2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)最新文献_第9页

SI and EMI analysis of analog circuit board combination of PEEC and MOR 模拟电路板组合PEEC和MOR的SI和EMI分析

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1350037

N. Matsui, D. Divekar, N. Orhanovic

引用次数: 0

EMC precompliance testing - prediction not correlation EMC预符合性测试-预测而非相关性

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349985

M. Aschenberg, D. Gottwald, C. Grasso

{"title":"EMC precompliance testing - prediction not correlation","authors":"M. Aschenberg, D. Gottwald, C. Grasso","doi":"10.1109/ISEMC.2004.1349985","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349985","url":null,"abstract":"Correlating measurement data is a task many EMC engineers face when performing precompliance testing. Correlation, creating a point-for-point similarity between two measurement systems, is often the approach taken to determine if product modifications are needed before performing an, often costly, compliance scan. However, correlation methodologies rely on calibration methods which are inadequate in determining point-for-point measurement similarity for devices with non-rigid structures. This inadequacy has been quantified as measurement uncertainty in various standards. The inability to correlate measurements absolutely is further exacerbated by alternate test environments and a lack of industry agreement on standard test procedures. The authors have developed a novel approach for determining the pass/fail status of an EUT from precompliance data taken from uncorrelated measurement systems. This simple and effective approach evaluates past compliance data and applies it to the current precompliance data set. The EMC engineer is thereby enabled accurately to predict if a unit will pass or fail the forthcoming compliance scan, regardless of site-to-site correlation.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122328456","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Analysis of radiation caused by SSN and transmission line by combining the equivalent circuits of active IC into FDTD 将有源集成电路等效电路组合成时域有限差分法分析SSN和传输线产生的辐射

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1350040

Yen-Hui Lin, Tzong-Lin Wu

引用次数: 8

Common and differential mode characterization of EMI power-line filters from S-parameters measurements 来自s参数测量的EMI电源线滤波器的共模和差分模特性

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349868

J. Regué, M. Ribó, D. Duran, D. Badia, A. Perez

引用次数: 18

Effective EMI reduction devices and assemblies 有效的电磁干扰减少装置和组件

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349892

B.K.C. Chan, H. Mellberg

引用次数: 0

A better approach to DC power filtering 一种更好的直流电源滤波方法

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349869

D. Sanders, J. Muccioli, A.A. Anthony

引用次数: 3

Lightning transients in control lines at the large urban area HV substation 大城市高压变电站控制线路雷电瞬变

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349834

A. Sowa, J. Wiater

引用次数: 4

A good practice guide for the use of GTEM cells in EMC measurements according to IEC61000-4-20 根据IEC61000-4-20，在EMC测量中使用GTEM电池的良好实践指南

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349878

D. Bozec, L. McCormack, A. Marvin, A. Nothofer, M. Alexander

引用次数: 14

A study on magnetic near-field measurements above a patch antenna using an optical waveguide probe with a loop element 利用带环路元件的光波导探头对贴片天线上方磁场进行近场测量的研究

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1350023

M. Takahashi, H. Ota, K. Arai, R. Sato

引用次数: 3

Panoramic, ultrawideband, diagnostic imaging of test volumes 全景，超宽带，诊断成像的测试体积

2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349990

D. Novotny, R. Johnk, C. Grosvenor, N. Canales

{"title":"Panoramic, ultrawideband, diagnostic imaging of test volumes","authors":"D. Novotny, R. Johnk, C. Grosvenor, N. Canales","doi":"10.1109/ISEMC.2004.1349990","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349990","url":null,"abstract":"The Time-Domain, Free-Field Metrology Project at the National Institute of Standards and Technology (NIST) is developing methodologies to assess the quality and range of use (in frequency, test volume size, and test type) of EMC test facilities. Previous efforts (Johnk, R. et al., 2000; 2001) have focused on transmission tests that represented typical antenna and test artifact configurations. These tests illuminated a facility and measured the reflections from scattering objects and residual RF ringing to determine modal and basic propagation characteristics. Joint time-frequency-domain (JTFA) analysis of the measurements allow for characterization of signals in various categories, such as broad- or narrow-band scatterers, leakage, or systematic facility ringing. These directional measurements allow isolation in space and time to allow for location of facility irregularities. The initial results that are presented show scatterers intentionally placed in the Time-Domain, Free-Field Metrology Laboratory. These artifacts were imaged and identified in time, space and frequency. This panoramic, ultrawideband, reflection measurement takes a full 360/spl deg/ sweep of the facility and uses JTFA analysis tools to identify specific scatterers and other irregularities in the facility. Combinations of horizontal and vertical polarization sweeps show improved signal-to-noise ratio (SNR) and can highlight polarization sensitive events. We hope this fast testing technique, can be used as a precompliance check and determination of the RF performance of an EMC facility.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130399223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2