2017 18th International Conference on Electronic Packaging Technology (ICEPT)最新文献

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Investigation on transient catastrophic optical damage in high power AlGaAs/GaAs laser diodes 高功率AlGaAs/GaAs激光二极管瞬态灾难性光损伤研究
2017 18th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2017-08-01 DOI: 10.1109/ICEPT.2017.8046529
Yanning Chen, Y. Qiao, Q. Ma, Jianqiang Li, Jin Shao, Yidong Yuan, Xiaoke Tang, Haifeng Zhang, Dongyan Zhao
{"title":"Investigation on transient catastrophic optical damage in high power AlGaAs/GaAs laser diodes","authors":"Yanning Chen, Y. Qiao, Q. Ma, Jianqiang Li, Jin Shao, Yidong Yuan, Xiaoke Tang, Haifeng Zhang, Dongyan Zhao","doi":"10.1109/ICEPT.2017.8046529","DOIUrl":"https://doi.org/10.1109/ICEPT.2017.8046529","url":null,"abstract":"The phenomenon of transient catastrophic optical damage (COD) was studied experimentally by means of thermal infrared imaging, photon emission microscope (EMMI), and electron diffraction technology (SAED) under high-resolution transmission electron microscope. We have recorded the dynamics of COD process using thermal infrared camera. The temperature of transient COD has a sudden increase of 32.07 °C when the COD event occurs which maintains less than 8.69 ms accompanying with the sudden decrease of output power. The reverse leakage current was investigated by EMMI. The leakage current of the COD sample increase and the photo in the active region was observed. Moreover, the result obtained from SAED technology identified that the silicon was changed into polycrystalline near the active area, contrasting to the silicon outside active area still remained initial single phase after COD.","PeriodicalId":386197,"journal":{"name":"2017 18th International Conference on Electronic Packaging Technology (ICEPT)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125926282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A hybrid genetic algorithm for automatic layout design of power module 基于混合遗传算法的电源模块自动布局设计
2017 18th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2017-08-01 DOI: 10.1109/ICEPT.2017.8046643
Baisen Hao, Y. Mei, P. Ning
{"title":"A hybrid genetic algorithm for automatic layout design of power module","authors":"Baisen Hao, Y. Mei, P. Ning","doi":"10.1109/ICEPT.2017.8046643","DOIUrl":"https://doi.org/10.1109/ICEPT.2017.8046643","url":null,"abstract":"The parasitic parameters in the power module have a negative effect on switching losses and dynamic characteristics. With the rapid development of integrated circuit technology, the high current, high frequency and high pressure working environment put forward higher requirements for the switching circuit delay, reliability and power consumption. The rational layout of the power module is the key to reducing the parasitic parameters. However, today's designers often propose the layout manually, which is time- and money-consuming. Recently, automatic layout design of power modules has attracted more and more attention. In this paper, a hybrid genetic algorithm is used to design the layout automatically by MATLAB in order to optimize the layout with the lowest parasitic effect. Then we used the Q3D software to verify the automatic calculation results by comparing the calculated layout with some others in manual ways.","PeriodicalId":386197,"journal":{"name":"2017 18th International Conference on Electronic Packaging Technology (ICEPT)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126142679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Packaging structure design for metal oxide gas sensors 金属氧化物气体传感器封装结构设计
2017 18th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2017-08-01 DOI: 10.1109/ICEPT.2017.8046691
Xiyou Wang, Maofen Zhang, Daoguo Yang
{"title":"Packaging structure design for metal oxide gas sensors","authors":"Xiyou Wang, Maofen Zhang, Daoguo Yang","doi":"10.1109/ICEPT.2017.8046691","DOIUrl":"https://doi.org/10.1109/ICEPT.2017.8046691","url":null,"abstract":"For gas-sensing mechanism of metal oxide, metal oxide gas sensor chip needs to work in a hot environment from 150°C to 400°C and must open to detected gases. These different characteristics, compared with integrated circuit (IC), lead significant challenges for metal oxide gas sensor packaging design. In this paper, to get best packaging design, we discuss the influence of the sensor chip conductivity(A), shell conductivity(B), metal wire conductivity(C), glass insulation conductivity(D), sensor chip size(E), source power(F) and shell thickness(G) on the gas sensor package thermal performance by modeling and finite element analysis(FEA) method, and then verify the FEA method though an experiment. The results show that the influence to the mean temperature of the shell top center decreases in the order: F>B>C>E>D>A>G according to the R values, while the influence to the sensor chip temperature decreases in the following order: C>D>B>E>F>A>G.","PeriodicalId":386197,"journal":{"name":"2017 18th International Conference on Electronic Packaging Technology (ICEPT)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123240092","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Sintering process of mixed solvent system frit to improve the performance of the film in glass/glass laser bonding 采用混合溶剂体系熔块烧结工艺提高玻璃/玻璃激光粘接膜的性能
2017 18th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2017-08-01 DOI: 10.1109/ICEPT.2017.8046416
Yi Li, Rui Tian, Luqiao Yin, Jianhua Zhang
{"title":"Sintering process of mixed solvent system frit to improve the performance of the film in glass/glass laser bonding","authors":"Yi Li, Rui Tian, Luqiao Yin, Jianhua Zhang","doi":"10.1109/ICEPT.2017.8046416","DOIUrl":"https://doi.org/10.1109/ICEPT.2017.8046416","url":null,"abstract":"Organic carrier is the main factor affecting the morphology of the glass frit sintering, and the shape of the sintering determines the quality of the laser encapsulation. In this work, the volatility of single solvent and mixed solvent have been analyzed, and the sintered temperature curve has been optimized. After the sintering, scanning electron microscopy (SEM) images of the single solvent and mixed solvent glass frit films have been achieved. The results show that the mixed solvent glass frit film has the less and smaller bubble defects after sintering process and the size of defects has been deceased by 5.04 µm. The temperature curve of sintering can be set according to the result of thermal gravimetric analysis. This approach can improve efficiency and quality of the glass frit laser bonding process. The best performance of the mixed solvent composed of three kinds of organic solvents and other additives has huge potential as a carrier of glass frit for laser encapsulation.","PeriodicalId":386197,"journal":{"name":"2017 18th International Conference on Electronic Packaging Technology (ICEPT)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123541326","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Microstructures and properties of Bi-11Ag solder doped with small amounts of Sn 掺少量锡的Bi-11Ag钎料的组织与性能
2017 18th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2017-08-01 DOI: 10.1109/ICEPT.2017.8046505
D. Li, L. Yin, Z. Yao, G. Wang, L.P. Zhang, C.X. Wang
{"title":"Microstructures and properties of Bi-11Ag solder doped with small amounts of Sn","authors":"D. Li, L. Yin, Z. Yao, G. Wang, L.P. Zhang, C.X. Wang","doi":"10.1109/ICEPT.2017.8046505","DOIUrl":"https://doi.org/10.1109/ICEPT.2017.8046505","url":null,"abstract":"In this paper, the Bi-11Ag solders with additions of 1wt.%, 3wt.%, and 5wt.% Sn are prepared to investigate the microstructure, melting characteristic, and tensile strength of the solder joint. The result shows that the melting temperature decreases to 154 °C as the Sn continuously added; the microstructure was refined when the addition of Sn was below 5wt.%, as it reach 5wt.% or more, the dendritic microstructure become coarse; tensile strength jumped to 43.3MPa from 53.9MPa with the addition of Sn. It is because that the Sn diffuses to the interface and then forms the Ag3Sn intermetallic compound(IMC) layer, it is significantly superior to the mechanical bonding formed by grain boundary groove in the case of without Sn.","PeriodicalId":386197,"journal":{"name":"2017 18th International Conference on Electronic Packaging Technology (ICEPT)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125555014","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Removal of high dose ion-implanted photoresists using dry process 干法去除高剂量离子注入光刻胶
2017 18th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2017-08-01 DOI: 10.1109/ICEPT.2017.8046402
Shuaipeng Wang, Jianqiang Li, Yanning Chen, Dongyan Zhao, Yubo Wang, Haifeng Zhang
{"title":"Removal of high dose ion-implanted photoresists using dry process","authors":"Shuaipeng Wang, Jianqiang Li, Yanning Chen, Dongyan Zhao, Yubo Wang, Haifeng Zhang","doi":"10.1109/ICEPT.2017.8046402","DOIUrl":"https://doi.org/10.1109/ICEPT.2017.8046402","url":null,"abstract":"Dry etching process are some of the most familiar MEMS technology. In this paper, we study the rate enhancements observed through operation of the power of plasma source and the oxygen flow rate in a single step at low temperature for high dose implanted photoresist removal.","PeriodicalId":386197,"journal":{"name":"2017 18th International Conference on Electronic Packaging Technology (ICEPT)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114921134","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Impact of substrate materials on packages warpage 基板材料对封装翘曲的影响
2017 18th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2017-08-01 DOI: 10.1109/ICEPT.2017.8046560
Jianxia Hao, Jing Shang, Xiaodong Liu, T. Hang, Liming Gao, Ming Li
{"title":"Impact of substrate materials on packages warpage","authors":"Jianxia Hao, Jing Shang, Xiaodong Liu, T. Hang, Liming Gao, Ming Li","doi":"10.1109/ICEPT.2017.8046560","DOIUrl":"https://doi.org/10.1109/ICEPT.2017.8046560","url":null,"abstract":"Unit warpage in Ball Grid Array (BGA) packages with different substrates due to coefficient of thermal expansion (CTE) and Young's Modulus mismatch was investigated. The effect of substrate materials on BGA packages warpage was analyzed. Thermal Mechanical Analyzer (TMA) and Dynamic Mechanical Analyzer (DMA) were used to measure Glass Transition Temperature (Tg) and CTE and Young's Modulus of the substrates and the properties of these substrates were analyzed. Shadow Moiré was used to measure the unit warpage at room temperature (25°C) and during reflow. A Finite Element Analysis (FEA) method was used to simulate the warpage results to compare with results from the experiment and to verify the results. From this work, Cu, core materials, and solder mask (SM) have a combined effect on Tg, CTE and Young's Modulus of the substrate. Higher CTE of substrate than that of moldcap results in units presenting Cry, and compared with CTE, the modulus plays a dominate role in the strip compress and decreasing modulus of substrate helps to lower unit warpage. The Shadow moiré test results and the simulation results state that the two results are credible.","PeriodicalId":386197,"journal":{"name":"2017 18th International Conference on Electronic Packaging Technology (ICEPT)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115063282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Metallization of diamond/Al composite surface with Ni-P coating Ni-P涂层金刚石/铝复合材料表面的金属化
2017 18th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2017-08-01 DOI: 10.1109/ICEPT.2017.8046494
Qi-Yuan Shi, Dianhua Wu, D. Ni, D. Wang, Zhi-Quan Liu
{"title":"Metallization of diamond/Al composite surface with Ni-P coating","authors":"Qi-Yuan Shi, Dianhua Wu, D. Ni, D. Wang, Zhi-Quan Liu","doi":"10.1109/ICEPT.2017.8046494","DOIUrl":"https://doi.org/10.1109/ICEPT.2017.8046494","url":null,"abstract":"In this study, a steady and comparatively smooth Ni-P coating on the surface of diamond/Al composite substrate was fabricated by electroless plating, which can outstandingly improve solderability of the composite. By controlling the deposition time, we obtained the growth curve of the Ni-P coating, and as a result we can adjust the thickness of the coating. The solderability was tested by soldering experiments with two typical solder materials, SAC305, representing lead-free solder, and Sn63Pb37, representing lead-content solder. Thermal storage test was conducted at different temperatures to analyze reliability of the coating. The formed IMCs during soldering and thermal storage were investigated by scanning electron microscope (SEM) and different IMCs in different solder were compared.","PeriodicalId":386197,"journal":{"name":"2017 18th International Conference on Electronic Packaging Technology (ICEPT)","volume":"72 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122692423","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The electronic properties of zinc-blende GaN, wurtzite GaN and pnma-GaN crystals under pressure 研究了混合锌氮化镓、纤锌矿氮化镓和pma -GaN晶体在压力下的电子特性
2017 18th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2017-08-01 DOI: 10.1109/ICEPT.2017.8046716
Xinghe Luan, C. Feng, H. Qin, Fanfan Niu, Dao-Guo Yang
{"title":"The electronic properties of zinc-blende GaN, wurtzite GaN and pnma-GaN crystals under pressure","authors":"Xinghe Luan, C. Feng, H. Qin, Fanfan Niu, Dao-Guo Yang","doi":"10.1109/ICEPT.2017.8046716","DOIUrl":"https://doi.org/10.1109/ICEPT.2017.8046716","url":null,"abstract":"In this study, electronic properties such as the band structure, total density of state (TDOS) and partial density of states (PDOS) of zinc-blende GaN, wurtzite GaN and pnma-GaN crystals are explored through first-principles calculations within the generalized gradient approximation (GGA), and the influence of hydrostatic pressures on the electronic properties are also researched. Results show that the three GaN compounds are all semiconductors with a direct band gap. Although the band gap increases monotonically with the increase of hydrostatic pressure, the hydrostatic pressure has limited effect on the hybridization of valence band and conduction band. In addition, under the same pressure, the band gap of wurtzite GaN is slightly larger than that of the others. Further, calculation results also show that TDOSs of the three compounds are obviously different, and the increase in pressure reduces the peaks of both TDOSs and PDOSs.","PeriodicalId":386197,"journal":{"name":"2017 18th International Conference on Electronic Packaging Technology (ICEPT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114183071","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Thermal conductivity of thin finite-size β-SiC calculated by molecular dynamics combined with quantum correction 用分子动力学结合量子校正计算有限尺寸薄β-SiC的热导率
2017 18th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2017-08-01 DOI: 10.1109/ICEPT.2017.8046601
Chengdi Xiao, Hu He, Junhui Li, Sen Cao, Wenhui Zhu
{"title":"Thermal conductivity of thin finite-size β-SiC calculated by molecular dynamics combined with quantum correction","authors":"Chengdi Xiao, Hu He, Junhui Li, Sen Cao, Wenhui Zhu","doi":"10.1109/ICEPT.2017.8046601","DOIUrl":"https://doi.org/10.1109/ICEPT.2017.8046601","url":null,"abstract":"Silicon carbide (SiC) is a most promising alternative material for the next generation of high-power and high-temperature devices duo to excellent performance, such as larger thermal conductivity compared with Silicon. The thermal conductivity of SiC bulk, as well as temperature dependence of thermal conductivity has been investigated in terms of simulations and experiments. However, when the characteristic size of materials is down to nanoscale, the thermal properties will be significantly different from bulk materials. Thus, it is important to understand the heat transport behavior of SiC thin films for developing nanoscale SiC devices. Nevertheless, thermal properties of SiC thin films have not been investigated systematically. In this paper, a non-equilibrium molecular dynamics model combined with quantum correction is presented for characterizing the thermal conductivity of thin finite-size β-SiC. Adopting the Tersoff empirical potential, temperature effect on thermal conductivity is predicted based on this model. It is found that the uncorrected lattice thermal conductivity diminishes evidently with decrease of temperature. Unlike the uncorrected results, the corrected results display a slight increase with temperature to a maximum value at ∼760 K This work provides a possible theoretical and computational basis for heat transfer and dissipation applications of nanoscale β-SiC thin film, and would also help the design of thermal barriers or new thermoelectric materials.","PeriodicalId":386197,"journal":{"name":"2017 18th International Conference on Electronic Packaging Technology (ICEPT)","volume":"38 10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114287216","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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