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2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)最新文献

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A novel automatic digital quasi-peak detector for a time domain measurement system 一种用于时域测量系统的新型自动数字准峰值检测器
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349948
S. Braun, F. Krug, P. Russer
{"title":"A novel automatic digital quasi-peak detector for a time domain measurement system","authors":"S. Braun, F. Krug, P. Russer","doi":"10.1109/ISEMC.2004.1349948","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349948","url":null,"abstract":"An advanced ultra-fast broadband time domain EMI (TDEMI) measurement system is presented. Measurements were performed in the 30-1000 MHz range. Using digital signal processing for spectral estimation and detection, the measurement time is reduced by a factor of 10 in comparison to a conventional EMI receiver. A novel recording routine for TDEMI measurement and digital signal processing for proper quasi-peak detection is described. Different amplitude resolutions are selected during the recording to enhance the dynamic range by about 50 dB. Measurement results are compared with the results obtained with a conventional EMI receiver.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130512753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 60
Investigation of interferences between wireless LAN signal and disturbances from spread spectrum clocking 无线局域网信号与扩频时钟干扰的研究
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349848
S. Aoki, F. Amemiya, A. Kitani, N. Kuwabara
{"title":"Investigation of interferences between wireless LAN signal and disturbances from spread spectrum clocking","authors":"S. Aoki, F. Amemiya, A. Kitani, N. Kuwabara","doi":"10.1109/ISEMC.2004.1349848","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349848","url":null,"abstract":"The disturbance wave from a personal computer (PC) employing spread spectrum clocking was converted to the frequency range using a wireless LAN system. The wave was impressed on to the wireless LAN signal to investigate its influence on the radio telecommunication system using a broadband signal. The results indicate that the influence from a PC employing spread spectrum clocking was more serious than that from a PC not employing spread spectrum clocking. A frequency modulation signal and white noise were also impressed on to the wireless LAN signal. The result indicated that the frequency modulation signal, whose modulation frequency is from 1 kHz to 10 kHz and modulation frequency deviation is the same as that of the disturbances from a PC employing spread spectrum clocking, can be used as the artificial source to investigate the interference.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126420435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Why EMC immunity testing is inadequate for functional safety 为什么EMC抗扰度测试不足以保证功能安全
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1350014
K. Armstrong
{"title":"Why EMC immunity testing is inadequate for functional safety","authors":"K. Armstrong","doi":"10.1109/ISEMC.2004.1350014","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1350014","url":null,"abstract":"Safety-implicated, safety-related, and safety-critical systems are increasingly using electrical, electronic and programmable electronic devices. All such devices can suffer malfunctions or damage due to electromagnetic interference. Safety systems have safety integrity requirements (defined by IEC 61508) - but their EMC aspects are not adequately controlled by either safety or EMC standards. The paper describes the shortcomings in the way that the EMC immunity of such equipment is dealt with, and shows that the normal immunity testing approach is inadequate, on its own, as a means of verifying this aspect of safety integrity.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"181 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124528434","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 34
Reduced order models for fast time- and frequency-domain analysis of signal paths in HDI boards and packages 用于HDI板和封装中信号路径快速时域和频域分析的降阶模型
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349860
R. Piesiewicz, U. Keller, W. John
{"title":"Reduced order models for fast time- and frequency-domain analysis of signal paths in HDI boards and packages","authors":"R. Piesiewicz, U. Keller, W. John","doi":"10.1109/ISEMC.2004.1349860","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349860","url":null,"abstract":"The paper presents a modeling concept for signal paths in generalized high density interconnect (HDI) boards and packages. It is based on partitioning the complex HDI structure into generic substructures and on subsequent application of matrix rational approximation and model order reduction methods. The modeling procedure results in reduced order models that are easily applicable to SPICE system level simulations and allow for numerically effective analysis and simulation of high-speed signal behavior in modern multilayer high density passive interconnecting structures.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"6 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117338849","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Medical product EMC 医疗产品EMC
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349845
D. Bare
{"title":"Medical product EMC","authors":"D. Bare","doi":"10.1109/ISEMC.2004.1349845","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349845","url":null,"abstract":"With the advent of the second edition of IEC 60601-1-2 and the FDA's acceptance of consensus standards such as the IEC 610004-x series, the EMC landscape for medical electrical equipment is undergoing a significant change. The EMC test requirements for medical products are very similar to those applied to other types of products such as radio equipment, networking equipment, and information technology equipment. However, IEC 60601-1-2 incorporates many specific test application guidance notes that require special consideration. In addition, there are several dozen additional standards that address unique characteristics for particular products. In many cases, the EMC test levels or methods are modified from those given in IEC 60601-1-2 for these products. IEC 60601-1-2 sets out a list of compliance criteria associated with essential performance of the product. Correctly specifying these criteria is key to meeting the essential requirement for safety specified by the medical device directive. The standard also sets out requirements for information that must be provided to the user in the form of warnings and markings, the environment for which the product was designed, including limitations of use, and a list of accessories that may safely be used with the product The paper discusses the assessment methods required by IEC 60601-1-2 that could affect product design.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"25 10","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113937281","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A review of dipole models for correlating emission measurements made at various EMC test facilities 在各种电磁兼容测试设施中相关发射测量的偶极子模型综述
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349944
P. Wilson, C.L. Holloway, G. Koepke
{"title":"A review of dipole models for correlating emission measurements made at various EMC test facilities","authors":"P. Wilson, C.L. Holloway, G. Koepke","doi":"10.1109/ISEMC.2004.1349944","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349944","url":null,"abstract":"In this paper we review dipole models for correlating measurements made at various electromagnetic compatibility (EMC) test facilities. We present expressions for the maximum received voltage (at some measurement port) generated by a dipole radiator placed in free-space, an ideal half-space environment, a transmission line, and an over-moded cavity. These different environments correspond to commonly used EMC test facilities, namely, a fully anechoic chamber (FAC), an open area test site (OATS) or a semi-anechoic chamber (SAC), a transverse electromagnetic (TEM) cell or stripline, and a reverberation chamber. These dipole models can then be used as the basis for correlating between emission measurements made at different facility types. Most of these expressions have appeared in previous publications. The purpose of this paper is to present these results in a review having consistent terminology and notation.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131114290","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Estimation of source location of leakage field from transformer-type microwave oven 变压器式微波炉泄漏场源位置的估计
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349844
K. Taira, T. Kato, K. Sawaya, R. Sato
{"title":"Estimation of source location of leakage field from transformer-type microwave oven","authors":"K. Taira, T. Kato, K. Sawaya, R. Sato","doi":"10.1109/ISEMC.2004.1349844","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349844","url":null,"abstract":"A method to estimate the source location based on the MUSIC algorithm is proposed and is applied to the electromagnetic field emitted by a microwave oven of the transformer-type. Since the frequency, the phase and the amplitude of the leakage field emitted by a microwave oven change with time, a detection method using the periodicity of the field is also proposed to obtain the phase distribution. Experimental results are shown of the estimation of the source location using the proposed method.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121595567","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Investigation of SAR of an internal antenna of mobile phones 手机内天线SAR的研究
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349967
K. Chan, L. Fung, K. Chow, S. Leung
{"title":"Investigation of SAR of an internal antenna of mobile phones","authors":"K. Chan, L. Fung, K. Chow, S. Leung","doi":"10.1109/ISEMC.2004.1349967","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349967","url":null,"abstract":"This paper presents an investigation of SAR (specific absorption rate) of mobile telephones having an internal antenna structure, and effects on antenna performance due to presence of a human head at close proximity to the mobile telephone. The numerical model for evaluating the SAR values and the antenna performance parameters of a typical internal antenna used in mobile telephones is described, and the results are compared to the measurement results.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114615437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Effects on crosstalk from a single-ended trace by referencing a non-ground reference plane 参考非接地参考平面对单端走线串扰的影响
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349831
J. Fan, J. Knighten, N. Smith, R. Alexander
{"title":"Effects on crosstalk from a single-ended trace by referencing a non-ground reference plane","authors":"J. Fan, J. Knighten, N. Smith, R. Alexander","doi":"10.1109/ISEMC.2004.1349831","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349831","url":null,"abstract":"The work studies the crosstalk issues between two single-ended traces when they reference a non-ground plane, such as a power plane. Both near-end and far-end crosstalk may be enhanced at the distributed resonant frequencies associated with the printed circuit board. Methods to decrease the crosstalk voltages are also investigated.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116859886","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Electromagnetic susceptibility analysis in device level with numerical technique based on electric field integral equation 基于电场积分方程的器件级电磁磁化率数值分析
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1350005
W. Yuan, E. Li
{"title":"Electromagnetic susceptibility analysis in device level with numerical technique based on electric field integral equation","authors":"W. Yuan, E. Li","doi":"10.1109/ISEMC.2004.1350005","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1350005","url":null,"abstract":"With the advance in high-speed electronics and the presence of new standards on electromagnetic susceptibility, EMS analysis and evaluation is becoming increasingly important. This paper investigates EMS of shielded electronic equipment in the device level by using a full-wave numerical technique combined with a circuit-based method. The method of moments in terms of the mixed-potential electric field integral equation for the geometries of arbitrary combined wire/surface is developed for susceptibility evaluation. With numerical analysis, the effect of external EM noise on electronic equipment is characterized and an equivalent secondary source model is extracted for further EMS analysis of internal high-speed susceptible circuits at a lower board level.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"166 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123173375","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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