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2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)最新文献

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Modeling of power supply noise using efficient macro-model of non-linear driver 基于非线性驱动的高效宏观模型的电源噪声建模
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349961
B. Mutnury, M. Swaminathan, J. Libous
{"title":"Modeling of power supply noise using efficient macro-model of non-linear driver","authors":"B. Mutnury, M. Swaminathan, J. Libous","doi":"10.1109/ISEMC.2004.1349961","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349961","url":null,"abstract":"In this paper, power supply noise is modeled accurately using efficient macro-models of nonlinear digital drivers. A spline function with finite time difference approximation modeling technique takes into account both the static and the dynamic memory characteristics of the driver during modeling. For power supply noise analysis, the above method has been extended to multiple ports by taking the previous time instances of the power supply voltage/current into account. The method discussed can be used to capture sensitive effects like simultaneous switching noise (SSN) and crosstalk accurately, when multiple drivers are switching simultaneously. A comparison study between the presented method and the transistor level driver models indicate a computational speed-up in the range of 10-40 with an error of less than 5%. For highly nonlinear drivers, a method based on artificial neural networks (ANN) is briefly discussed to capture SSN.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"296 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123117172","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
High dielectric constant thin film embedded capacitor for suppression of simultaneous switching noise and radiated emission 用于抑制同时开关噪声和辐射发射的高介电常数薄膜嵌入电容器
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349864
Hyungsoo Kim, Hyunjeong Park, Y. Jeong, Joungho Kim, SeokKyu-lee, JongKuk-Hong, Youngsoo Hong
{"title":"High dielectric constant thin film embedded capacitor for suppression of simultaneous switching noise and radiated emission","authors":"Hyungsoo Kim, Hyunjeong Park, Y. Jeong, Joungho Kim, SeokKyu-lee, JongKuk-Hong, Youngsoo Hong","doi":"10.1109/ISEMC.2004.1349864","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349864","url":null,"abstract":"We have thoroughly investigated and experimentally demonstrated the great advantages of thin film embedded capacitors of high dielectric constant in reducing power/ground impedance and suppressing SSN and radiated emission up to a frequency of 1 GHz. About 10 dB or more suppression of the radiated emission was acquired for a wide frequency range, including high-numbered harmonics of the clock frequency, by using the thin film embedded capacitor of high dielectric constant.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"111 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123138888","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Frequency resolved susceptibility testing as a substitute for angular resolved susceptibility testing 频率分辨敏度试验代替角分辨敏度试验
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349991
M. Hoijer, V. Isovic
{"title":"Frequency resolved susceptibility testing as a substitute for angular resolved susceptibility testing","authors":"M. Hoijer, V. Isovic","doi":"10.1109/ISEMC.2004.1349991","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349991","url":null,"abstract":"In commercial radiated susceptibility testing, only a few irradiation directions are used, making the risk of undertesting huge. We propose a model to reduce the undertesting without increasing the number of irradiation directions. The method uses frequency resolved radiated susceptibility testing as a substitute for the angular resolved radiated susceptibility testing. We have experimentally tested the model on different test objects, and it generally works, but fails within some limited frequency intervals, due to resonance peaks in the susceptibility of the equipment under test.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126617218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Cabinet shielding inherent in standard equipment racks not designed to provide high-performance shielding 标准设备机架中固有的机柜屏蔽不能提供高性能屏蔽
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349853
J. Knighten, R.D. McLay, P. M. Rostek, J. Fan
{"title":"Cabinet shielding inherent in standard equipment racks not designed to provide high-performance shielding","authors":"J. Knighten, R.D. McLay, P. M. Rostek, J. Fan","doi":"10.1109/ISEMC.2004.1349853","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349853","url":null,"abstract":"Information technology equipment is often housed in racks enclosed as cabinets that are either poorly designed as electromagnetic shields or have not been specifically designed to provide high-performance shielding. This study examines the shielding characteristics of a class of computer systems each housed in similar cabinet racks that were not designed to provide significant levels of shielding. At frequencies above a few hundred MHz, these cabinet racks can provide shielding sufficient to be important in compliance with regulatory EMC requirements on radiated emissions. At frequencies lower than a few hundred MHz, these cabinet racks do not reliably provide significant shielding. These conclusions are based on radiated emissions testing of equipment racks with and without doors and side panels.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"274 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115107695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Twenty-five years of designing ferrites to achieve EMC in digital electronics 二十五年的铁氧体设计，实现数字电子的电磁兼容
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349842
R. G. Parker
{"title":"Twenty-five years of designing ferrites to achieve EMC in digital electronics","authors":"R. G. Parker","doi":"10.1109/ISEMC.2004.1349842","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349842","url":null,"abstract":"The enactment of Part 15J of the FCC regulations had a ground shift effect on the ferrite industry. Previous research and development efforts bad been focused on inductive applications for ferrite materials and little work was done to do more than apply available materials to control EMI problems. The mid 1970s were not a time of growth for the industry in the United States, since the manufacture of consumer electronics and component parts was rapidly moving to lower labor cost areas. The digital electronics age was just starting to develop as a market. Indeed, Part 15 was the cause of renewed growth in the ferrite industry. New shapes proliferated, and the range of sizes for EMI suppressors grew from less than a hundredth of a gram to several hundred grams. Even more important was the development of new materials that could meet the new challenge of controlling EMI.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115173304","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis on the effectiveness of printed circuit board edge termination using discrete components instead of implementing the 20-H rule 用离散元件代替20-H规则的印刷电路板边缘端接的有效性分析
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349994
M. Montrose, Liu Enxiao, E. Li
{"title":"Analysis on the effectiveness of printed circuit board edge termination using discrete components instead of implementing the 20-H rule","authors":"M. Montrose, Liu Enxiao, E. Li","doi":"10.1109/ISEMC.2004.1349994","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349994","url":null,"abstract":"With increasing demand for higher operating frequencies, engineers are faced with numerous obstacles during the design cycle, especially the layout of a printed circuit board (PCB). Concerns include both time and frequency domain analysis. For time domain analysis, SPICE is a favorite choice, while for the frequency domain, various field solvers are used, depending on application. There is one design concern that cannot be simulated using either SPICE or field solvers exclusively - the 20-H rule. The reason why a single simulation tool cannot be used is due to termination of an RF propagating field (frequency domain.) using transmission line theory (time domain). The placement of components on a PCB and their physical distance to the edge of the board may cause an undesired RF propagating field to be created. The paper analyzes propagating electromagnetic fields between a pair of power and return planes behaving as a transmission line. With proper analysis, one can incorporate optimal transmission line termination for RF fields using discrete components instead of blindly implementing the 20-H rule (provides the same benefit). For unique applications, the 20-H rule may be required, but only in certain locations of the PCB.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121900123","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Stability of PEEC models with respect to partial element accuracy PEEC模型相对于部分单元精度的稳定性
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1350039
J. Ekman, Giulio Antonini, Antonio Orlandi, A. Ruehli
{"title":"Stability of PEEC models with respect to partial element accuracy","authors":"J. Ekman, Giulio Antonini, Antonio Orlandi, A. Ruehli","doi":"10.1109/ISEMC.2004.1350039","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1350039","url":null,"abstract":"We examine the passivity and stability of quasi-static partial element equivalent circuit (PEEC) models. The impact of inaccuracies in the computed partial element values is considered as a possible source of time domain instabilities. Our analysis shows how existing partial element calculation routines, analytical and numerical, and the use of poor mesh generators can introduce large errors in partial element values. We also show how this affects the passivity and stability of the PEEC model. Theoretical constraints for passivity are derived which depend on accuracy of partial element values. The conditions are verified by performing practical PEEC model analysis.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"99-B 1 Suppl 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128483245","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Improved measurement of radiated emissions from moving rail vehicles in the frequency range 9 kHz to 1 GHz 改进了在9khz至1ghz频率范围内移动轨道车辆辐射发射的测量方法
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349989
A. Rowell, D. Bozec, S. Seller, L. McCormack, C. Marshman, A. Marvin
{"title":"Improved measurement of radiated emissions from moving rail vehicles in the frequency range 9 kHz to 1 GHz","authors":"A. Rowell, D. Bozec, S. Seller, L. McCormack, C. Marshman, A. Marvin","doi":"10.1109/ISEMC.2004.1349989","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349989","url":null,"abstract":"A measurement system has been developed to characterize the radiated electromagnetic interference (EMI) from moving rail vehicles. The system uses multiple spectrum analyzers to make a combination of rapidly repeated frequency domain measurements and time domain measurements using single frequency wide bandwidth envelope detection. Using these techniques, the emissions from a rapidly moving vehicle can be assessed and characterized as narrowband or broadband, continuous or transient. The potential for interference with radiocommunications services can hence be better understood. The system is described and measurement results are presented. Shortfalls in current measurement techniques and advantages of this hybrid technique are discussed.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128434191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Compensation of ESD and device input capacitance by using embedded inductor on PCB substrate for 3 Gbps SerDes applications 在3gbps SerDes应用中，利用PCB衬底上的嵌入式电感补偿ESD和器件输入电容
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349847
Seungyoung Ahn, Seungyong Baek, Junho Lee, Joungho Kim
{"title":"Compensation of ESD and device input capacitance by using embedded inductor on PCB substrate for 3 Gbps SerDes applications","authors":"Seungyoung Ahn, Seungyong Baek, Junho Lee, Joungho Kim","doi":"10.1109/ISEMC.2004.1349847","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349847","url":null,"abstract":"We first propose a simple and efficient reactive termination circuit for compensation of the parasitic capacitance which results from the ESD protection circuit and device input capacitance. By using this compensation circuit, the broadband impedance of the receiver circuit is controlled and matched, and the distortion of the high speed signal due to the inherent parasitic capacitance is significantly reduced. A conventional preemphasis circuit is applied concurrently to the design of a high-speed transceiver together with this technique. The required parameter values for the preemphasis circuit and the suggested reactive termination circuit are optimized in the frequency domain. Simulations in the time domain shows an improvement in the eye diagram.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"19 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129318899","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Decreasing lightning shock hazard at the HV substation by the modification of the grounding system 通过对接地系统的改造，减少高压变电站的雷击危害
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349836
A. Sowa, J. Wiater
{"title":"Decreasing lightning shock hazard at the HV substation by the modification of the grounding system","authors":"A. Sowa, J. Wiater","doi":"10.1109/ISEMC.2004.1349836","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349836","url":null,"abstract":"One of the tasks of the grounding system is to ensure safety for people during various fault conditions. Fatal lightning shock hazards depend on the surface potential that occurs when a lightning current is injected into the grounding system or induced in it. The main objective of the paper is to improve the grounding system of the typical HV substation. The quality of this modification is measured by the drop of the step voltage distribution and by the cost of it.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"572 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120861166","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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