2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)最新文献

{"title":"Finite difference time domain low cost modeling for automotive environments","authors":"G. Anzaldi, P. Riu, F. Silva, R. Santos","doi":"10.1109/ISEMC.2004.1349920","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349920","url":null,"abstract":"This paper describes the modeling and analysis of a vehicle's electromagnetic environment by means of computer simulation based on the full wave finite difference time domain (FDTD) numerical method. The procedure described is a method to characterize the effects of emissions produced by external and \"internal\" EMI sources and allows reducing the amount of measurements and vehicle tests in prototypes during the design phase. The course of action presented is considered to be \"low cost\" in a wide sense because it can be applied to almost any FDTD code, including free distribution ones, without any modifications of the code itself and not requiring specialized computers to obtain sensible results with reasonable computation times.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116359453","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Complex fit normalized site attenuation using complex magnitude and phase patterns","authors":"Zhong Chen, M. Foegelle","doi":"10.1109/ISEMC.2004.1349914","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349914","url":null,"abstract":"Due to the diverse designs in log periodic dipole arrays (LPDAs), it is impractical to develop a set of unified correction factors for all types of LPDAs in site attenuation measurements. Even for log antennas with similar frequency ranges and appearances, large variations can be expected in their patterns and phase center positions because of the differences in the feed sections, boom sizes, relative spacings (a) and scale factors (/spl tau/) (Lo, Y.T. and Lee, S.W., 1988). Complex fit normalized site attenuation (CFNSA) has been used successfully by allowing phase centers to move along the centerline of the antenna boom, and by using analytical functions to represent radiation patterns. Approximately 1 dB improvement in antenna factors is observed over the ANSI C63.4/5 model for horizontal polarization. Similar improvements are shown in the vertical polarization. The paper also studies a method that may extend the frequency range by permitting phase centers to vary off-axis, or by using angle dependent phase center positions (which is equivalent to using complex magnitude and phase patterns).","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117122754","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Hybrid vehicles, 42 volt vehicle electrical systems and the implications for EMC technology","authors":"K. Williams","doi":"10.1109/ISEMC.2004.1349919","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349919","url":null,"abstract":"A review of recent developments in transportation vehicle technology examines both hybrid vehicle development as well as the movement to 42 volt vehicle electrical systems. The results of this review suggest a positive trend of developments, new products, and more efficient vehicles that should have a positive impact on global oil resources, and on the personal safely of the driving public.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116298231","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Product safety and the printed wiring board - impedance control and trace fusing current","authors":"R. Georgerian","doi":"10.1109/ISEMC.2004.1349890","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349890","url":null,"abstract":"Many of today's printed wiring boards are designed with impedance control as the foremost criterion. The primary goal is to meet radiated/conducted emissions limits and maintain good signal integrity. Depending on the desired trace impedance value, designers size the trace and printed wiring board layers with optimal dimensions. Many high speed circuits depend on strict impedance control to minimize reflections and signal attenuation. Printed wiring boards of today are being designed with high density components. The high density components inherently have many pins and thus, a large amount of interconnecting traces is needed. These traces take up a vast majority of space throughout the printed wiring board. To fit more traces in a limited amount of space, traces are becoming less wide and thinner. Impedance control can still be maintained, however, trace fusing becomes more of a problem to solve. Under normal operating conditions, these signal traces carry no more than a few amps at most. However, under fault conditions, these same traces may have to survive for several minutes at tens of amps before the fault is cleared. As traces get thinner, their current capabilities are decreased, causing a potential product safety problem. The trace can open (trace fusing), causing an interruption of service, or can become hot enough to burn through the printed wiring board and create a fire, before the trace can open. To satisfy both concerns of signal integrity and safety, designers must be aware of the physical characteristics of the signal traces. The traces must be large enough to handle the fault current as not to cause the printed wiring board to burn. Or, size the trace to act like a fuse, and open before the printed wiring board becomes a fire hazard. At the same time, signal integrity must be maintained for circuits to function properly. Traces that open may cause other safety concerns such as interruption of critical communication services, medical monitoring systems or inhibit safety monitoring circuits. The designer must be cognizant of both impedance and fault current requirements, and design a signal trace that meets both requirements.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114372157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Measurements of conducted voltage in the low-frequency range from 2 kHz to 30 MHz for high-current industrial applications with regeneration drives","authors":"F. Beck, W.L. Klampfer","doi":"10.1109/EMCZUR.2006.214988","DOIUrl":"https://doi.org/10.1109/EMCZUR.2006.214988","url":null,"abstract":"The increasing awareness of power saving and the ever rising dynamic requirements in industrial machine tool applications have led to an unpredicted popularity of power-drive systems with energy regeneration capability. This trend is supported by the fact that such drives become smaller, more efficient and lower in cost. The downside of regeneration drives is the higher noise potential in the low and high-frequency ranges due to the commonly used pulse-width modulation (PWM). The functional problems, especially in the lower frequency range, have recently resulted in an increasing demand from the market for noise suppression in this range.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114880087","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Breaking new ground in product safety testing","authors":"D. Carpenter, L. Reid, D. Stivers, E. Bronaugh, T.S. Masters, J. Prudhomme","doi":"10.1109/ISEMC.2004.1349916","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349916","url":null,"abstract":"The test instrumentation used in the laboratory was assessed based on its manufacturers' statements of performance. This assessment was related to the specific test setups used for seven product safety tests to estimate the test instrumentation uncertainty for these tests. The estimated uncertainties for all five tests are shown. Three of these tests are discussed at length. The conclusions are that repeated tests of a test object are needed to prove that the measurement uncertainty for each test procedure is consistent with the measurement uncertainty of the instrumentation.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125315445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Compromizing and optimizing the design of special-purpose reverberation chambers for HIRF testing","authors":"L. R. Arnaut","doi":"10.1109/ISEMC.2004.1350032","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1350032","url":null,"abstract":"We discuss the design of compact electromagnetic reverberation chambers for EMC testing of dedicated test objects subjected to high-intensity fields. It is shown that significant size reductions and deviations from conformality of the chamber with respect to the shape of the test object are possible within the specifications of IEC 61000-4-21. An expression for the expected value of the maximum field strength as a function of operational and configurational parameters is given, showing that the test level depends only implicitly on the chamber volume. Associated uncertainty limits for the test level and minimum average input power required for a given test specification are also estimated.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122024515","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Hardware invariant protocol disruptive interference","authors":"I. Jeffrey, J. Lovetri, B. Kordi","doi":"10.1109/ISEMC.2004.1349886","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349886","url":null,"abstract":"We consider that the target of intentional interference is a communication channel and we attempt to find interference capable of degrading communication throughput. The goal is to achieve disruption independent of hardware implementation while maintaining hardware functionality. We call such interference HIPDI (hardware invariant protocol disruptive interference) and parameterize it using a concept called hardware aperture, as defined by the protocol of the channel. We show that simple CW and AM interference is capable of halting throughput for 100BaseTX Ethernet networks for all hardware configurations considered.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128045789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Correlation between shielding effectiveness and transfer impedance of shielded cable","authors":"M. Taghivand","doi":"10.1109/ISEMC.2004.1349952","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349952","url":null,"abstract":"The correlation between the shielding effectiveness and transfer impedance of a 50 /spl Omega/ shielded cable was evaluated. The methods used in the performance of the investigation to induce the currents and voltages into the wires and cables were by use of an electric dipole antenna and a current probe. A direct correlation between shielding effectiveness and transfer impedance was recorded on a BNC cable that was terminated in 50 /spl Omega/ at both ends.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"274 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121823104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Spread spectrum clock generator with delay cell array to reduce the EMI from a high-speed digital system","authors":"Jonghoon J. Kim, D. Kam, Joungho Kim","doi":"10.1109/ISEMC.2004.1349928","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349928","url":null,"abstract":"In high-speed digital systems, most of the EMI from the system is caused by high-speed digital clock drivers and synchronized circuits. In order to reduce the EMI from the system clocks, spread spectrum clock (SSC) techniques that modulate the system clock frequency have been proposed. A conventional spread spectrum clock generator with a phase locked loop (SSCG-PLL) has been implemented by controlling period jitter. However, the conventional SSCG-PLL becomes more difficult to implement at higher clock frequencies, in the GHz range, because of the random period jitter of the PLL. Furthermore, the attenuation of EMI is decreased due to the random period jitter of the PLL. To overcome these problems associated with the random period jitter, we propose a spread spectrum clock generator with a delay cell array (SSCG-DCA), which controls the position of clock transitions. Measurement and simulation have demonstrated that the proposed SSCG-DCA is easier to implement and attenuating the EMI is more effective compared with the conventional SSCG-PLL. The proposed SSCG-DCA was implemented on a chip using a 0.35 /spl mu/m CMOS process and a 9 dB attenuation of the EMI was achieved at 390 MHz.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131628996","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}