2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)最新文献_第3页

Extension of dipole moment method to include resonant apertures in the prediction of radiated fields from computer workstations 扩展偶极矩法在计算机工作站辐射场预测中的应用，使之包括共振孔径

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349955

A. Khalil, T. Sorensen

引用次数: 0

Portable wireless device threat assessment for aircraft navigation radios 飞机导航无线电便携式无线设备威胁评估

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349926

T.X. Nguyen, S. V. Koppen, J. Ely, R. Williams, L.J. Smith, M. Salud

引用次数: 3

Use of wire-grid method to evaluate the effect of finite metallic plane of OATS on NSA in LF (30-100 MHz) region 利用线网格法评价了有限金属面对低频(30-100 MHz)频段NSA的影响

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349849

Han-Chang Hsieh, M. Lai, K. Wang

引用次数: 0

Miniaturized thin-film magnetic field probe with high spatial resolution for LSI chip measurement 用于大规模集成电路芯片测量的高空间分辨率的小型化薄膜磁场探头

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349815

N. Ando, N. Masuda, N. Tarnaki, T. Kuriyama, S. Saito, K. Kato, K. Ohashi, M. Saito, M. Yarnaguchi

{"title":"Miniaturized thin-film magnetic field probe with high spatial resolution for LSI chip measurement","authors":"N. Ando, N. Masuda, N. Tarnaki, T. Kuriyama, S. Saito, K. Kato, K. Ohashi, M. Saito, M. Yarnaguchi","doi":"10.1109/ISEMC.2004.1349815","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349815","url":null,"abstract":"It is important to obtain the absolute value of current flowing through each power line on a large-scale integrated (LSI) circuit by measurement because this current on an LSI chip is regarded as conductive noise. We have developed a thin-film magnetic field probe that has spatial resolution high enough to obtain the absolute value of high-frequency power current on an LSI chip. Spatial resolution was enhanced by miniaturizing the shielded loop coil, the detection part of the probe. The outer size of the new coil is 50/spl times/22 /spl mu/m. In taking measurements with the new probe over a 60 /spl mu/m wide microstrip line used as a device under test (DUT), we obtained a 6 dB decrease point of 40 /spl mu/m, which indicates the spatial resolution of the probe. This value is comparable to the typical width of power lines on an LSI chip, around 50 /spl mu/m and is less than half that of our conventional probes, around 90 /spl mu/m. In measurements with the new probe over an LSI chip, we obtained such a fine magnetic near-field distribution that the magnetic fields generated from the lines on the chip were separated. On-chip decoupling was also confirmed by using the new probe. The new probe enables direct verification of a circuit design for suppressing electromagnetic interference (EMI), while conventional coarse mapping of the magnetic near-field cannot be used to evaluate such conductive noise.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128457317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 47

EMC standards - a European perspective EMC标准——欧洲视角

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349874

B. Jones

引用次数: 2

Twenty-five years of EMC testing for computing devices - instrumentation 计算设备的电磁兼容测试25年。仪器仪表

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349838

E. Bronaugh

引用次数: 0

The least time-maximum probability theory of lightning protection design 防雷设计的最小-最大概率理论

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1350044

R. Briet

引用次数: 1

Approaches to radiated emissions reduction of powertrain control modules 减少动力总成控制模块辐射排放的方法

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349921

I. Belokour, R. Edwards, G. Jacobs, M. Zaremski

引用次数: 3

Radiated emission measurements to 40GHz: performing accurate and efficient radiated emission measurements in the 1 to 40GHz frequency range 40GHz以下的辐射发射测量:在1 ~ 40GHz频率范围内进行准确、高效的辐射发射测量

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349939

J.L. Steiner, M. Windler

引用次数: 1

Validation of equivalent circuit lightning model of strike to a steel reinforced structure 钢结构雷击等效电路模型的验证

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1350041

N. Koone, B. Condren

{"title":"Validation of equivalent circuit lightning model of strike to a steel reinforced structure","authors":"N. Koone, B. Condren","doi":"10.1109/ISEMC.2004.1350041","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1350041","url":null,"abstract":"Lightning strikes to facilities can pose hazards to personnel as well as sensitive processes and equipment. Steel reinforcement in a structure can act as a Faraday cage that can mitigate the effects of lightning. An equivalent circuit lightning model (ECLM) of a strike's response in a steel reinforced structure has been developed using PSpice/sup /spl reg// (a commercial circuit simulation) where segments of rebar are modeled as inductors and resistors in series. Programs have been written to take the architectural information of a steel reinforced structure and create a circuit network that is analogous to the network of reinforcement in a facility. A current waveform representing a severe lightning strike is introduced in the simulated circuit network, and potential differences within the structure are determined using PSpice/sup /spl reg//. In order to validate the ECLM of a steel reinforced structure, high current pulses were injected into two-dimensional steel grids and potential differences across various nodes of the grids were measured. Grids were then simulated using the lightning circuit model to compare with measured potential differences. Validation tests of steel grids provide evidence that the ECLM agrees well with high voltage test measurements.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128770516","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1