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2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)最新文献

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Simultaneous switching noise in IBIS models IBIS模型中的同步开关噪声
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349963
A. Varma, S. Lipa, A. Glaser, M. Steer, P. Franzon
{"title":"Simultaneous switching noise in IBIS models","authors":"A. Varma, S. Lipa, A. Glaser, M. Steer, P. Franzon","doi":"10.1109/ISEMC.2004.1349963","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349963","url":null,"abstract":"In this paper, a tool to convert SPICE netlists to IBIS (Input/Output Buffer Information Specification) models is presented This tool simulates the netlist on a user-desirable SPICE engine and produces both static and dynamic characteristics of the IBIS model. A CMOS driver circuit is simulated in HSPICE and compared with an equivalent circuit created with IBIS models of the same drivers. Outputs from the drivers are compared IBIS models are also compared against macro-models of nonlinear digital drivers using spline functions with finite time difference approximation modeling techniques.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121543599","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Statistical characteristics of maximum E-field distribution in a reverberation chamber 混响室内最大e场分布的统计特性
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349891
K. Harima
{"title":"Statistical characteristics of maximum E-field distribution in a reverberation chamber","authors":"K. Harima","doi":"10.1109/ISEMC.2004.1349891","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349891","url":null,"abstract":"A statistically uniform E-field is created in a reverberation chamber by moving mechanical stirrers to vary boundary conditions. The uniformity of the spatial E-field distribution in an ideal reverberation chamber can be theoretically estimated using the probability density function of its distribution. However, uniformity in a real chamber is affected by the dimensions of the chamber and the structure of the stirrers. We experimentally and theoretically evaluated the effect of stirrers on spatial uniformity. When the dimensions of a chamber equipped with effective stirrers are large compared to the wavelength, that is, when resonant modes above approximately 10/sup 5/ exist below the operating frequency, the spatial uniformity is in good agreement with theoretical values.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124023260","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Novel multiplexing technique for reducing self interference
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1350011
M. Bank, J. Gavan
{"title":"Novel multiplexing technique for reducing self interference","authors":"M. Bank, J. Gavan","doi":"10.1109/ISEMC.2004.1350011","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1350011","url":null,"abstract":"Today there is an opinion that the OFDMA method is a better and more efficient solution for cellular systems and next generation wireless LAN. The OFDMA technique uses good frequency efficiency and minimal sensitivity to multipath propagation interference. However, better results can be achieved by the new MT-FBS method, which combines OFDM and CDMA multiplexing techniques. This enables the same bit-error rate with smaller signal to noise ratio and peak-factor near to one. Obviously, the MT-FBS signal results in smaller interference for other signals.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124039674","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
FDTD comparison of SAR and temperature rise in human tissue 人体组织SAR与温升的时域有限差分比较
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349970
R. Luebbers, C. Penney
{"title":"FDTD comparison of SAR and temperature rise in human tissue","authors":"R. Luebbers, C. Penney","doi":"10.1109/ISEMC.2004.1349970","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349970","url":null,"abstract":"A comparison is made between the peak SAR (specific absorption rate) location and distribution in human tissue with the resulting temperature rise caused by the SAR. The temperature change includes cooling effects from the perfusion of blood and may be a better indicator of tissue damage caused by exposure. This paper describes a technique for computing the temperature rise in a finite difference approach for voxel-based geometry files. An example is presented for a simplified cellular telephone radiating by a human head.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130085541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Experimental comparison of the various validation method using broadband antenna for radiated emission test site 利用宽带天线进行辐射发射试验场各种验证方法的实验比较
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349915
K. Osabe, T. Yamanaka, J. Kawano
{"title":"Experimental comparison of the various validation method using broadband antenna for radiated emission test site","authors":"K. Osabe, T. Yamanaka, J. Kawano","doi":"10.1109/ISEMC.2004.1349915","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349915","url":null,"abstract":"Experimental comparison of the various validation methods (CISPR16-1, ANSI C63.5 revision and Dual AF method) using the broadband antenna of biconical, log periodic and full-range type was performed at seven radiated emission test sites. With regard to each method, it was compared with the NSA value including the correction factor, which is measured by a pair of dipole antennas. As the result, it was concluded that, even when the broadband antenna is used, the NSA calculation up to 300 MHz should consider the influence of mutual impedance coupling of antennas and of the ground plane in the same manner with using a pair of dipole antennas.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131850647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modeling and simulation of signaling channel loss on printed circuit board 印刷电路板上信号信道损耗的建模与仿真
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349826
J. Foor, D. Wu, J. Chen
{"title":"Modeling and simulation of signaling channel loss on printed circuit board","authors":"J. Foor, D. Wu, J. Chen","doi":"10.1109/ISEMC.2004.1349826","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349826","url":null,"abstract":"The paper explores the effects from individual channel components on signal loss and investigates ways to reduce loss. Channel components include transmission lines, vias, connectors, connector thruholes, and package-mounts. An efficient interconnects extraction algorithm was first developed for frequency dependent transmission line parameter extraction. Once transmission line parameters are extracted, they can be used together with other component models in SPICE simulations. Through simulations, this study quantifies the contributions to signal loss from different components. The effects of altering these components and the benefits of following channel construction guidelines are explored.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"2009 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130763961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simulation of harmonic and conducted interference levels from switched-mode power supplies and phase controllers 开关电源和相位控制器的谐波和传导干扰水平的仿真
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349866
J. Dawson, D. Bozec, D. Cullen, L. McCormack, B.W. Flynn
{"title":"Simulation of harmonic and conducted interference levels from switched-mode power supplies and phase controllers","authors":"J. Dawson, D. Bozec, D. Cullen, L. McCormack, B.W. Flynn","doi":"10.1109/ISEMC.2004.1349866","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349866","url":null,"abstract":"The paper describes work carried out to determine the feasibility of using a SPICE circuit simulator to predict harmonic current levels, and conducted interference (9 kHz to 30 MHz) produced by a phase controlled lamp dimmer and flyback converter switched-mode power supply (SMPS). The SPICE models are constructed using realistic models for the passive components and approximate models for the switching and control circuitry so that switching rates and duty cycles can be precisely controlled. The SPICE time-domain data was processed to predict the harmonic current and average and peak conducted interference values. The models are compared with measured results. Whilst the harmonic currents can be predicted accurately, there are still significant problems with the accurate prediction of conducted interference. However, the SPICE model predictions follow the measured data with changing load.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"172 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131253676","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Characterization of spurious emissions of wireless devices in a reverberation chamber 混响室中无线设备杂散发射的特性
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1350010
A. Azoulay, T. Letertre, V. Monebhurrun, J. Bolomey, B. Despres
{"title":"Characterization of spurious emissions of wireless devices in a reverberation chamber","authors":"A. Azoulay, T. Letertre, V. Monebhurrun, J. Bolomey, B. Despres","doi":"10.1109/ISEMC.2004.1350010","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1350010","url":null,"abstract":"The reverberation chamber has been widely studied and described in the past as an efficient measuring tool in EMC, particularly for shielding effectiveness or immunity testing. The new IEC 61000-4-21 standard, published in 2003, acknowledges the possibility to carry out emission measurements for various devices; this paper proposes to analyze intended spurious emissions of two types of WiFi modules with the reverberation chamber.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127861143","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
SE/sub dB/ determination for non-conductive electromagnetic absorbers 非导电电磁吸收器的SE/sub dB/测定
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349858
M. Badic, M. Marinescu
{"title":"SE/sub dB/ determination for non-conductive electromagnetic absorbers","authors":"M. Badic, M. Marinescu","doi":"10.1109/ISEMC.2004.1349858","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349858","url":null,"abstract":"The basics of electromagnetic shielding theory provide good results for conductive materials, reflection being the main phenomenon in producing the shielding effect. The paper deals with the determination of SE/sub dB/ (shielding effectiveness) in the case of materials which are less conductive (like ferrites) but with important absorbing properties (based on macroscopic parameters /spl epsiv/ and /spl mu/). The theory presented matches the SE/sub dB/ measuring methods that use coaxial TEM cells.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134499954","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Experimental validation of circuit models for bulk current injection (BCI) test on shielded coaxial cables 屏蔽同轴电缆大电流注入测试电路模型的实验验证
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) Pub Date : 2004-11-01 DOI: 10.1109/ISEMC.2004.1349997
G. Antonini, A. Scogna, A. Orlandi, R. Rizzi
{"title":"Experimental validation of circuit models for bulk current injection (BCI) test on shielded coaxial cables","authors":"G. Antonini, A. Scogna, A. Orlandi, R. Rizzi","doi":"10.1109/ISEMC.2004.1349997","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349997","url":null,"abstract":"In order to validate, by means of measurement, some existing equivalent circuit models for the bulk current injection (BCI) test, a procedure is proposed to develop a proper circuit model for the injection clamp and the obtained circuit is introduced into the global one representing the overall cable. A suitable experimental set-up has been built and used. The measured induced voltages at the terminations of shielded coaxial cables are compared with those computed by the equivalent circuit. Upper and lower bounds are quantified in order to assess the order of accuracy of the predicted results.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115756438","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
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