.org/10.1109/TPHP.1977.1135214","url":null,"abstract":"Application of Parylene for protecting microelectronic circuits from loose particles and external environment has been visualized for many years. With a joint effort by NASA and TMD, a process has now been qualified to perform Parylene deposition on hybrid circuits on a production basis, for the Centaur inertial guidance computer. The Parylene coating process developed during this program consists of a) obtaining a hybrid cover with a hole in it, b) sealing of the circuit with a hole in the cover, c) Parylene coating through the hole with the external leads protected from Parylene by appropriate fixturing, and d) sealing of the hole by soldering a pretinned Kovax tab. Development of the above process required optimization of the Parylene coater parameters to obtain a uniform consistent coating which could offer adequate protection to the circuits, fixture design for packages of various types, determination of the size of the deposition hole, the amount of dimer charge per run, a process to hermetically seal the deposition holes and establishment of quality control techniques or acceptance criteria for the deposited film. Several experimental runs were made on test circuits as well as actual production circuits to determine the effect of Parylene coating on active components, thin film resistors, and wire bonds under various conditions. Tests were also made to determine if Parylene indeed protected circuits from loose particles and external environment. After these experiments, Parylene coating acceptance standards were established and a long and rigorous qualification program was completed in order to prove the feasibility of this process. The results of the qualification program will be reported in a future publication. It is concluded that Parylene offers excellent protection against loose particles and a degree of protection from some environmental conditions. It is expected that the fraction of hybrids being coated with Parylene will continue to increase in the microelectronic industry.","PeriodicalId":387212,"journal":{"name":"IEEE Transactions on Parts, Hybrids, and Packaging","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1977-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127048502","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The Response of Optical Isolators in a Nuclear Radiation Environment","authors":"A. E. Mardiguian, K. Soda, R. J. Maier","doi":"10.1109/TPHP.1977.1135209","DOIUrl":"https://doi.org/10.1109/TPHP.1977.1135209","url":null,"abstract":"The effects of gamma total dose and gamma dose rate ex. posures on the operation of a state-of-the-art optical isolator were inves. tigated. The isolator was irradiated in both \"on\" and \"off\" states to determine upset in dose rate environments from 1.5 X 108to 2.2 X 1011rd/s (Si). High-state output voltage was subject to upset at all dose rates tested. Propagation delay times, and output voltage and currenl were measured for total dose exposures up to 5X 106rd (Si). Of the parameters tested, only high-state output current and low-to-high pro. pagation delay times exceeded the manufacturer's specifications in the total dose environment.","PeriodicalId":387212,"journal":{"name":"IEEE Transactions on Parts, Hybrids, and Packaging","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1977-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116877669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Lubricants for Separable Connectors","authors":"W. Freitag","doi":"10.1109/TPHP.1977.1135172","DOIUrl":"https://doi.org/10.1109/TPHP.1977.1135172","url":null,"abstract":"About two dozen lubricating fluids were tested for use on electrical contacts on card edge or pin-and-socket connectors. The lubricants selected for screening represented a cross section of thewide variety of natural and synthetic materials available on the market. Among them were polyphenyl ethers, natural and synthetic hydrocarbons, several types of esters, polygiycols, some fluorinated materials, a few silicones, and some proprietary formulations. Lubricants were evaluated on the basis of volatility and their ability to prevent fretting corrosion on tin-to-solder contacts. Limited tests were also done on their spreading characteristics, their thermal degradation properties, and their effect on contact resistance. The objective of the work was to develop guidelines in the selection of contact lubricants for field testing. The lubricants were ranked on the basis of weight loss from thin deposits of the samples on solder foil coupons at 65°C. Fretting experiments were done by forcibly moving a printed circuit card finger between a pair of spring contacts cut from actual cards and connectors. The time required for contact resistance to increase from a few milliohms to 2 Omeg was determined as a function of the amount of lubricant present.","PeriodicalId":387212,"journal":{"name":"IEEE Transactions on Parts, Hybrids, and Packaging","volume":"244 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1977-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116233859","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}